MEASURING PROBE
    1.
    发明申请
    MEASURING PROBE 审中-公开

    公开(公告)号:US20170248402A1

    公开(公告)日:2017-08-31

    申请号:US15440280

    申请日:2017-02-23

    Abstract: A measuring probe includes two supporting members, each having a rotationally symmetric shape and allowing for an attitude change of a stylus, in an axial direction of a probe housing. Four detection elements are disposed at fourfold symmetric positions in one of the two supporting members that includes four deformable arm parts. A signal processing circuit includes a first processing part that processes outputs of the detection elements to output three displacement signals representing displacement components of a contact part in mutually perpendicular three directions, respectively. The measuring probe capable of reducing measurement directional dependency of sensitivity with a simple configuration while maintaining high sensitivity is thus provided.

    PROBE UNIT AND MEASURING SYSTEM
    2.
    发明申请

    公开(公告)号:US20200166336A1

    公开(公告)日:2020-05-28

    申请号:US16690613

    申请日:2019-11-21

    Abstract: In a probe unit having a measuring probe, a signal processing circuit includes: a signal synthesizing portion configured to process an output of a detection element to output a composite signal obtained by synthesizing displacement components of a contact part in three directions perpendicular to one another; and a signal outputting portion configured to output a digital touch signal to the outside of the probe unit when the composite signal satisfies a predetermined threshold condition. The signal outputting portion includes three comparing portions each configured to compare a threshold condition with the composite signal. When the measuring probe measures the object to be measured, the signal outputting portion outputs the digital touch signal corresponding to outputs of the first and second comparing portions. Thus, there can be provided a probe unit and a measuring system that can stably make measurements with high accuracy while keeping high noise resistance.

    MEASURING PROBE
    3.
    发明申请
    MEASURING PROBE 审中-公开

    公开(公告)号:US20170248400A1

    公开(公告)日:2017-08-31

    申请号:US15440440

    申请日:2017-02-23

    CPC classification number: G01B5/30 G01B5/016 G01B7/001 G01B7/012

    Abstract: A measuring probe includes: a stylus having a contact part to be brought into contact with an object to be measured; a probe housing capable of supporting the stylus on an axial center; and a detection element capable of detecting a movement of the contact part. The measuring probe further includes: two supporting members disposed in an axial direction of the probe housing, the supporting member allowing for an attitude change of the stylus; and a coupling shaft for coupling the two supporting members together. The detection element is disposed in one of the two supporting members that is farthest away from a rotational center position of rotation generated in the stylus when a measuring force is applied to the contact part from a direction perpendicular to the axial direction, to detect a strain amount of the one of the two supporting members.

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