公开(公告)号：US20240311288A1

公开(公告)日：2024-09-19

申请号：US18591692

申请日：2024-02-29

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Kyle Brock-Petersen ,  Scheheresade Virani ,  Steven Gaskill

IPC: G06F12/02

CPC classification number: G06F12/023

Abstract: Described are systems and methods for internal log management in memory sub-systems. An example memory sub-system comprises a controller managing one or more memory devices. The controller is configured to perform operations, comprising: maintaining a write pointer referencing a next data item position within a log buffer residing on a memory device of the one or more memory devices; maintaining a log retrieval pointer referencing a data retrieval position within the log buffer; storing, at a log buffer position specified by the write pointer, a data item reflecting a state of the system; advancing the write pointer by a size of the data item; responsive to determining that the write pointer exceeds an end of the log buffer, wrapping the write pointer around the end of the log buffer; responsive to receiving, from a host, a log retrieval request, retrieving the log data starting from the position within the log buffer referenced by the log retrieval pointer; transmitting the retrieved log data to the host; advancing the log retrieval pointer by a size of the retrieved log data; responsive to determining that the log retrieval pointer exceeds the end of the log buffer, wrapping the log retrieval pointer around the end of the log buffer.

公开(公告)号：US20240355402A1

公开(公告)日：2024-10-24

申请号：US18637913

申请日：2024-04-17

Applicant: Micron Technology, Inc.

Inventor： Robert Winston Mason ,  Scott Anthony Stoller ,  Kyle Brock-Petersen

IPC: G11C16/34 ,  G11C16/10

CPC classification number: G11C16/3459 ,  G11C16/102 ,  G11C16/3404

Abstract: A system and method for a memory device for detecting, by a processing device, a failure exhibited by a set of cells of a memory device, estimating a severity of the failure, identifying, based on the severity of the failure, a failed subset of cells of the set of cells, and copying data from the failed subset of cells to a second set of cells of the memory device.