专利检索 ap:("MITSUBISHI HEAVY INDUSTRIES, LTD." OR "Japan Aerospace Exploration Agency" OR "HAMAMATSU PHOTONICS K.K.") AND inv:"KAZUMASA KOSUGI" 第 1 页

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发明申请
RADIATION MEASURING APPARATUS AND RADIATION MEASURING METHOD 审中-公开

公开(公告)号：US20180180747A1

公开(公告)日：2018-06-28

申请号：US15735389

申请日：2016-07-22

申请人： MITSUBISHI HEAVY INDUSTRIES, LTD. , Japan Aerospace Exploration Agency , HAMAMATSU PHOTONICS K.K.

发明人： Daisuke MATSUURA , Yoshikatsu KURODA , Kei GEMBA , Tadayuki TAKAHASHI , Shin WATANABE , Shin'ichiro TAKEDA , Hiroo YAMAMOTO , KAZUMASA KOSUGI , Kazuhisa Yamamura

IPC分类号： G01T1/24 , G01T1/29

CPC分类号： G01T1/241 , G01T1/24 , G01T1/244 , G01T1/247 , G01T1/29 , G01T1/2907

摘要： A radiation measuring apparatus (20) includes a scatterer detector (10A), an absorber detector (10B) and a processing unit (12). Pixel electrodes (2) of the scatterer detector (10A) and the absorber detector (10B) are arranged such that a distance between centers of two neighbor pixel electrodes (2) is smaller than a mean free path of a recoil electron generated in the Compton scattering of an electromagnetic radiation. The processing unit (12) specifies and incidence direction of the electromagnetic radiation based on a recoiling direction to which the recoil electron recoils. In this way, an electron tracking-type Compton camera is realized which confines the incidence direction of the electromagnetic radiation by using the recoiling direction of the recoil electron in a Compton camera using a semiconductor detector.