公开(公告)号：US20150204906A1

公开(公告)日：2015-07-23

申请号：US14558302

申请日：2014-12-02

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  HAO WEI ,  CHIA-NAN CHOU ,  CHIH-HAO HO

IPC: G01R1/04 ,  G01R31/04

CPC classification number: G01R31/041 ,  G01R1/0466

Abstract: A testing jig includes a substrate and a plurality of conductive elastic pieces, wherein the substrate has a recess and a plurality of circuits; the recess is located on a top surface of the substrate, while the circuits are provided on the top surface of the substrate. The conductive elastic pieces are provided on the substrate, and are respectively electrically connected to the circuits. Each of the conductive elastic pieces has a contact portion located within an orthographic projection range of the recess, wherein each of the contact portions contacts a pad of a DUT. Whereby, attenuation happens while transmitting test signals with high frequency can be effectively reduces by using the conductive elastic pieces to transmit test signals.

Abstract translation: 测试夹具包括基板和多个导电弹性件，其中所述基板具有凹部和多个电路; 凹部位于基板的顶表面上，而电路设置在基板的顶表面上。 导电弹性片设置在基板上，分别电连接到电路。 每个导电弹性片具有位于凹部的正投影范围内的接触部分，其中每个接触部分接触DUT的焊盘。 由此，通过使用导电弹性片传输测试信号，可以有效地降低传输高频测试信号的衰减。

公开(公告)号：US20240329083A1

公开(公告)日：2024-10-03

申请号：US18592773

申请日：2024-03-01

Applicant: MPI CORPORATION

Inventor： CHIA-NAN CHOU ,  Chung-Yen Huang ,  Wen-Chin Yang ,  Wen-Hung LO ,  Wei-Lwen Yeh ,  Chih-Hao Ho

IPC: G01R1/067 ,  G01R1/073

CPC classification number: G01R1/06772 ,  G01R1/0675 ,  G01R1/07314

Abstract: A position-adjustable probing device comprises a stationary probe comprising a first coaxial structure having a first needle core, a first dielectric layer, and a first exterior conductive layer, and a first and a second movable probes. The first movable probe arranged at a first side of the stationary probe comprises a ground needle core, and a first extending structure comprising a first planar structure electrically contacted with the stationary probe through a first movement, a first top surface and a first bottom surface. The second movable probe arranged at a second side of the stationary needle comprises a second coaxial structure comprising a second needle core, a second dielectric layer, and a second exterior conductive layer, and a second extending structure comprising a second planar structure electrically contacted with the stationary probe through a second movement, a second top surface, and a second bottom surface.

公开(公告)号：US20210102992A1

公开(公告)日：2021-04-08

申请号：US17034741

申请日：2020-09-28

Applicant: MPI CORPORATION

Inventor： YANG-HUNG CHENG ,  YA-HUNG LO ,  CHIEN-HSUN CHEN ,  CHIA-NAN CHOU ,  CHUNG-YEN HUANG ,  SHOU-JEN TSAI ,  FUH-CHYUN TANG

IPC: G01R31/28 ,  G01R1/073

Abstract: An adjustable probe device includes fixed and movable probes, at least one of which is a signal probe having a coaxial structure. The movable probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. Another adjustable probe device includes a first movable probe for being grounded, and fixed and second movable probes both having a coaxial structure. Any of the two movable probes is selectable to be a functioning probe in a way that the contact ends of the functioning and fixed probes are located on a same plane for contacting two pads of a DUT at the same time, and the functioning probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. As a result, the probe interval is adjustable, lowering the cost of the impedance testing apparatus for circuit boards.

公开(公告)号：US20150204905A1

公开(公告)日：2015-07-23

申请号：US14557879

申请日：2014-12-02

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  HAO WEI ,  CHIA-NAN CHOU ,  CHIH-HAO HO

IPC: G01R1/04 ,  G01R31/04

CPC classification number: G01R1/0466

Abstract: A testing jig includes a substrate, a carrier provided on the substrate, two conductive members made of a conductive material, and a compensation member made of a conductive material. The substrate has a signal circuit and a grounding circuit thereon. The carrier has a base board made of an insulating material and a conductive circuit made of a conductive material provided thereon. The base board has a signal perforation aligning with the signal circuit, a grounding perforation aligning with the grounding circuit, and multiple compensation holes. The conductive members both have an end exposed out of the carrier, and are respectively fitted in the signal perforation and the grounding perforation to make another end thereof contact the signal circuit or the grounding circuit. The compensation member is fitted in one of the compensation holes to be electrically connected to the conductive member in the grounding perforation through the conductive circuit.

Abstract translation: 测试夹具包括衬底，设置在衬底上的载体，由导电材料制成的两个导电构件和由导电材料制成的补偿构件。 衬底上具有信号电路和接地电路。 载体具有由绝缘材料制成的基板和设置在其上的由导电材料制成的导电电路。 基板具有与信号电路对准的信号穿孔，与接地电路对准的接地穿孔，以及多个补偿孔。 导电构件都具有暴露在载体外的端部，并且分别装配在信号穿孔和接地穿孔中，以使另一端与信号电路或接地电路接触。 补偿部件安装在一个补偿孔中，以通过导电电路与接地穿孔中的导电部件电连接。