Semiconductor device operating in an active mode and a standby mode
    1.
    发明授权
    Semiconductor device operating in an active mode and a standby mode 失效
    半导体器件工作在主动模式和待机模式

    公开(公告)号:US07675347B2

    公开(公告)日:2010-03-09

    申请号:US11984464

    申请日:2007-11-19

    CPC classification number: H03K3/356113 H03K19/0016 H03K2217/0018

    Abstract: A semiconductor device operates in an active mode or a standby mode, and includes a substrate-potential power source line supplying a substrate potential which is higher in a standby mode than in an active mode, and a source-potential power source line supplying a source potential which is lower in a standby mode than in an active mode. During a mode shift from the standby mode to the active mode, a potential equalizing transistor is turned ON to pass a current flowing from the substrate-potential power source line to the source-potential power source line, to reduce the time length needed for shifting from the standby mode to the active mode.

    Abstract translation: 半导体器件以活动模式或待机模式工作,并且包括提供在待机模式下比在活动模式中更高的衬底电位的衬底电位电源线以及提供源的源极 - 电位电源线 待机模式下的电位低于活动模式。 在从待机模式切换到激活模式的模式期间,电位均衡晶体管导通以使从衬底电位电源线流到源极电源线的电流通过,以减少移位所需的时间长度 从待机模式到活动模式。

    SEMICONDUCTOR MEMORY DEVICE
    2.
    发明申请
    SEMICONDUCTOR MEMORY DEVICE 失效
    半导体存储器件

    公开(公告)号:US20090016126A1

    公开(公告)日:2009-01-15

    申请号:US12170561

    申请日:2008-07-10

    Abstract: A semiconductor memory device is provided that is capable of detecting a short circuit defect to be detected in a memory array without causing an error due to off-current of a sense amplifier circuit. Sense amplifier circuits amplify a potential between a pair of bit lines, which occurs based on potential of memory cells selected by driving word lines and bit lines. Selection transistors are provided between the bit lines and the sense amplifier circuits. A word-SE interval control circuit included in an X timing generating circuit turns off the selection transistors and disconnects the bit lines from the sense amplifier circuits based on a signal representing a test state for expanded time when a test to expand an interval between word line driving and activation of the sense amplifier circuits and detect defect sites of the bit lines is performed.

    Abstract translation: 提供一种半导体存储器件,其能够检测在存储器阵列中要检测的短路缺陷,而不会由于读出放大器电路的截止电流而引起误差。 感测放大器电路根据通过驱动字线和位线选择的存储器单元的电位放大一对位线之间的电位。 选择晶体管设置在位线和读出放大器电路之间。 包括在X定时发生电路中的字SE间隔控制电路关闭选择晶体管,并且当扩展字线之间的间隔的测试时,基于表示用于扩展时间的测试状态的信号,从读出放大器电路断开位线 执行感测放大器电路的驱动和激活并检测位线的缺陷位置。

    Semiconductor device
    3.
    发明授权
    Semiconductor device 有权
    半导体器件

    公开(公告)号:US08331165B2

    公开(公告)日:2012-12-11

    申请号:US12909016

    申请日:2010-10-21

    Abstract: A semiconductor device includes a plurality of first output terminals 1-13 and a plurality of first output circuits 203,204 provided corresponding to each of the plurality of first output terminals and coupled to a corresponding first output terminal. The semiconductor device further includes a second output circuit 201 coupled to a second output terminal DQS. The second output circuit automatically adjusts a slew rate based on the state transitions of the plurality of first output circuits. The second output circuit adjusts the slew rate from a first state to a second state based on a transition from first data outputted from the first output circuit to second data following said first data. The second output circuit outputs data in synchronization with the second data with a slew rate in said second state.

    Abstract translation: 半导体器件包括多个第一输出端子1-13和与多个第一输出端子中的每一个相对应地设置并耦合到相应的第一输出端子的多个第一输出电路203,204。 半导体器件还包括耦合到第二输出端子DQS的第二输出电路201。 第二输出电路基于多个第一输出电路的状态转换自动调整转换速率。 第二输出电路基于从第一输出电路输出的第一数据到所述第一数据之后的第二数据的转变,将转换速率从第一状态调整到第二状态。 第二输出电路在第二状态下以转换速率与第二数据同步地输出数据。

    SEMICONDUCTOR DEVICE
    4.
    发明申请
    SEMICONDUCTOR DEVICE 有权
    半导体器件

    公开(公告)号:US20110096613A1

    公开(公告)日:2011-04-28

    申请号:US12909016

    申请日:2010-10-21

    Abstract: A semiconductor device includes a plurality of first output terminals 1-13 and a plurality of first output circuits 203,204 provided corresponding to each of the plurality of first output terminals and coupled to a corresponding first output terminal. The semiconductor device further includes a second output circuit 201 coupled to a second output terminal DQS. The second output circuit automatically adjusts a slew rate based on the state transitions of the plurality of first output circuits. The second output circuit adjusts the slew rate from a first state to a second state based on a transition from first data outputted from the first output circuit to second data following said first data. The second output circuit outputs data in synchronization with the second data with a slew rate in said second state.

