公开(公告)号：US20150204962A1

公开(公告)日：2015-07-23

申请号：US14557181

申请日：2014-12-01

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHAO-WEI LU ,  HAO WEI ,  YU-TSE WANG

IPC: G01R35/00 ,  G01R31/04

CPC classification number: G01R31/2891 ,  G01R35/005

Abstract: A method of operating a testing system is provided, wherein the testing system has a test machine and a probe module, which has a first probe set and a second probe set. One of the first probe set and the second probe set can be connected to the test machine. The method includes the following steps: connect the test machine and the first probe set; calibrate the testing system; abut the first probe set against a DUT to do electrical tests; disconnect the first probe set and the DUT; disconnect the test machine and the first probe set; connect the test machine and the second probe set; calibrate the testing system again; abut the second probe set against the DUT to do electrical tests.

Abstract translation: 提供了一种操作测试系统的方法，其中所述测试系统具有测试机器和探针模块，所述测试机器和探针模块具有第一探针组和第二探针组。 第一个探针组和第二个探针组之一可以连接到测试机。 该方法包括以下步骤：连接测试机和第一个探头组; 校准测试系统; 将第一个探测器对准DUT进行电气测试; 断开第一个探针组和DUT; 断开测试机和第一个探头组; 连接测试机和第二个探头组; 再次校准测试系统; 将第二个探测器对准DUT，进行电气测试。

公开(公告)号：US20150233969A1

公开(公告)日：2015-08-20

申请号：US14552957

申请日：2014-11-25

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHAO-WEI LU ,  HAO WEI ,  YU-TSE WANG

IPC: G01R1/073 ,  G01R1/04 ,  G01R1/02

CPC classification number: G01R1/07314 ,  G01R1/025 ,  G01R1/04 ,  G01R1/07392 ,  G01R31/2812 ,  G01R35/005

Abstract: A testing system includes a test machine, a plurality of probe sets, a data input device, a controller, a memory, and a data output device. The test machine has a platform for a DUT to be placed thereon, and a test arm which is movable relative to the platform. The probe sets are provided on the test machine with at least one probe set provided on the test arm to contact the DUT. The data input device is used to input information about the DUT. The controller is electrically connected to the test arm, the probe set on the test arm, and the data input device to move the test arm to a predetermined position according to the inputted information, and to make the probe set contact the DUT for electrical test. The memory saves electrical test result, which is outputted by the data output device.

Abstract translation: 测试系统包括测试机，多个探针组，数据输入设备，控制器，存储器和数据输出设备。 测试机具有用于被放置在其上的DUT的平台以及可相对于平台移动的测试臂。 探头组在测试机器上提供，测试臂上提供至少一个探针组，以便与DUT接触。 数据输入设备用于输入有关DUT的信息。 控制器电气连接到测试臂，测试臂上设置的探头和数据输入设备，根据输入的信息将测试臂移动到预定位置，并使探头组接触DUT进行电气测试 。 存储器节省了由数据输出装置输出的电气测试结果。

公开(公告)号：US20150204929A1

公开(公告)日：2015-07-23

申请号：US14557311

申请日：2014-12-01

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHOA-WEI LU ,  YU-TSE WANG

IPC: G01R31/00 ,  H04B17/29

CPC classification number: G01R31/00 ,  G01R31/31718

Abstract: A testing system includes a test machine, a communication device, a server, and a user-end device. The test machine does electrical test on an electronic product, wherein the test machine generates a first signal when the test is completed, and generates a second signal when the measured yield is lower than a predetermined threshold. The communication device is electrically connected to the test machine to receive the first signal or the second signal. The communication device correspondingly converts the received signals into first information or second information, and then outputs the first and the second information to a first network. The server communicates with the first network to receive the first and the second information outputted by the communication device, and then outputs the received information to a second network. The user-end device communicates with the second network to receive the first and the second information outputted by the server.

