Measurement of the dynamic characteristics of interferometric modulators
    1.
    发明申请
    Measurement of the dynamic characteristics of interferometric modulators 失效
    干涉式调制器的动态特性测量

    公开(公告)号:US20060077401A1

    公开(公告)日:2006-04-13

    申请号:US11223824

    申请日:2005-09-09

    IPC分类号: G01B11/14

    摘要: Various systems and methods of lighting a display are disclosed. In one embodiment, for example, a method includes applying a voltage waveform to the interferometric modulators, applying a voltage pulse to the interferometric modulators, detecting reflectivity of light from the interferometric modulators, and determining one or more quality parameters of the interferometric modulators based on the detecting reflectivity of light, where the applied voltage pulse causes the interferometric modulators to vary between an actuated and a non-actuated state, or an non-actuated state and an actuated state.

    摘要翻译: 公开了照明显示器的各种系统和方法。 在一个实施例中,例如,一种方法包括将电压波形施加到干涉式调制器,向干涉式调制器施加电压脉冲,检测来自干涉式调制器的光的反射率,以及基于以下步骤确定干涉式调制器的一个或多个质量参数: 光的检测反射率,其中所施加的电压脉冲导致干涉式调制器在致动和非致动状态之间变化,或者非致动状态和致动状态。

    Measurement of the dynamic characteristics of interferometric modulators
    2.
    发明授权
    Measurement of the dynamic characteristics of interferometric modulators 失效
    干涉式调制器的动态特性测量

    公开(公告)号:US07453579B2

    公开(公告)日:2008-11-18

    申请号:US11223824

    申请日:2005-09-09

    IPC分类号: G01B9/02

    摘要: Various systems and methods of lighting a display are disclosed. In one embodiment, for example, a method includes applying a voltage waveform to the interferometric modulators, applying a voltage pulse to the interferometric modulators, detecting reflectivity of light from the interferometric modulators, and determining one or more quality parameters of the interferometric modulators based on the detecting reflectivity of light, where the applied voltage pulse causes the interferometric modulators to vary between an actuated and a non-actuated state, or an non-actuated state and an actuated state.

    摘要翻译: 公开了照明显示器的各种系统和方法。 在一个实施例中,例如,一种方法包括将电压波形施加到干涉式调制器,向干涉式调制器施加电压脉冲,检测来自干涉式调制器的光的反射率,以及基于以下步骤确定干涉式调制器的一个或多个质量参数: 光的检测反射率,其中所施加的电压脉冲导致干涉式调制器在致动和非致动状态之间变化,或者非致动状态和致动状态。