FinFET TRANSISTOR AND CIRCUIT
    1.
    发明申请
    FinFET TRANSISTOR AND CIRCUIT 有权
    FinFET晶体管和电路

    公开(公告)号:US20060255410A1

    公开(公告)日:2006-11-16

    申请号:US11458250

    申请日:2006-07-18

    IPC分类号: H01L27/12

    摘要: A drive strength tunable FinFET, a method of drive strength tuning a FinFET, a drive strength ratio tuned FinFET circuit and a method of drive strength tuning a FinFET, wherein the FinFET has either at least one perpendicular and at least one angled fin or has at least one double-gated fin and one split-gated fin.

    摘要翻译: 驱动强度可调谐FinFET,FinFET的驱动强度调谐方法,驱动强度比调谐FinFET电路和FinFET的驱动强度调谐方法,其中FinFET具有至少一个垂直和至少一个成角度的鳍或具有 最少一个双门翅和一个分闸门。

    FinFET TRANSISTOR AND CIRCUIT
    3.
    发明申请
    FinFET TRANSISTOR AND CIRCUIT 有权
    FinFET晶体管和电路

    公开(公告)号:US20080099795A1

    公开(公告)日:2008-05-01

    申请号:US11969339

    申请日:2008-01-04

    IPC分类号: H01L29/04 H01L21/336

    摘要: A drive strength tunable FinFET, a method of drive strength tuning a FinFET, a drive strength ratio tuned FinFET circuit and a method of drive strength tuning a FinFET, wherein the FinFET has either at least one perpendicular and at least one angled fin or has at least one double-gated fin and one split-gated fin.

    摘要翻译: 驱动强度可调谐FinFET,FinFET的驱动强度调谐方法,驱动强度比调谐FinFET电路和FinFET的驱动强度调谐方法,其中FinFET具有至少一个垂直和至少一个成角度的鳍或具有 最少一个双门翅和一个分闸门。

    finFET TRANSISTOR AND CIRCUIT
    4.
    发明申请
    finFET TRANSISTOR AND CIRCUIT 有权
    finFET晶体管和电路

    公开(公告)号:US20100203689A1

    公开(公告)日:2010-08-12

    申请号:US12762427

    申请日:2010-04-19

    IPC分类号: H01L21/336

    摘要: A drive strength tunable FinFET, a method of drive strength tuning a FinFET, a drive strength ratio tuned FinFET circuit and a method of drive strength tuning a FinFET, wherein the FinFET has either at least one perpendicular and at least one angled fin or has at least one double-gated fin and one split-gated fin.

    摘要翻译: 驱动强度可调谐FinFET,FinFET的驱动强度调谐方法,驱动强度比调谐FinFET电路和FinFET的驱动强度调谐方法,其中FinFET具有至少一个垂直和至少一个成角度的鳍或具有 最少一个双门翅和一个分闸门。

    FinFET transistor and circuit
    5.
    发明授权
    FinFET transistor and circuit 有权
    FinFET晶体管和电路

    公开(公告)号:US07368355B2

    公开(公告)日:2008-05-06

    申请号:US11458250

    申请日:2006-07-18

    IPC分类号: H01L21/336

    摘要: A drive strength tunable FinFET, a method of drive strength tuning a FinFET, a drive strength ratio tuned FinFET circuit and a method of drive strength tuning a FinFET, wherein the FinFET has either at least one perpendicular and at least one angled fin or has at least one double-gated fin and one split-gated fin.

    摘要翻译: 驱动强度可调谐FinFET,FinFET的驱动强度调谐方法,驱动强度比调谐FinFET电路和FinFET的驱动强度调谐方法,其中FinFET具有至少一个垂直和至少一个成角度的鳍或具有 最少一个双门翅和一个分闸门。

    FinFET transistor and circuit
    6.
    发明授权
    FinFET transistor and circuit 有权
    FinFET晶体管和电路

    公开(公告)号:US07115920B2

    公开(公告)日:2006-10-03

    申请号:US10709076

    申请日:2004-04-12

    IPC分类号: H01L27/10

    摘要: A drive strength tunable FinFET, a method of drive strength tuning a FinFET, a drive strength ratio tuned FinFET circuit and a method of drive strength tuning a FinFET, wherein the FinFET has either at least one perpendicular and at least one angled fin or has at least one double-gated fin and one split-gated fin.

    摘要翻译: 驱动强度可调谐FinFET,FinFET的驱动强度调谐方法,驱动强度比调谐FinFET电路和FinFET的驱动强度调谐方法,其中FinFET具有至少一个垂直和至少一个成角度的鳍或具有 最少一个双门翅和一个分闸门。

    FinFET transistor and circuit
    7.
    发明授权
    FinFET transistor and circuit 有权
    FinFET晶体管和电路

    公开(公告)号:US07777276B2

    公开(公告)日:2010-08-17

    申请号:US11969339

    申请日:2008-01-04

    IPC分类号: H01L29/78

    摘要: A drive strength tunable FinFET, a method of drive strength tuning a FinFET, a drive strength ratio tuned FinFET circuit and a method of drive strength tuning a FinFET, wherein the FinFET has either at least one perpendicular and at least one angled fin or has at least one double-gated fin and one split-gated fin.

