公开(公告)号：US20240234082A1

公开(公告)日：2024-07-11

申请号：US18618285

申请日：2024-03-27

Applicant: LightVision Inc.

Inventor： Jin Ha JEONG ,  Moon Soo RA ,  Hea Yun LEE ,  Hyun Ji LEE

IPC: H01J37/22 ,  H01J37/04 ,  H01J37/26

CPC classification number: H01J37/22 ,  H01J37/04 ,  H01J37/26 ,  H01J2237/153 ,  H01J2237/24585

Abstract: A system and a method of generating adaptively a TEM SADP image with high discernment according to inputted parameters are disclosed. The system for generating a diffraction pattern image includes a sample generating unit configured to generate a sample by using at least one of a parameter about a lattice constant, a parameter about relative location of atom in unit lattice and a parameter about a zone axis, a vector generating unit configured to generate a reciprocal lattice vector corresponding to the unit lattice, a light source generating unit configured to calculate brightness of an electron beam reached to atom in the generated sample and a diffraction pattern generating unit configured to generate synthetic diffraction pattern image by using the generated reciprocal lattice vector, the relative location of atom in the sample and the calculated brightness of the electron beam.

公开(公告)号：US20240296611A1

公开(公告)日：2024-09-05

申请号：US18661683

申请日：2024-05-12

Applicant: LightVision Inc.

Inventor： Jin Ha JEONG ,  Moon Soo RA ,  Hea Yun LEE ,  Hyun Ji LEE

IPC: G06T11/60 ,  G06T7/00 ,  G06T7/50 ,  G06V10/774

CPC classification number: G06T11/60 ,  G06T7/0002 ,  G06T7/50 ,  G06T2207/20081 ,  G06T2207/20084 ,  G06V10/774

Abstract: A method of generating a defect image of material based on artificial intelligence and a system for detecting a defect are disclosed. The system includes a learning data generating unit configured to generate multiple synthetic good quality images or synthetic defect images using a defect image, a learning unit configured to learn a model for detection of a defect by using the generated synthetic good quality images or the generated synthetic defect images and a defect detecting unit configured to detect a defect of an input image using the learned model. Here, the learning data generating unit detects a shape of the defect or a shape of a background by analyzing a kind or a distribution of the defect image, and generate different kind, number or resolution of the synthetic good quality image or the synthetic defect image depending on the detected shape of the defect or the detected shape of the background.

公开(公告)号：US20240282129A1

公开(公告)日：2024-08-22

申请号：US18612883

申请日：2024-03-21

Applicant: LightVision Inc.

Inventor： Jin Ha JEONG ,  Moon Soo RA ,  Hea Yun LEE ,  Hyun Ji LEE

IPC: G06V20/69 ,  G06V10/774 ,  G06V20/70

CPC classification number: G06V20/698 ,  G06V10/774 ,  G06V20/693 ,  G06V20/70

Abstract: A method and a system for providing a parking service are disclosed. An SADP classification scheme comprises plural labels. Here, the labels are constructed by grouping SADP (Selected Area Diffraction Pattern) images photographed through a TEM (Transmission Electron Microscope, TEM) according to specific reference, and the labels are matched with space groups of a classification scheme in crystallography.

公开(公告)号：US20240257318A1

公开(公告)日：2024-08-01

申请号：US18629462

申请日：2024-04-08

Applicant: LightVision Inc.

Inventor： Jin Ha JEONG ,  Moon Soo RA ,  Hea Yun LEE ,  Hyun Ji LEE

IPC: G06T5/60 ,  G06T11/00 ,  H01J37/22 ,  H01J37/26

CPC classification number: G06T5/60 ,  G06T11/00 ,  H01J37/222 ,  G06T2207/10056 ,  G06T2207/20081 ,  H01J37/26

Abstract: A system and a method of generating adaptively a TEM SADP image with high discernment according to inputted parameters are disclosed. The system for converting a diffraction pattern image includes a real diffraction pattern image refining unit configured to remove unnecessary information from a real diffraction pattern image; a synthetic diffraction pattern generating unit configured to obtain a synthetic diffraction pattern image corresponding to the real diffraction pattern image in which the unnecessary information is removed; and a real-synthetic interconversion algorithm learning unit configured to generate an image belonging to a real diffraction pattern domain from an image belonging to a synthetic diffraction pattern domain or generate an image belonging to the synthetic diffraction pattern domain from an image belonging to the real diffraction pattern domain by using at least one of the real diffraction pattern image in which the unnecessary information is removed and the synthetic diffraction pattern image.

公开(公告)号：US20250014346A1

公开(公告)日：2025-01-09

申请号：US18882389

申请日：2024-09-11

Applicant: LightVision Inc.

Inventor： Jin Ha JEONG ,  Moon Soo RA ,  Hea Yun LEE ,  Hyun Ji LEE

IPC: G06V20/52 ,  G06K7/14 ,  G06T7/246 ,  G06T7/292 ,  G06V10/74 ,  G06V20/62 ,  G07B15/02

Abstract: A parking management system comprises a first image obtaining device configured to recognize a vehicle number at an entry of a parking lot or in the parking lot, a second image obtaining device installed in the parking lot, and a computing device configured to communicate with the first image obtaining device or the second image obtaining device. Here, the computing device identifies the vehicle considering vehicle information detected by using a re-identification (RE-ID) technology and vehicle information obtained by analyzing an image obtained from at least one of the image obtaining devices, and the RE-ID technology determines whether vehicles are the same by using appearance information of a vehicle included in an image obtained by the first image obtaining device and appearance information of a vehicle included in an image obtained by the second image obtaining device.