公开(公告)号：USD704046S1

公开(公告)日：2014-05-06

申请号：US29420541

申请日：2012-05-10

Applicant: Colin Rogers ,  Thomas Morrison

Designer： Colin Rogers ,  Thomas Morrison

公开(公告)号：US08697452B2

公开(公告)日：2014-04-15

申请号：US13491989

申请日：2012-06-08

Applicant: John Linton ,  Arrin Katz ,  Colin Brenan ,  Karl Yoder ,  Robert Hess ,  Leila Hasan ,  Robert Ellis ,  Tanya Kanigan ,  Kristine Friesen ,  Thomas Morrison ,  Javier Garcia

Inventor： John Linton ,  Arrin Katz ,  Colin Brenan ,  Karl Yoder ,  Robert Hess ,  Leila Hasan ,  Robert Ellis ,  Tanya Kanigan ,  Kristine Friesen ,  Thomas Morrison ,  Javier Garcia

IPC: G01N21/00 ,  G01N1/10

CPC classification number: C12Q1/6858 ,  B01L3/5025 ,  B01L3/5027 ,  B01L3/508 ,  B01L3/50853 ,  B01L3/50857 ,  B01L7/52 ,  B01L2200/16 ,  B01L2300/021 ,  B01L2300/0609 ,  B01L2300/0636 ,  B01L2300/0819 ,  B01L2300/0829 ,  B01L2300/16 ,  B01L2300/1822 ,  B01L2300/1838 ,  G01N21/03 ,  G01N21/15 ,  G01N21/253 ,  G01N2021/0346 ,  G01N2021/056 ,  G01N2021/158 ,  Y10T436/11 ,  Y10T436/25 ,  Y10T436/2575

Abstract: A system for holding at least one of sample and reagent for analysis. The system includes a pair of parallel covers, at least one of which is light transmissive, of which pair a light transmissive cover forms a top, and of which pair the other forms a bottom. A frame is disposed between the covers to define, in relation to the covers, an interior volume. The frame and the covers are associated with one another to form a case, the case being substantially tight to liquids. A microfluidic array is disposed in the interior volume. The array includes a sheet of material having a pair of opposed surfaces, a thickness, and a plurality of through-holes running through the thickness between the surfaces, the through-holes containing at least one of sample and reagent.

Abstract translation: 用于容纳至少一个样品和试剂用于分析的系统。 该系统包括一对平行的盖，其至少一个是透光的，其中一对透光盖形成顶部，并且其中一对形成底部。 框架设置在盖之间，以相对于盖限定内部空间。 框架和盖子彼此相关联以形成壳体，该壳体基本上与液体紧密。 微流体阵列设置在内部体积中。 阵列包括具有一对相对表面的厚度的材料片，以及穿过表面之间的厚度的多个通孔，通孔包含至少一个样品和试剂。

公开(公告)号：US20060141562A1

公开(公告)日：2006-06-29

申请号：US10524234

申请日：2003-08-11

Applicant: Beat Blattmann ,  Aldis Darzins ,  John Davis ,  Lance Encell ,  Thomas Morrison ,  Gregory Mrachko ,  Volker Schellenberger

Inventor： Beat Blattmann ,  Aldis Darzins ,  John Davis ,  Lance Encell ,  Thomas Morrison ,  Gregory Mrachko ,  Volker Schellenberger

IPC: C12P21/06 ,  C12N9/16 ,  C07H21/04 ,  C12N1/21 ,  C12N15/74

CPC classification number: C12N15/8243 ,  C12N9/16 ,  C12N15/8245

Abstract: Cells producing mutant phytases having modified activity are provided, as well as the phytases so produced. Also provided are methods of making and producing such phytases and the use of the expressed phytase protein in feed as a supplement.

Abstract translation: 提供具有改变活性的产生突变体植酸酶的细胞，以及如此制备的植酸酶。 还提供了制备和生产这种植酸酶的方法以及在饲料中使用表达的植酸酶蛋白作为补充物。

公开(公告)号：US6058592A

公开(公告)日：2000-05-09

申请号：US86046

申请日：1998-05-28

Applicant: Robert H. Cadwallader ,  Michael J. Fisher ,  Thomas Morrison

Inventor： Robert H. Cadwallader ,  Michael J. Fisher ,  Thomas Morrison

IPC: B23Q3/18 ,  B25B5/06 ,  B25B5/14 ,  H01L21/68 ,  B23Q3/08

CPC classification number: H01L21/68 ,  B23Q3/18 ,  B25B5/06 ,  B25B5/142 ,  Y10S269/902 ,  Y10T29/49998

Abstract: An apparatus for locating a workpiece on a processing surface includes a first locator arm assembly, a second locator arm assembly, and a pivotal member. The first locator arm assembly includes a first surface disposed for lateral movement and mating engagement with a first portion of the workpiece. The second locator arm assembly includes a second surface disposed for lateral movement parallel to the first surface, the second surface further for mating engagement with a second, opposite side, portion of the workpiece. Lastly, pivotal member is disposed for pivotal movement about a pivot point and symmetrically coupled, with a zero tolerance buildup, between the first locator arm assembly and the second locator arm assembly for inducing an equal but opposite lateral movement in the first and second mating engagement surfaces of the first and second locator arm assemblies, respectively, whereby the workpiece is accurately located on the processing surface between respective first and second mating engagement surfaces as the surfaces are moved towards one another.