Abstract translation: 测试系统包括测试机，通信设备，服务器和用户端设备。 测试机对电子产品进行电气测试，其中当测试完成时，测试机器产生第一信号，并且当测量的产量低于预定阈值时产生第二信号。 通信设备电连接到测试机器以接收第一信号或第二信号。 通信装置将接收的信号相应地转换为第一信息或第二信息，然后将第一和第二信息输出到第一网络。 服务器与第一网络进行通信以接收由通信设备输出的第一和第二信息，然后将接收到的信息输出到第二网络。 用户端设备与第二网络通信以接收由服务器输出的第一和第二信息。

公开(公告)号：US20170146634A1

公开(公告)日：2017-05-25

申请号：US15401987

申请日：2017-01-09

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHAO-WEI LU ,  HAO WEI ,  YU-TSE WANG

IPC: G01R35/00 ,  G01R1/073

CPC classification number: G01R35/005 ,  G01R1/073 ,  G01R31/2808 ,  G01R31/2894

Abstract: A method of calibrating and debugging a testing system is provided. First, values of different electrical path segments are calibrated, and parameters of the electrical path segments while being calibrated are saved. After calibration, electrical tests can be processed on a DUT. If the testing system malfunctions, the values of the electrical path segments are calibrated again to compare the current parameters to the previously saved parameters. The component which goes wrong can be found out quickly in this way.

公开(公告)号：US20150241544A1

公开(公告)日：2015-08-27

申请号：US14553153

申请日：2014-11-25

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHAO-WEI LU ,  HAO WEI ,  YU-TSE WANG

IPC: G01R35/00 ,  G01R1/073

CPC classification number: G01R35/005 ,  G01R31/2808 ,  G01R31/2894

Abstract: A method of calibrating and debugging a testing system is provided. First, values of different electrical path segments are calibrated, and parameters of the electrical path segments while being calibrated are saved. After calibration, electrical tests can be processed on a DUT. If the testing system malfunctions, the values of the electrical path segments are calibrated again to compare the current parameters to the previously saved parameters. The component which goes wrong can be found out quickly in this way.

Abstract translation: 提供了一种校准和调试测试系统的方法。 首先，校准不同电路段的值，并保存校准时电路段的参数。 校准后，可以在DUT上对电气测试进行处理。 如果测试系统发生故障，则再次校准电气路径段的值，以将当前参数与先前保存的参数进行比较。 出现错误的组件可以通过这种方式迅速找到。

公开(公告)号：US20150212186A1

公开(公告)日：2015-07-30

申请号：US14558450

申请日：2014-12-02

Applicant: MPI CORPORATION

Inventor： WEI-CHENG KU ,  SHAO-WEI LU ,  SHOU-JEN TSAI ,  YU-TSE WANG

IPC: G01R35/00 ,  G01R31/02

CPC classification number: G01R35/005 ,  G01R31/025 ,  G01R31/043 ,  G01R31/2808 ,  G01R31/2851

Abstract: A method of calibrating and operating a testing system is provided, wherein the testing system has a test machine, a conducting wire set, a calibration module, and a probe module. The method includes the following steps: electrically connect the test machine and the conducting wire set; electrically connect the conducting wire set and the calibration module; send out electrical signals from the test machine to the calibration module for doing at least one test among a short-circuit test, an open-circuit test, and an impedance test, and then calibrate the testing system by correspondingly performing compensation based on results of these tests; electrically disconnect the conducting wire set and the calibration module, and electrically connect the conducting wire set and the probe module; abut the probe module against a DUT; send out electrical signals from the test machine to the probe module to do electrical tests on the DUT.

Abstract translation: 提供了一种校准和操作测试系统的方法，其中测试系统具有测试机，导线组，校准模块和探针模块。 该方法包括以下步骤：将测试机与导线组电连接; 电连接导线组和校准模块; 在短路测试，开路测试和阻抗测试中，将测试机器的电信号发送到校准模块进行至少一次测试，然后通过相应地根据测试结果进行补偿来校准测试系统 这些测试; 电气断开导线组和校准模块，并电连接导线组和探针模块; 将探针模块抵靠DUT; 从测试机发送电信号到探头模块，对DUT进行电气测试。