公开(公告)号：US06996208B2

公开(公告)日：2006-02-07

申请号：US10810818

申请日：2004-03-29

申请人： Kurt Helming ,  Lutz Brügemann

发明人： Kurt Helming ,  Lutz Brügemann

IPC分类号： G01N23/20

CPC分类号： G01N23/203 ,  G01N23/20

摘要： An X-ray optical system comprising an X-ray source (1), from which X-ray radiation (2) is guided to a sample (4) under investigation, and an X-ray detector (7) for receiving radiation (5) diffracted or scattered from the sample (4), wherein a beam-guiding X-ray optical element (3, 6), such as e.g. a collimator, a mono- or polycapillary, an X-ray mirror or a monochromator, is disposed between the source (1) and the sample (4) and/or between the sample (4) and the detector (7), is characterized in that a wobble means is provided for moving the X-ray optical element (3, 6) in an oscillating fashion during the measurement. The inventive X-ray optical system obtains averaged X-ray analysis information from objects under investigation having large mass which consist of macrocrystalline material without destroying or accelerating the object under investigation.

摘要翻译： 一种X射线光学系统，包括X射线源（1），X射线源（2）被引导到被研究的样本（4），以及用于接收辐射的X射线检测器（5） ）从样品（4）衍射或散射，其中光束引导X射线光学元件（3,6），例如 在源（1）和样品（4）之间和/或样品（4）和检测器（7）之间设置准直器，单毛或多毛细管，X射线镜或单色仪，其特征在于 因为提供摆动装置用于在测量期间以振荡方式移动X射线光学元件（3,6）。 本发明的X射线光学系统从被研究物体获得平均的X射线分析信息，该信息具有大的质量，由宏观材料组成，而不会破坏或加速被研究物体。

公开(公告)号：US20050105684A1

公开(公告)日：2005-05-19

申请号：US10927427

申请日：2004-08-26

申请人： Lutz Bruegemann ,  Ekkehard Gerndt ,  Heiko Ress ,  Kurt Helming ,  Uwe Preckwinkel

发明人： Lutz Bruegemann ,  Ekkehard Gerndt ,  Heiko Ress ,  Kurt Helming ,  Uwe Preckwinkel

IPC分类号： G01N23/207 ,  G01N23/20 ,  G01J3/28

CPC分类号： G01N23/207

摘要： A detector arrangement for detecting X-ray or neutron radiation redirected from a sample makes use of a one-dimensional particle or photon counting detector. The detector is oriented along a direction that is disposed substantially perpendicularly to a straight line extending between the sample and the detector. The detector may be rotated within the detection plane to allow inexpensive acquisition of two-dimensional diffraction patterns without the use of a two-dimensional detector.

摘要翻译： 用于检测从样品重定向的X射线或中子辐射的检测器装置使用一维粒子或光子计数检测器。 检测器沿着基本上垂直于在样品和检测器之间延伸的直线设置的方向定向。 检测器可以在检测平面内旋转，从而在不使用二维检测器的情况下便宜地获取二维衍射图。