Abstract translation: 用于在加工表面上定位工件的装置包括第一定位臂组件，第二定位臂组件和枢转构件。 第一定位臂组件包括设置成横向移动的第一表面和与工件的第一部分配合接合。 第二定位臂组件包括设置成平行于第一表面横向移动的第二表面，第二表面还用于与工件的第二相对侧部配合接合。 最后，枢转构件设置成围绕枢转点枢转运动，并且在第一定位臂组件和第二定位臂组件之间对称耦合并具有零容差积分，用于在第一和第二配合接合中引起相等但相反的侧向运动 分别表示第一和第二定位臂组件，由此当表面相互移动时，工件精确地位于相应的第一和第二配合接合表面之间的处理表面上。

公开(公告)号：US6043667A

公开(公告)日：2000-03-28

申请号：US840834

申请日：1997-04-17

Applicant: Robert H. Cadwallader ,  Thomas Morrison ,  Klaus Probst ,  William A. Yager

Inventor： Robert H. Cadwallader ,  Thomas Morrison ,  Klaus Probst ,  William A. Yager

IPC: G01R31/28 ,  G01R13/02

CPC classification number: G01R31/2887 ,  G01R31/2831

Abstract: A substrate tester and method of testing are disclosed in which the tester moves a substrate to be tested into a precise location within the tester prior to making contact with fragile tester pins. The substrate is then clamped in a precise X-Y location relative to the tester contact pins, also without making contact with the tester pins. Next the substrate top surface is moved quickly to a precise Z-axis location, whereupon the tester contact pins are finally applied to the substrate using Z-axis motion only. In addition, a mechanism is included that features a cam-pivot arm micro-switch combination to sense when a product is not properly positioned in or missing from the test station.

Abstract translation: 公开了一种基板测试器和测试方法，其中测试仪在与脆弱的测试器引脚接触之前将待测基板移动到测试仪内的精确位置。 然后将基板相对于测试器接触销夹紧在精确的X-Y位置，也不与测试器引脚接触。 接下来，将基板顶表面快速移动到精确的Z轴位置，然后使用Z轴运动将测试器接触销最终施加到基板。 此外，还包括一种机构，其特征在于具有凸轮枢轴臂微动开关组合，用于感测产品何时未正确定位在测试台中或从测试台中丢失。

公开(公告)号：US6005386A

公开(公告)日：1999-12-21

申请号：US840835

申请日：1997-04-17

Applicant: Robert H. Cadwallader ,  Thomas Morrison ,  Klaus Probst ,  Brian J. Wojszynski ,  William A. Yager

Inventor： Robert H. Cadwallader ,  Thomas Morrison ,  Klaus Probst ,  Brian J. Wojszynski ,  William A. Yager

IPC: G01R31/28 ,  G01R1/04 ,  G01R31/02

CPC classification number: G01R31/2808

Abstract: An apparatus for locating a workpiece on a processing surface includes a first locator arm assembly, a second locator arm assembly, and a pivotal member. The first locator arm assembly includes a first multiple position locator jaw disposed for lateral movement and mating engagement with a first portion of the workpiece. The second locator arm assembly includes a second multiple position locator jaw disposed for lateral movement parallel to the first multiple position locator jaw and further for mating engagement with a second, opposite side, portion of the workpiece. Lastly, the pivotal member is disposed for pivotal movement about a pivot point. The pivotal member is symmetrically coupled between the first locator arm assembly and the second locator arm assembly for inducing an equal but opposite lateral movement in the first and second locator jaws to accurately locate the workpiece on the processing surface between the first and second locator jaws as the locator jaws move towards one another.

Abstract translation: 用于在加工表面上定位工件的装置包括第一定位臂组件，第二定位臂组件和枢转构件。 第一定位臂组件包括设置成横向移动并与工件的第一部分配合接合的第一多位置定位器夹爪。 第二定位器臂组件包括第二多位置定位器卡爪，其布置成用于横向运动，平行于第一多位置定位器卡爪并进一步用于与工件的第二相对侧部分配合接合。 最后，枢转构件设置成绕枢轴点枢转运动。 所述枢转构件对称地联接在所述第一定位臂组件和所述第二定位臂组件之间，用于在所述第一和第二定位器钳口中引起相等但相反的横向运动，以将所述工件精确地定位在所述第一和第二定位器钳口之间的所述加工表面上， 定位器颚向彼此移动。

公开(公告)号：US5221905A

公开(公告)日：1993-06-22

申请号：US843050

申请日：1992-02-28

Applicant: Labh S. Bhangu ,  Thomas Morrison ,  Klaus Probst

Inventor： Labh S. Bhangu ,  Thomas Morrison ,  Klaus Probst

IPC: G01R31/04

CPC classification number: G01R31/041

Abstract: An improved test system includes means for generating a contact wetting pulse and applying the contact wetting pulse to a network such that contact resistance at the interfaces between probes of the test system and terminals of the network is effectively lowered.

