公开(公告)号：US20230007997A1

公开(公告)日：2023-01-12

申请号：US17858424

申请日：2022-07-06

Applicant: MPI CORPORATION

Inventor： CHIN-TIEN YANG ,  YANG-HUNG CHENG ,  YU-HAO CHEN ,  CHIN-YI TSAI ,  HUI-PIN YANG ,  HORNG-CHUAN SUN

IPC: G01R1/073

Abstract: A vertical probe head includes upper and lower die units having upper and lower through holes, and probes each including a body portion between the die units, tail and head portion installation parts in the upper and lower through holes respectively, and a head portion contact part for electrically contacting a device under test. The probes include a pair of signal probes including at least one distinctive probe, for which, the body portion is smaller in width than the head portion installation part, and a body portion center line is deviated from a head portion installation part center line toward the probe paired thereto. For the paired probes, a head portion contact part pitch is larger than a body portion pitch for matching a large-pitch high-speed differential pair of the device under test, great impedance matching effect, and consistent contact force and stable elasticity of the probes in operation.

公开(公告)号：US20210102992A1

公开(公告)日：2021-04-08

申请号：US17034741

申请日：2020-09-28

Applicant: MPI CORPORATION

Inventor： YANG-HUNG CHENG ,  YA-HUNG LO ,  CHIEN-HSUN CHEN ,  CHIA-NAN CHOU ,  CHUNG-YEN HUANG ,  SHOU-JEN TSAI ,  FUH-CHYUN TANG

IPC: G01R31/28 ,  G01R1/073

Abstract: An adjustable probe device includes fixed and movable probes, at least one of which is a signal probe having a coaxial structure. The movable probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. Another adjustable probe device includes a first movable probe for being grounded, and fixed and second movable probes both having a coaxial structure. Any of the two movable probes is selectable to be a functioning probe in a way that the contact ends of the functioning and fixed probes are located on a same plane for contacting two pads of a DUT at the same time, and the functioning probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. As a result, the probe interval is adjustable, lowering the cost of the impedance testing apparatus for circuit boards.

公开(公告)号：US20150168453A1

公开(公告)日：2015-06-18

申请号：US14553590

申请日：2014-11-25

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  HAO WEI ,  YANG-HUNG CHENG ,  CHIH-HAO HO

IPC: G01R1/067 ,  G01R1/073 ,  G01R31/28 ,  G01R1/04

CPC classification number: G01R1/06772

Abstract: A probe module, which is provided between a tester and a DUT for transmitting electrical signals therebetween, includes a signal transmitting member, a plurality of probes, a positioning member, and a signal connector. The signal transmitting member has a circuit and two grounding. The probes are electrical connected to the circuit and the groundings of the signal transmitting member. The positioning member is made of an insulating material, and provided on the probes. The signal connector is adapted to be electrically connected to the tester, wherein the signal connector has a signal transmission portion and a grounding portion; the signal transmission portion is electrically connected to the circuit of the signal transmitting member, and the grounding portion is electrically connected to the at least one grounding of the signal transmitting member.

Abstract translation: 在测试器和DUT之间设置用于在其间传输电信号的探针模块包括信号传输部件，多个探针，定位部件和信号连接器。 信号传输部件具有电路和两个接地。 探头电连接到电路和信号传输构件的基础。 定位构件由绝缘材料制成，并设置在探针上。 信号连接器适于电连接到测试器，其中信号连接器具有信号传输部分和接地部分; 信号传输部分电连接到信号传输部件的电路，并且接地部分电连接到信号传输部件的至少一个接地。