    Abstract translation: 半导体器件包括多个第一输出端子1-13和与多个第一输出端子中的每一个相对应地设置并耦合到相应的第一输出端子的多个第一输出电路203,204。 半导体器件还包括耦合到第二输出端子DQS的第二输出电路201。 第二输出电路基于多个第一输出电路的状态转换自动调整转换速率。 第二输出电路基于从第一输出电路输出的第一数据到所述第一数据之后的第二数据的转变,将转换速率从第一状态调整到第二状态。 第二输出电路在第二状态下以转换速率与第二数据同步地输出数据。

    Semiconductor memory device
    5.
    发明授权
    Semiconductor memory device 失效
    半导体存储器件

    公开(公告)号:US07649790B2

    公开(公告)日:2010-01-19

    申请号:US12170561

    申请日:2008-07-10

    Abstract: A semiconductor memory device is provided that is capable of detecting a short circuit defect to be detected in a memory array without causing an error due to off-current of a sense amplifier circuit. Sense amplifier circuits amplify a potential between a pair of bit lines, which occurs based on potential of memory cells selected by driving word lines and bit lines. Selection transistors are provided between the bit lines and the sense amplifier circuits. A word-SE interval control circuit included in an X timing generating circuit turns off the selection transistors and disconnects the bit lines from the sense amplifier circuits based on a signal representing a test state for expanded time when a test to expand an interval between word line driving and activation of the sense amplifier circuits and detect defect sites of the bit lines is performed.

    Abstract translation: 提供一种半导体存储器件,其能够检测在存储器阵列中要检测的短路缺陷,而不会由于读出放大器电路的截止电流而引起误差。 感测放大器电路根据通过驱动字线和位线选择的存储器单元的电位放大一对位线之间的电位。 选择晶体管设置在位线和读出放大器电路之间。 包括在X定时发生电路中的字SE间隔控制电路关闭选择晶体管,并且当扩展字线之间的间隔的测试时,基于表示用于扩展时间的测试状态的信号,从读出放大器电路断开位线 执行感测放大器电路的驱动和激活并检测位线的缺陷位置。

    Air compressor
    7.
    发明授权
    Air compressor 有权
    空气压缩机

    公开(公告)号:US08179249B2

    公开(公告)日:2012-05-15

    申请号:US12388575

    申请日:2009-02-19

    CPC classification number: F04B49/02 F04B49/10 F04B2201/0207

    Abstract: In an air compressor which can cope with an item to be replaced which is not a manufacturer's recommended item so as to enhance the safety, there is provided, as an example, an air compressor comprising a compressor body for compressing air, an item to be replaced (in detail, for example, a suction belt, a suction filter, a separator element and an oil filter) used during the operation of the compressor body, comprising a control device for computing a service time of the item to be replaced, from an operation time of the compressor body, discriminating whether the item to be replaced is a manufacturer's recommended item or not, determining whether or not the service time of the item to be replaced, which is discriminated as a manufacturer's recommended item, exceeds a preset first reference time, but determining whether the service time of the item to be replaced, which is discriminated as the one which is not the manufacturer's recommended item, exceeds a second reference time which has been preset so as to be shorter than the first reference time, and issuing an alarm if the reference time is exceeded.

    Abstract translation: 在可以处理不是制造商推荐的物品的空气压缩机中以提高安全性的空气压缩机中,作为示例,提供了一种空气压缩机,该空气压缩机包括用于压缩空气的压缩机主体, 在压缩机主体的操作期间更换(例如,具体为例如吸入带,抽吸过滤器,分离器元件和油过滤器),包括用于计算待更换物品的使用时间的控制装置 压缩机主体的操作时间,判断要更换的物品是否是制造商推荐的物品,确定被识别为制造商的推荐物品的待替换物品的服务时间是否超过预设的第一 参考时间,但是确定要被替换的项目的服务时间是否被识别为不是制造商的推荐项目的服务时间超过第二参考时间, 已被预设为比第一参考时间短,并且如果超过参考时间则发出报警。

