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公开(公告)号：US20120299084A1
公开(公告)日：2012-11-29
申请号：US13476356
申请日：2012-05-21
申请人： Kentaro SAITO , Kazumasa YANAGISAWA , Yasushi ISHII , Koichi TOBA
发明人： Kentaro SAITO , Kazumasa YANAGISAWA , Yasushi ISHII , Koichi TOBA
IPC分类号： H01L29/792 , H01L21/336
CPC分类号： H01L29/792 , G11C16/0466 , H01L21/28282 , H01L27/11573 , H01L29/4234 , H01L29/66833
摘要： To improve the electric performance and reliability of a semiconductor device. A memory gate electrode of a split gate type nonvolatile memory is a metal gate electrode formed from a stacked film of a metal film 6a and a silicon film 6b over the metal film 6a. In an upper end part of the metal film 6a, a metal oxide portion 17 is formed by oxidation of a part of the metal film 6a. A control gate electrode of the split gate type nonvolatile memory is a metal gate electrode formed from a stacked film of a metal film 4a and the silicon film 4b over the metal film 4a.
摘要翻译： 提高半导体器件的电气性能和可靠性。 分闸式非易失性存储器的存储栅极是由金属膜6a上的金属膜6a和硅膜6b的叠层膜形成的金属栅电极。 在金属膜6a的上端部分，通过氧化金属膜6a的一部分而形成金属氧化物部分17。 分闸式非易失性存储器的控制栅电极是由金属膜4a的叠层膜和金属膜4a上的硅膜4b形成的金属栅电极。
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公开(公告)号：US20110133827A1
公开(公告)日：2011-06-09
申请号：US13020169
申请日：2011-02-03
IPC分类号： H01L25/00
CPC分类号： H03K19/0016 , H01L23/5286 , H01L27/0207 , H01L27/092 , H01L27/0928 , H01L27/11898 , H01L2924/0002 , H01L2924/3011 , H01L2924/00
摘要： A semiconductor integrated circuit device provided with a first circuit block BLK1, a second circuit block DRV1 and a conversion circuit MIO1 for connecting the first circuit block to the second circuit block. The first circuit block includes a first mode for applying a supply voltage and a second mode for shutting off the supply voltage. The conversion circuit is provided with a function for maintaining the potential of an input node of the second circuit block at an operation potential, thereby suppressing a penetrating current flow when the first circuit block is in the second mode. The conversion circuit (MIO1 to MIO4) are commonly used for connecting circuit blocks.
摘要翻译： 具有第一电路块BLK1，第二电路块DRV1和用于将第一电路块连接到第二电路块的转换电路MIO1的半导体集成电路器件。 第一电路块包括用于施加电源电压的第一模式和用于关断电源电压的第二模式。 转换电路具有将第二电路块的输入节点的电位维持在操作电位的功能，从而当第一电路块处于第二模式时抑制穿透电流流动。 转换电路（MIO1〜MIO4）通常用于连接电路块。
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公开(公告)号：US20120025892A1
公开(公告)日：2012-02-02
申请号：US13253584
申请日：2011-10-05
IPC分类号： H03L5/00
CPC分类号： H03K19/0016 , H01L23/5286 , H01L27/0207 , H01L27/092 , H01L27/0928 , H01L27/11898 , H01L2924/0002 , H01L2924/3011 , H01L2924/00
摘要： A semiconductor integrated circuit device provided with a first circuit block BLK1, a second circuit block DRV1 and a conversion circuit MIO1 for connecting the first circuit block to the second circuit block. The first circuit block includes a first mode for applying a supply voltage and a second mode for shutting off the supply voltage. The conversion circuit is provided with a function for maintaining the potential of an input node of the second circuit block at an operation potential, thereby suppressing a penetrating current flow when the first circuit block is in the second mode. The conversion circuit (MIO1 to MIO4) are commonly used for connecting circuit blocks.
摘要翻译： 具有第一电路块BLK1，第二电路块DRV1和用于将第一电路块连接到第二电路块的转换电路MIO1的半导体集成电路器件。 第一电路块包括用于施加电源电压的第一模式和用于关断电源电压的第二模式。 转换电路具有将第二电路块的输入节点的电位维持在操作电位的功能，从而当第一电路块处于第二模式时抑制穿透电流流动。 转换电路（MIO1〜MIO4）通常用于连接电路块。
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公开(公告)号：US20120195110A1
公开(公告)日：2012-08-02
申请号：US13443511
申请日：2012-04-10
IPC分类号： G11C11/00
CPC分类号： G11C11/417 , G11C5/14 , G11C5/148
摘要： When threshold voltages of constituent transistors are reduced in order to operate an SRAM circuit at a low voltage, there is a problem in that a leakage current of the transistors is increased and, as a result, electric power consumption when the SRAM circuit is not operated while storing data is increased. Therefore, there is provided a technique for reducing the leakage current of MOS transistors in SRAM memory cells MC by controlling a potential of a source line ssl of the driver MOS transistors in the memory cells.