    摘要翻译: 驱动强度可调谐FinFET,FinFET的驱动强度调谐方法,驱动强度比调谐FinFET电路和FinFET的驱动强度调谐方法,其中FinFET具有至少一个垂直和至少一个成角度的鳍或具有 最少一个双门翅和一个分闸门。

    FinFET transistor and circuit
    8.
    发明授权
    FinFET transistor and circuit 有权
    FinFET晶体管和电路

    公开(公告)号:US07964466B2

    公开(公告)日:2011-06-21

    申请号:US12762427

    申请日:2010-04-19

    IPC分类号: H01L21/336

    摘要: A drive strength tunable FinFET, a method of drive strength tuning a FinFET, a drive strength ratio tuned FinFET circuit and a method of drive strength tuning a FinFET, wherein the FinFET has either at least one perpendicular and at least one angled fin or has at least one double-gated fin and one split-gated fin.

    摘要翻译: 驱动强度可调谐FinFET,FinFET的驱动强度调谐方法,驱动强度比调谐FinFET电路和FinFET的驱动强度调谐方法,其中FinFET具有至少一个垂直和至少一个成角度的鳍或具有 最少一个双门翅和一个分闸门。

    VIRTUAL BODY-CONTACTED TRIGATE
    9.
    发明申请
    VIRTUAL BODY-CONTACTED TRIGATE 有权
    虚拟身体接触的TRIGATE

    公开(公告)号:US20070023756A1

    公开(公告)日:2007-02-01

    申请号:US11161213

    申请日:2005-07-27

    IPC分类号: H01L29/12 H01L21/84

    摘要: A field effect transistor (FET) and method of forming the FET comprises a substrate; a silicon germanium (SiGe) layer over the substrate; a semiconductor layer over and adjacent to the SiGe layer; an insulating layer adjacent to the substrate, the SiGe layer, and the semiconductor layer; a pair of first gate structures adjacent to the insulating layer; and a second gate structure over the insulating layer. Preferably, the insulating layer is adjacent to a side surface of the SiGe layer and an upper surface of the semiconductor layer, a lower surface of the semiconductor layer, and a side surface of the semiconductor layer. Preferably, the SiGe layer comprises carbon. Preferably, the pair of first gate structures are substantially transverse to the second gate structure. Additionally, the pair of first gate structures are preferably encapsulated by the insulating layer.

    摘要翻译: 场效应晶体管(FET)和形成FET的方法包括:衬底; 衬底上的硅锗(SiGe)层; 在SiGe层上并邻近SiGe层的半导体层; 与衬底相邻的绝缘层,SiGe层和半导体层; 邻近绝缘层的一对第一栅极结构; 以及绝缘层上的第二栅极结构。 优选地,绝缘层与SiGe层的侧表面,半导体层的上表面,半导体层的下表面和半导体层的侧表面相邻。 优选地,SiGe层包含碳。 优选地,该对第一栅极结构基本上横向于第二栅极结构。 此外,该对第一栅极结构优选地被绝缘层封装。

    HIGH-DENSITY SPLIT-GATE FINFET
    10.
    发明申请
    HIGH-DENSITY SPLIT-GATE FINFET 失效
    高密度分离栅FINFET

    公开(公告)号:US20050073005A1

    公开(公告)日:2005-04-07

    申请号:US10605544

    申请日:2003-10-07

    摘要: Disclosed is a method and structure for forming a split-gate fin-type field effect transistor (FinFET). The invention produces a split-gate fin-type field effect transistor (FinFET) that has parallel fin structures. Each of the fin structures has a source region at one end, a drain region at the other end, and a channel region in the middle portion. Back gate conductors are positioned between channel regions of alternating pairs of the fin structures and front gate conductors are positioned between channel regions of opposite alternating pairs of the fin structures. Thus, the back gate conductors and the front gate conductors are alternatively inter-digitated between channel regions of the fin structures.

    摘要翻译: 公开了用于形成分裂栅极鳍型场效应晶体管(FinFET)的方法和结构。 本发明产生具有平行翅片结构的分裂栅极鳍型场效应晶体管(FinFET)。 每个翅片结构的一端具有源极区域,另一端处的漏极区域和中间部分中的沟道区域。 背栅导体定位在翅片结构的交替对的通道区域之间,并且前栅极导体位于翅片结构的相对交替对的通道区域之间。 因此,背栅极导体和前栅极导体在散热片结构的沟道区域之间被交替地数位化。