Phase change memory material and system for embedded memory applications
    1.
    发明授权
    Phase change memory material and system for embedded memory applications 有权
    相变存储器材料和嵌入式存储器应用系统

    公开(公告)号:US09214229B2

    公开(公告)日:2015-12-15

    申请号:US14309776

    申请日:2014-06-19

    Abstract: A family of phase change materials GewSbxTeyNz having a crystallization temperature greater than 410° C., wherein a Ge atomic concentration is within a range from 43% to 54%, a Sb atomic concentration is within a range from 6% to 13%, a Te atomic concentration is within a range from 14% to 23%, and a N atomic concentration is within a range of 15% to 27%, is described. A method for programming a memory device including such phase change materials is also described.

    Abstract translation: 一种具有大于410℃的结晶温度的相变材料GewSbxTeyNz,其中Ge原子浓度在43%至54%的范围内,Sb原子浓度在6%至13%的范围内,a Te原子浓度在14%至23%的范围内,并且N原子浓度在15%至27%的范围内。 还描述了一种用于编程包括这种相变材料的存储器件的方法。

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