公开(公告)号：US20180299505A1

公开(公告)日：2018-10-18

申请号：US15486287

申请日：2017-04-12

申请人： LEAP ELECTRONIC CO., LTD.

发明人： AN-SUNG WANG ,  CHING-CHANG WONG ,  YANG-HAN LEE

IPC分类号： G01R31/28 ,  B65G47/91

CPC分类号： G01R31/2893 ,  B65G47/914 ,  G01R31/2875

摘要： A length adjustable arm and MEMS position detection equipment rotation test apparatus includes an extendible section and first and second rotary bodies provided at one end of a rotation device for variation of a feeding position of a first feeding component so that feeding component is capable of conducting various feeding ways. Further, a worktable is provided thereon with at least one rotation section, which has a surface on which a plurality of operation stations is mounted. As such, through circular change made by the rotation section in respect of the locations of the operation stations, an effect of effectively and efficiently burning or testing can be achieved. Further, the operation stations are provided, on a periphery thereof, with a turning section, and the turning section is operable to turn each of the operation stations in order to effectively conduct tests for various MEMS inertial components.