公开(公告)号：US20250020692A1

公开(公告)日：2025-01-16

申请号：US18635405

申请日：2024-04-15

Applicant: MPI CORPORATION

Inventor： SHENG-YU LIN ,  SHANG-JUNG HSIEH ,  CHE-WEI LIN ,  HSUEH-CHIH WU

IPC: G01R1/073 ,  G01R31/28

Abstract: An adhered multilayer die unit includes at least one probe zone and at least one non-probe zone for probes to be inserted in the probe zone. The adhered multilayer die unit includes dies and at least one adhesive layer. Each die includes at least one connecting surface, and through holes in the at least one probe zone for the probes to be inserted through the through holes of each die. The at least one adhesive layer adheres the connecting surfaces of the dies to each other. The at least one adhesive layer is entirely in the at least one non-probe zone. Accordingly, the adhered multilayer die unit of the invention has great structural strength in large-area condition, avoids drilling process difficulty problem and size restriction of fastening combining manner, avoids adhesive spillage and its affection on probes, and avoids adhesive-caused problems of adhesive spillage and die levelness deviation.

公开(公告)号：US20240241155A1

公开(公告)日：2024-07-18

申请号：US18409008

申请日：2024-01-10

Applicant: MPI CORPORATION

Inventor： CHIN-YI LIN ,  CHE-WEI LIN ,  HSUEH-CHIH WU ,  TSUNG-YI CHEN ,  SHANG-JUNG HSIEH ,  SHENG-YU LIN ,  CHIEN-KAI HUNG ,  SHENG-WEI LIN ,  SHU-JUI CHANG

IPC: G01R1/073 ,  G01R31/28

CPC classification number: G01R1/07342 ,  G01R31/2889

Abstract: A probe card includes a structure stiffener unit including a base with a lower surface where central and peripheral supporting elements protrude out and a main circuit board is fixed, a space transformer and a probe head disposed thereunder, which are disposed to the supporting elements by bolts and defined with central and peripheral regions located correspondingly to the central and peripheral supporting elements respectively, and a metal supporting member fixed on the space transformer in a direct contact manner and located correspondingly to the central region. The supporting member has a lower surface coplanar with the lower end surface of the peripheral supporting element, which is abutted on the space transformer, and an upper surface against which the central supporting element is abutted. The space transformer has great structural strength, flatness and heat dissipation effect for satisfying the large-area requirement and great electrical property testing stability.

公开(公告)号：US20250138050A1

公开(公告)日：2025-05-01

申请号：US18928912

申请日：2024-10-28

Applicant: MPI CORPORATION

Inventor： CHIN-YI LIN ,  HSIEN-TA HSU ,  CHE-WEI LIN ,  CHIH-MING HUANG

IPC: G01R1/067 ,  G01R3/00

Abstract: A vertical probe includes opposite first and third sides, and opposite second and fourth sides. The third and fourth sides extend in a planar manner from a body to a tip portion. The first and second sides include first and second upper plane segments at the body, first and second transition segments at the tip portion, and first and second lower plane segments closer to the third and fourth sides than the first and second upper plane segments are, respectively. The first and second transition segments gradually approach the third and fourth sides as they extend from the first and second upper plane segments to the first and second lower plane segments. The first transition and lower plane segments are realized by laser processing. The vertical probe can contact small conductive contacts with good current resistance, structural strength, lifespan, and processing accuracy. When applied to a probe head, breaking or shifting position of the tip portion due to vertical movement can be avoided.

公开(公告)号：US20220214380A1

公开(公告)日：2022-07-07

申请号：US17569080

申请日：2022-01-05

Applicant: MPI CORPORATION

Inventor： CHIN-YI LIN ,  KENG-MIN SU ,  CHE-WEI LIN ,  KO-CHUN WU

IPC: G01R1/44 ,  G01R1/073

Abstract: A heat dissipatable die unit includes an outer die, a metal heat dissipating layer and an inner die piled in order. The inner die includes a probe installation section, and a peripheral portion surrounding the probe installation section and having an inner connecting surface for being connected to a die and an outer connecting surface opposite thereto. The probe installation section has a recessed portion recessed from the inner connecting surface, and a protruding portion protruding from the outer connecting surface, thereby forming a level difference portion bordering the peripheral portion. The outer die includes an installation recess and a supporting portion surrounding the installation recess. The installation recess is recessed from an inner surface of the supporting portion and accommodates the protruding portion of the inner die. The metal heat dissipating layer is disposed between the peripheral portion and the supporting portion to attain heat dissipating effect.

公开(公告)号：US20220214379A1

公开(公告)日：2022-07-07

申请号：US17565075

申请日：2021-12-29

Applicant: MPI CORPORATION

Inventor： CHIN-YI LIN ,  KENG-MIN SU ,  CHE-WEI LIN ,  HSIN-CHENG HUNG

IPC: G01R1/073

Abstract: A probe head includes a middle die, upper and lower die units, at least one of which includes inner and outer dies detachably fastened to the middle die and each other, and a plurality of buckled probes inserted through the upper and lower die units. The inner die has an outer connecting surface connected with an inner surface of the outer die, where an installation recess is provided, an inner connecting surface connected with the middle die, and a probe installation section having a protruding portion protruding from the outer connecting surface and located in the installation recess, and a recessed portion recessed from the inner connecting surface and located correspondingly to the protruding portion. The protruding portion and the installation recess have a horizontal distance therebetween. Therefore, the outer die is horizontally fine adjustable to make the positions of the probes meet the requirement.