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    Electrical testing machine
    1.
    发明授权
    Electrical testing machine 有权
    电气试验机

    公开(公告)号：US09459279B2

    公开(公告)日：2016-10-04

    申请号：US14557043

    申请日：2014-12-01

    Applicant: MPI CORPORATION

    Inventor： Wei-Cheng Ku ,  Shao-Wei Lu ,  Hung-Chih Sung ,  Chun-Nan Chen

    IPC: G01R31/00 ,  G01R1/04 ,  G01R31/28 ,  G01R1/073

    CPC classification number: G01R1/04 ,  G01R1/07392 ,  G01R31/2887

    Abstract: An electrical testing machine includes a base having two parallel first rails, a platform provided on the base, a probe holder provided on the base and having a plurality of placement locations, a support provided between the first rails and having a second rail thereon, a test arm provided on the second rail and above the platform, a receiving seat provided on the test arm, and a plurality of probe sets, wherein one of the probe sets is engaged on the receiving seat, while the others are respectively provided on the placement locations. The support is movable relative to the base and the platform. The test arm is movable along with the support, and is also movable relative to the support. The receiving seat is movable or rotatable relative to the test arm. The probe set engaged on the receiving seat is movable along with the receiving seat.

    Abstract translation: 电测试机包括具有两个平行的第一轨道的基座，设置在基座上的平台，设置在基座上并具有多个放置位置的探针保持架，设置在第一轨道之间并具有第二轨道的支撑件， 设置在第二导轨上并位于平台上的测试臂，设置在测试臂上的接收座和多个探针组，其中探针组中的一个接合在接收座上，而其它探针组分别设置在放置位置 位置。 支撑件相对于基座和平台是可移动的。 测试臂与支撑件一起可移动，并且也可相对于支撑件移动。 接收座椅相对于测试臂是可移动的或可旋转的。 接合在接收座上的探针组可与接收座一起移动。

    Method of calibrating and debugging testing system
    3.
    发明授权
    Method of calibrating and debugging testing system 有权
    测试系统的校准和调试方法

    公开(公告)号：US09581676B2

    公开(公告)日：2017-02-28

    申请号：US14553153

    申请日：2014-11-25

    Applicant: MPI CORPORATION

    Inventor： Wei-Cheng Ku ,  Shao-Wei Lu ,  Hao Wei ,  Yu-Tse Wang

    IPC: G01R31/00 ,  G01R35/00 ,  G01R31/28

    CPC classification number: G01R35/005 ,  G01R31/2808 ,  G01R31/2894

    Abstract: A method of calibrating and debugging a testing system is provided. First, values of different electrical path segments are calibrated, and parameters of the electrical path segments while being calibrated are saved. After calibration, electrical tests can be processed on a DUT. If the testing system malfunctions, the values of the electrical path segments are calibrated again to compare the current parameters to the previously saved parameters. The component which goes wrong can be found out quickly in this way.

    Abstract translation: 提供了一种校准和调试测试系统的方法。 首先，校准不同电路段的值，并保存校准时电路段的参数。 校准后，可以在DUT上对电气测试进行处理。 如果测试系统发生故障，则再次校准电气路径段的值，以将当前参数与先前保存的参数进行比较。 出现错误的组件可以通过这种方式迅速找到。

    Electrical testing device
    4.
    发明授权
    Electrical testing device 有权
    电气测试装置

    公开(公告)号：US09523708B2

    公开(公告)日：2016-12-20

    申请号：US14556612

    申请日：2014-12-01

    Applicant: MPI CORPORATION

    Inventor： Wei-Cheng Ku ,  Shao-Wei Lu ,  Ya-Hung Lo ,  Shou-Jen Tsai

    IPC: G01R31/00 ,  G01R1/04 ,  G01R31/28 ,  G01R1/073

    CPC classification number: G01R1/04 ,  G01R1/07392 ,  G01R31/2887

    Abstract: An electrical testing device includes a base having two parallel first rails, a platform provided on the base, a support provided between the first rails, a test arm, a rotary table provided on the test arm, a plurality of holders provided on the rotary table, and a plurality of probe sets respectively provided on the holders. The support has a second rail provided thereon, and is moveable relative to the base and the platform. The test arm is provided on the second rail and above the platform, wherein the test arm is moveable along with the support, and is also movable relative to the support. The rotary table is moveable or rotatable relative to the test arm. The holders are moveable along with the rotary table, and are also moveable or rotatable relative to the rotary table. The probe sets are moveable along with the holders.

    Abstract translation: 电测试装置包括具有两个平行的第一轨道的基座，设置在基座上的平台，设置在第一轨道之间的支撑件，测试臂，设置在测试臂上的旋转台，设置在旋转台上的多个保持架 ，以及分别设置在保持器上的多个探针组。 支撑件具有设置在其上的第二轨道，并且可相对于基座和平台移动。 测试臂设置在第二轨道上并在平台上方，其中测试臂可与支撑件一起移动，并且也可相对于支撑件移动。 旋转台相对于测试臂是可移动的或可旋转的。 支架可与旋转工作台一起移动，并且也可相对于旋转工作台移动或旋转。 探头组与支架一起可移动。

    Method of operating testing system
    6.
    发明授权
    Method of operating testing system 有权

    公开(公告)号：US09645197B2

    公开(公告)日：2017-05-09

    申请号：US14557181

    申请日：2014-12-01

    Applicant: MPI CORPORATION

    Inventor： Wei-Cheng Ku ,  Shao-Wei Lu ,  Hao Wei ,  Yu-Tse Wang

    IPC: G01R31/00 ,  G01R31/28 ,  G01R35/00

    CPC classification number: G01R31/2891 ,  G01R35/005

    Abstract: A method of operating a testing system is provided, wherein the testing system has a test machine and a probe module, which has a first probe set and a second probe set. One of the first probe set and the second probe set can be connected to the test machine. The method includes the following steps: connect the test machine and the first probe set; calibrate the testing system; abut the first probe set against a DUT to do electrical tests; disconnect the first probe set and the DUT; disconnect the test machine and the first probe set; connect the test machine and the second probe set; calibrate the testing system again; abut the second probe set against the DUT to do electrical tests.

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