公开(公告)号：US5221905A

公开(公告)日：1993-06-22

申请号：US843050

申请日：1992-02-28

Applicant: Labh S. Bhangu ,  Thomas Morrison ,  Klaus Probst

Inventor： Labh S. Bhangu ,  Thomas Morrison ,  Klaus Probst

IPC: G01R31/04

CPC classification number: G01R31/041

Abstract: An improved test system includes means for generating a contact wetting pulse and applying the contact wetting pulse to a network such that contact resistance at the interfaces between probes of the test system and terminals of the network is effectively lowered.

Abstract translation: 改进的测试系统包括用于产生接触润湿脉冲并将接触润湿脉冲施加到网络的装置，使得测试系统的探针与网络终端之间的接口处的接触电阻被有效降低。

公开(公告)号：US5917329A

公开(公告)日：1999-06-29

申请号：US840836

申请日：1997-04-17

Applicant: Robert H. Cadwallader ,  Thomas Morrison ,  Klaus Probst ,  Brian J. Wojszynski ,  William A. Yager

Inventor： Robert H. Cadwallader ,  Thomas Morrison ,  Klaus Probst ,  Brian J. Wojszynski ,  William A. Yager

IPC: G01R31/28 ,  G01R31/02

CPC classification number: G01R31/2886

Abstract: An electrical contacting apparatus for testing a substrate (54) and having a principal axis includes an electrical contact pad, a guide plate (106), a supporting bridge (132), and a mechanism for providing a contact actuation force. The guide plate includes side edges with guide pins (108) extending radially outward from a center of each side edge. The electrical contact pad (114) is mounted and centered upon a top surface of the guide plate (106). The support bridge supports the guide plate to enable a pivotal movement of the guide plate about a point on the principal axis. Lastly, the contact actuation force mechanism provides a contact actuation force to a center of the bottom surface of the guide plate to maintain an equal force across the electrical contact pad in a direction of the principal axis, whereby the electrical contact pad provides a desired contacting force equally balanced across an entire contact area defined by an area of contact between the electrical contact pad and a substrate being contacted. The substrate (54) is to be clamped between test probes (52) and the contact pad (114).

Abstract translation: 用于测试基板（54）并具有主轴的电接触装置包括电接触焊盘，引导板（106），支撑桥（132）和用于提供接触致动力的机构。 引导板包括具有从每个侧边缘的中心径向向外延伸的引导销（108）的侧边缘。 电接触垫（114）被安装并且位于引导板（106）的顶表面上。 支撑桥支撑引导板，以使得引导板围绕主轴上的点枢转运动。 最后，接触致动力机构向引导板的底表面的中心提供接触致动力，以在主轴线的方向上在电接触焊盘上保持相等的力，由此电接触垫提供期望的接触 在由电接触焊盘和正在接触的基板之间的接触区域限定的整个接触区域上的力均匀平衡。 衬底（54）被夹在测试探针（52）和接触垫（114）之间。

公开(公告)号：US6054863A

公开(公告)日：2000-04-25

申请号：US710130

申请日：1996-09-11

Applicant: Thomas Morrison ,  Siegfried Geyer ,  Charles J. Hendricks ,  Klaus Probst

Inventor： Thomas Morrison ,  Siegfried Geyer ,  Charles J. Hendricks ,  Klaus Probst

IPC: G01R31/28 ,  G01R31/02 ,  H01H31/02

CPC classification number: G01R31/2803

Abstract: A system for testing circuit boards comprising a probe network having a plurality of probes wherein each probe is adapted for contacting an end of a corresponding circuit board network and wherein each probe and network define a node having an address. The system further comprises a control device that includes a node address generator and a timing circuit having an output for outputting a pulse to the node having the address generated by the node address generator and for coupling the remaining nodes to electrical ground. The system further comprises a comparator for comparing the pulse outputted by the timing circuit to predetermined data.