    AIR COMPRESSOR
    8.
    发明申请
    AIR COMPRESSOR 有权
    空气压缩机

    公开(公告)号:US20100052893A1

    公开(公告)日:2010-03-04

    申请号:US12388575

    申请日:2009-02-19

    CPC classification number: F04B49/02 F04B49/10 F04B2201/0207

    Abstract: In an air compressor which can cope with an item to be replaced which is not a manufacturer's recommended item so as to enhance the safety, there is provided, as an example, an air compressor comprising a compressor body for compressing air, an item to be replaced (in detail, for example, a suction belt, a suction filter, a separator element and an oil filter) used during the operation of the compressor body, comprising a control device for computing a service time of the item to be replaced, from an operation time of the compressor body, discriminating whether the item to be replaced is a manufacturer's recommended item or not, determining whether or not the service time of the item to be replaced, which is discriminated as a manufacturer's recommended item, exceeds a preset first reference time, but determining whether the service time of the item to be replaced, which is discriminated as the one which is not the manufacturer's recommended item, exceeds a second reference time which has been preset so as to be shorter than the first reference time, and issuing an alarm if the reference time is exceeded.

    Abstract translation: 在可以处理不是制造商推荐的物品的空气压缩机中以提高安全性的空气压缩机中,作为示例,提供了一种空气压缩机,其包括用于压缩空气的压缩机主体, 在压缩机主体的操作期间更换(例如,具体为例如吸入带,抽吸过滤器,分离器元件和油过滤器),包括用于计算待更换物品的使用时间的控制装置 压缩机主体的操作时间,判断要更换的物品是否是制造商推荐的物品,确定被识别为制造商的推荐物品的待替换物品的服务时间是否超过预设的第一 参考时间,但是确定要被替换的项目的服务时间是否被识别为不是制造商的推荐项目的服务时间超过第二参考时间, 已被预设为比第一参考时间短,并且如果超过参考时间则发出报警。

    Semiconductor memory device including a sense amplifier having a reduced operating current
    9.
    发明授权
    Semiconductor memory device including a sense amplifier having a reduced operating current 失效
    半导体存储器件包括具有降低的工作电流的读出放大器

    公开(公告)号:US07663954B2

    公开(公告)日:2010-02-16

    申请号:US11979954

    申请日:2007-11-09

    CPC classification number: G11C7/065 G11C11/4091 G11C2207/065

    Abstract: A semiconductor memory device includes a shared transistor controlling coupling between a bit line pair in a memory cell array and a bit line pair in a sense amplifier. After a word line is activated and the sense amplifier amplifies the potential difference between the bit lines of the bit line pair in the sense amplifier, the shared transistor is tuned OFF and precharge/equalizing circuit is activated to precharge the bit lines in the sense amplifier to a potential which is half the internal power source potential.

    Abstract translation: 半导体存储器件包括控制存储单元阵列中的位线对与读出放大器中的位线对之间的耦合的共享晶体管。 在字线被激活并且读出放大器放大读出放大器中位线对的位线之间的电位差之后,共享晶体管被调谐为关闭,并且预充电/均衡电路被激活以对读出放大器中的位线进行预充电 达到内部电源电位的一半的电位。

    Air compressor
    10.
    发明授权
    Air compressor 有权
    空气压缩机

    公开(公告)号:US08289149B2

    公开(公告)日:2012-10-16

    申请号:US13371791

    申请日:2012-02-13

    CPC classification number: F04B49/02 F04B49/10 F04B2201/0207

    Abstract: A control method for an air compressor including a compressor body for compressing air and an item to be replaced used during the operation of the compressor body. The method includes computing a service time of the item to be replaced, being based upon an operating time of the compressor body, discriminating whether the item to be replaced is a manufacturer's recommended item or not, determining whether or not the service time of the item to be replaced discriminated as the manufacturer's recommend item is not longer than a first reference time, but determining whether or not the service time of the item to be replaced discriminated as one which is not the manufacturer's recommended item is not longer than a preset second reference time which is shorter than the first reference time, and issuing an alarm when determining that the reference time is exceeded.

    Abstract translation: 一种空气压缩机的控制方法,其包括在压缩机主体的运行期间使用的用于压缩空气的压缩机主体和待更换的物品。 该方法包括:基于压缩机主体的运行时间来计算待更换项目的服务时间,判断要更换的项目是否是制造商的推荐项目,确定项目的服务时间 被替换为被鉴别为制造商的推荐项目不长于第一参考时间,但是确定被替换的项目的服务时间是否被识别为不是制造商的推荐项目的服务时间不长于预设的第二参考 时间短于第一参考时间,并且当确定超过参考时间时发出报警。

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