Abstract translation: 改进的测试系统包括用于产生接触润湿脉冲并将接触润湿脉冲施加到网络的装置，使得测试系统的探针与网络终端之间的接口处的接触电阻被有效降低。

公开(公告)号：US20070264698A1

公开(公告)日：2007-11-15

申请号：US11599672

申请日：2006-11-14

Applicant: Volker Schellenberger ,  Donald Naki ,  Thomas Morrison

Inventor： Volker Schellenberger ,  Donald Naki ,  Thomas Morrison

IPC: C12P1/04 ,  G06G7/48

CPC classification number: G16C20/60 ,  G16B15/00 ,  G16B30/00 ,  G16B35/00

Abstract: Methods of creating libraries of biological polymers are provided. The construction of a library employs a probability matrix for a reference sequence, and a constraint vector for which is applied to the probability matrix to produce a substitution scheme. The substitution scheme is then used to generate a library comprising substitutions recommended by the substitution scheme. The library members, or host cells comprising and/or expressing them, can be screened for desired changes in a property of interest in the biological polymers in the library.

Abstract translation: 提供了生成生物聚合物库的方法。 图书馆的构建使用参考序列的概率矩阵，并将其约束向量应用于概率矩阵以产生替代方案。 然后将替代方案用于生成包含取代方案推荐的取代的文库。 文库成员或包含和/或表达它们的宿主细胞可以筛选出在文库中的生物聚合物中感兴趣的性质的期望变化。

公开(公告)号：US6054863A

公开(公告)日：2000-04-25

申请号：US710130

申请日：1996-09-11

Applicant: Thomas Morrison ,  Siegfried Geyer ,  Charles J. Hendricks ,  Klaus Probst

Inventor： Thomas Morrison ,  Siegfried Geyer ,  Charles J. Hendricks ,  Klaus Probst

IPC: G01R31/28 ,  G01R31/02 ,  H01H31/02

CPC classification number: G01R31/2803

Abstract: A system for testing circuit boards comprising a probe network having a plurality of probes wherein each probe is adapted for contacting an end of a corresponding circuit board network and wherein each probe and network define a node having an address. The system further comprises a control device that includes a node address generator and a timing circuit having an output for outputting a pulse to the node having the address generated by the node address generator and for coupling the remaining nodes to electrical ground. The system further comprises a comparator for comparing the pulse outputted by the timing circuit to predetermined data.

Abstract translation: 一种用于测试电路板的系统，包括具有多个探针的探针网络，其中每个探针适于接触相应电路板网络的端部，并且其中每个探针和网络限定具有地址的节点。 该系统还包括控制装置，其包括节点地址发生器和定时电路，该定时电路具有用于向具有由节点地址发生器产生的地址的节点输出脉冲并用于将剩余节点耦合到电接地的输出。 该系统还包括比较器，用于将定时电路输出的脉冲与预定数据进行比较。

公开(公告)号：US5873566A

公开(公告)日：1999-02-23

申请号：US840833

申请日：1997-04-17

Applicant: Robert H. Cadwallader ,  Michael J. Fisher ,  Thomas Morrison

Inventor： Robert H. Cadwallader ,  Michael J. Fisher ,  Thomas Morrison

IPC: B23Q3/18 ,  B25B5/06 ,  B25B5/14 ,  H01L21/68 ,  B23Q3/08

CPC classification number: H01L21/68 ,  B23Q3/18 ,  B25B5/06 ,  B25B5/142 ,  Y10S269/902 ,  Y10T29/49998

Abstract: An apparatus for locating a workpiece on a processing surface includes a first locator arm assembly, a second locator arm assembly, and a pivotal member. The first locator arm assembly includes a first surface disposed for lateral movement and mating engagement with a first portion of the workpiece. The second locator arm assembly includes a second surface disposed for lateral movement parallel to the first surface, the second surface further for mating engagement with a second, opposite side, portion of the workpiece. Lastly, pivotal member is disposed for pivotal movement about a pivot point and symmetrically coupled, with a zero tolerance buildup, between the first locator arm assembly and the second locator arm assembly for inducing an equal but opposite lateral movement in the first and second mating engagement surfaces of the first and second locator arm assemblies, respectively, whereby the workpiece is accurately located on the processing surface between respective first and second mating engagement surfaces as the surfaces are moved towards one another.

Abstract translation: 用于在加工表面上定位工件的装置包括第一定位臂组件，第二定位臂组件和枢转构件。 第一定位臂组件包括设置成横向移动的第一表面和与工件的第一部分配合接合。 第二定位臂组件包括设置成平行于第一表面横向移动的第二表面，第二表面还用于与工件的第二相对侧部配合接合。 最后，枢转构件设置成围绕枢转点枢转运动，并且在第一定位臂组件和第二定位臂组件之间对称耦合并具有零容差积分，用于在第一和第二配合接合中引起相等但相反的侧向运动 分别表示第一和第二定位臂组件，由此当表面相互移动时，工件精确地位于相应的第一和第二配合接合表面之间的处理表面上。