摘要翻译： 当降低构成晶体管的阈值电压以便在低电压下操作SRAM电路时，存在晶体管的漏电流增加的问题，结果是当SRAM电路不工作时的功耗 同时存储数据增加。 因此，提供了通过控制存储单元中的驱动器MOS晶体管的源极线ssl的电位来减小SRAM存储单元MC中的MOS晶体管的漏电流的技术。
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公开(公告)号：US20110204486A1
公开(公告)日：2011-08-25
申请号：US13098648
申请日：2011-05-02
申请人： Takako FUNAKOSHI , Eiichi MURAKAMI , Kazumasa YANAGISAWA , Kan TAKEUCHI , Hideo AOKI , Hizuru YAMAGUCHI , Takayuki OSHIMA , Kazuyuki TSUNOKUNI , Kousuke OKUYAMA
发明人： Takako FUNAKOSHI , Eiichi MURAKAMI , Kazumasa YANAGISAWA , Kan TAKEUCHI , Hideo AOKI , Hizuru YAMAGUCHI , Takayuki OSHIMA , Kazuyuki TSUNOKUNI , Kousuke OKUYAMA
IPC分类号： H01L29/41
CPC分类号： H01L23/53238 , H01L21/823871 , H01L23/5286 , H01L2924/0002 , H01L2924/00
摘要： In a semiconductor integrated circuit device having plural layers of buried wirings, it is intended to prevent the occurrence of a discontinuity caused by stress migration at an interface between a plug connected at a bottom thereof to a buried wiring and the buried wiring. For example, in the case where the width of a first Cu wiring is not smaller than about 0.9 μm and is smaller than about 1.44 μm, and the width of a second Cu wiring and the diameter of a plug are about 0.18 μm, there are arranged two or more plugs which connect the first wirings and the second Cu wirings electrically with each other.
摘要翻译： 在具有多层埋地布线的半导体集成电路器件中，旨在防止在其底部连接到埋地布线的插头与埋地布线之间的界面处的应力迁移引起的不连续性的发生。 例如，在第一Cu布线的宽度不小于约0.9μm且小于约1.44μm的情况下，并且第二Cu布线的宽度和塞子的直径为约0.18μm的情况下，存在 布置两个或更多个将第一布线和第二铜布线彼此电连接的插头。
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公开(公告)号：US20120179953A1
公开(公告)日：2012-07-12
申请号：US13368461
申请日：2012-02-08
申请人： Yutaka SHINAGAWA , Takeshi KATAOKA , Eiichi ISHIKAWA , Toshihiro TANAKA , Kazumasa YANAGISAWA , Kazufumi SUZUKAWA
发明人： Yutaka SHINAGAWA , Takeshi KATAOKA , Eiichi ISHIKAWA , Toshihiro TANAKA , Kazumasa YANAGISAWA , Kazufumi SUZUKAWA
CPC分类号： G11C16/349 , G11C16/06 , G11C16/3495
摘要： A semiconductor integrated circuit has a central processing unit and a rewritable nonvolatile memory area disposed in an address space of the central processing unit. The nonvolatile memory area has a first nonvolatile memory area and a second nonvolatile memory area, which memorize information depending on the difference of threshold voltages. The first nonvolatile memory area has the maximum variation width of a threshold voltage for memorizing information set larger than that of the second nonvolatile memory area. The first nonvolatile memory area can be prioritized to expedite a read speed of the memory information, and the second nonvolatile memory area can be prioritized to guarantee the number of times of rewrite operation of memory information more.
摘要翻译： 半导体集成电路具有设置在中央处理单元的地址空间中的中央处理单元和可重写的非易失性存储区域。 非易失性存储区域具有第一非易失性存储区域和第二非易失性存储器区域，其根据阈值电压的差异来存储信息。 第一非易失性存储区具有用于存储大于第二非易失性存储区的信息的阈值电压的最大变化宽度。 优先考虑第一非易失性存储器区域以加快存储器信息的读取速度，并且可以对第二非易失性存储器区域进行优先排列以保证存储器信息的重写操作的次数更多。
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公开(公告)号：US20090322402A1
公开(公告)日：2009-12-31
申请号：US12555143
申请日：2009-09-08
IPC分类号： H03L5/00
CPC分类号： H03K19/0016 , H01L23/5286 , H01L27/0207 , H01L27/092 , H01L27/0928 , H01L27/11898 , H01L2924/0002 , H01L2924/3011 , H01L2924/00
摘要： A semiconductor integrated circuit device provided with a first circuit block BLK1, a second circuit block DRV1 and a conversion circuit MIO1 for connecting the first circuit block to the second circuit block. The first circuit block includes a first mode for applying a supply voltage and a second mode for shutting off the supply voltage. The conversion circuit is provided with a function for maintaining the potential of an input node of the second circuit block at an operation potential, thereby suppressing a penetrating current flow when the first circuit block is in the second mode. The conversion circuit (MIO1 to MIO4) are commonly used for connecting circuit blocks.
摘要翻译： 具有第一电路块BLK1，第二电路块DRV1和用于将第一电路块连接到第二电路块的转换电路MIO1的半导体集成电路器件。 第一电路块包括用于施加电源电压的第一模式和用于关断电源电压的第二模式。 转换电路具有将第二电路块的输入节点的电位维持在操作电位的功能，从而当第一电路块处于第二模式时抑制穿透电流流动。 转换电路（MIO1〜MIO4）通常用于连接电路块。
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