Abstract translation: 一种用于测试电路板的系统，包括具有多个探针的探针网络，其中每个探针适于接触相应电路板网络的端部，并且其中每个探针和网络限定具有地址的节点。 该系统还包括控制装置，其包括节点地址发生器和定时电路，该定时电路具有用于向具有由节点地址发生器产生的地址的节点输出脉冲并用于将剩余节点耦合到电接地的输出。 该系统还包括比较器，用于将定时电路输出的脉冲与预定数据进行比较。

公开(公告)号：US6043667A

公开(公告)日：2000-03-28

申请号：US840834

申请日：1997-04-17

Applicant: Robert H. Cadwallader ,  Thomas Morrison ,  Klaus Probst ,  William A. Yager

Inventor： Robert H. Cadwallader ,  Thomas Morrison ,  Klaus Probst ,  William A. Yager

IPC: G01R31/28 ,  G01R13/02

CPC classification number: G01R31/2887 ,  G01R31/2831

Abstract: A substrate tester and method of testing are disclosed in which the tester moves a substrate to be tested into a precise location within the tester prior to making contact with fragile tester pins. The substrate is then clamped in a precise X-Y location relative to the tester contact pins, also without making contact with the tester pins. Next the substrate top surface is moved quickly to a precise Z-axis location, whereupon the tester contact pins are finally applied to the substrate using Z-axis motion only. In addition, a mechanism is included that features a cam-pivot arm micro-switch combination to sense when a product is not properly positioned in or missing from the test station.

Abstract translation: 公开了一种基板测试器和测试方法，其中测试仪在与脆弱的测试器引脚接触之前将待测基板移动到测试仪内的精确位置。 然后将基板相对于测试器接触销夹紧在精确的X-Y位置，也不与测试器引脚接触。 接下来，将基板顶表面快速移动到精确的Z轴位置，然后使用Z轴运动将测试器接触销最终施加到基板。 此外，还包括一种机构，其特征在于具有凸轮枢轴臂微动开关组合，用于感测产品何时未正确定位在测试台中或从测试台中丢失。

公开(公告)号：US6005386A

公开(公告)日：1999-12-21

申请号：US840835

申请日：1997-04-17

Applicant: Robert H. Cadwallader ,  Thomas Morrison ,  Klaus Probst ,  Brian J. Wojszynski ,  William A. Yager

Inventor： Robert H. Cadwallader ,  Thomas Morrison ,  Klaus Probst ,  Brian J. Wojszynski ,  William A. Yager

IPC: G01R31/28 ,  G01R1/04 ,  G01R31/02

CPC classification number: G01R31/2808

Abstract: An apparatus for locating a workpiece on a processing surface includes a first locator arm assembly, a second locator arm assembly, and a pivotal member. The first locator arm assembly includes a first multiple position locator jaw disposed for lateral movement and mating engagement with a first portion of the workpiece. The second locator arm assembly includes a second multiple position locator jaw disposed for lateral movement parallel to the first multiple position locator jaw and further for mating engagement with a second, opposite side, portion of the workpiece. Lastly, the pivotal member is disposed for pivotal movement about a pivot point. The pivotal member is symmetrically coupled between the first locator arm assembly and the second locator arm assembly for inducing an equal but opposite lateral movement in the first and second locator jaws to accurately locate the workpiece on the processing surface between the first and second locator jaws as the locator jaws move towards one another.

Abstract translation: 用于在加工表面上定位工件的装置包括第一定位臂组件，第二定位臂组件和枢转构件。 第一定位臂组件包括设置成横向移动并与工件的第一部分配合接合的第一多位置定位器夹爪。 第二定位器臂组件包括第二多位置定位器卡爪，其布置成用于横向运动，平行于第一多位置定位器卡爪并进一步用于与工件的第二相对侧部分配合接合。 最后，枢转构件设置成绕枢轴点枢转运动。 所述枢转构件对称地联接在所述第一定位臂组件和所述第二定位臂组件之间，用于在所述第一和第二定位器钳口中引起相等但相反的横向运动，以将所述工件精确地定位在所述第一和第二定位器钳口之间的所述加工表面上， 定位器颚向彼此移动。