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公开(公告)号：US07027141B2
公开(公告)日：2006-04-11
申请号：US10138728
申请日：2002-05-03
IPC分类号： G01N21/00
CPC分类号： G11B5/5521 , G11B5/4833
摘要： An apparatus and method for determining and adjusting the static attitude of a head suspension or a head suspension assembly for use in a dynamic storage device. An apparatus in accordance with the present invention includes a workpiece support and an adjust device, operatively positioned with respect to the workpiece support, for adjusting the head suspension. The adjust device includes first and second clamp portions for restraining a gimbal arm and an adjust body for deforming the restrained gimbal arm while the gimbal arm is restrained by the first and second clamp portions. A method in accordance with the present invention includes determining the planar orientation of a surface indicative of the static attitude of the slider mounting tongue or a slider mounted thereto and controllably deforming an individual gimbal arm of the flexure independently from another gimbal arm of the flexure to introduce a permanent deformation of the gimbal arm thereby adjusting the static attitude of the slider mounting tongue or slider if present.
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2.发明申请Apparatus and method for measuring suspension and head assemblies in a stack 有权用于测量堆叠中的悬架和头部组件的装置和方法公开(公告)号：US20080212107A1
公开(公告)日：2008-09-04
申请号：US11713550
申请日：2007-03-02
IPC分类号： G01B11/14
CPC分类号： G01B11/14 , G11B5/455 , G11B5/4826 , G11B5/56
摘要： An optical measurement device for determining at least two parameters of a measurement location of a surface of at least one workpiece positioned in a known coordinate system is described. The device comprises a first light source providing a first measurement beam. The first measurement beam is directed at a first surface of a workpiece. The device also comprises a second light source providing a second measurement beam. The second measurement beam is directed at a second surface of a workpiece facing opposite the first surface. Further, the device comprises a first system of receiving optics. The first system of receiving optics detects the incoming position of the first measurement beam. The first system of receiving optics is positioned on an opposite side of a workpiece from the first light source. Further still, the device comprises a second imaging system. The second system of receiving optics detects the incoming position of the second measurement beam. The second system of receiving optics is positioned on an opposite side of a workpiece from the second light source.
摘要翻译： 描述了用于确定位于已知坐标系中的至少一个工件的表面的测量位置的至少两个参数的光学测量装置。 该装置包括提供第一测量光束的第一光源。 第一测量光束指向工件的第一表面。 该装置还包括提供第二测量光束的第二光源。 第二测量光束指向与第一表面相对的工件的第二表面。 此外，该装置包括接收光学器件的第一系统。 第一接收光学系统检测第一测量光束的进入位置。 接收光学器件的第一系统位于与第一光源相对的工件的相反侧。 此外，该装置还包括第二成像系统。 第二接收光学系统检测第二测量光束的进入位置。 接收光学器件的第二系统位于与第二光源相对的工件的相对侧上。
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3.发明授权Apparatus and method for measuring suspension and head assemblies in a stack 有权用于测量堆叠中的悬架和头部组件的装置和方法公开(公告)号：US07764387B2
公开(公告)日：2010-07-27
申请号：US11713550
申请日：2007-03-02
CPC分类号： G01B11/14 , G11B5/455 , G11B5/4826 , G11B5/56
摘要： An optical measurement device for determining at least two parameters of a measurement location of a surface of at least one workpiece positioned in a known coordinate system is described. The device comprises a first light source providing a first measurement beam. The first measurement beam is directed at a first surface of a workpiece. The device also comprises a second light source providing a second measurement beam. The second measurement beam is directed at a second surface of a workpiece facing opposite the first surface. Further, the device comprises a first system of receiving optics. The first system of receiving optics detects the incoming position of the first measurement beam. The first system of receiving optics is positioned on an opposite side of a workpiece from the first light source. Further still, the device comprises a second imaging system. The second system of receiving optics detects the incoming position of the second measurement beam. The second system of receiving optics is positioned on an opposite side of a workpiece from the second light source.
摘要翻译： 描述了用于确定位于已知坐标系中的至少一个工件的表面的测量位置的至少两个参数的光学测量装置。 该装置包括提供第一测量光束的第一光源。 第一测量光束指向工件的第一表面。 该装置还包括提供第二测量光束的第二光源。 第二测量光束指向与第一表面相对的工件的第二表面。 此外，该装置包括接收光学器件的第一系统。 第一接收光学系统检测第一测量光束的进入位置。 接收光学器件的第一系统位于与第一光源相对的工件的相反侧。 此外，该装置还包括第二成像系统。 第二接收光学系统检测第二测量光束的进入位置。 接收光学器件的第二系统位于与第二光源相对的工件的相对侧上。
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公开(公告)号：US5949350A
公开(公告)日：1999-09-07
申请号：US897344
申请日：1997-07-21
CPC分类号： A01K15/023
摘要： A system for training an animal to remain in a specified area of containment. The perimeter of containment being easily tailored to fit a specific geometry. The system includes apparatus for determining the location of the animal, apparatus for specifying boundary coordinates, apparatus for determining if the location of the animal is within the containment perimeter, and apparatus for administering stimulus to the animal if warranted.
摘要翻译： 一种用于训练动物留在指定的遏制区域的系统。 安全壳的周边易于定制以适应特定的几何形状。 该系统包括用于确定动物的位置的装置，用于指定边界坐标的装置，用于确定动物的位置是否在容纳周边内的装置，以及用于如果需要对动物施用刺激的装置。
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5.发明授权Apparatuses and methods for measuring head suspensions and head suspension assemblies 失效用于测量头悬挂和头悬挂组件的装置和方法公开(公告)号：US07433023B2
公开(公告)日：2008-10-07
申请号：US11230981
申请日：2005-09-20
申请人： David R. Swift , Mark T. Girard , Joseph P. Tracy
发明人： David R. Swift , Mark T. Girard , Joseph P. Tracy
IPC分类号： G01C3/08
CPC分类号： G01C3/08 , G01B11/306
摘要： The present invention provides apparatuses and methods for determining spatial information of a workpiece surface positioned in a predetermined coordinate system. Apparatuses and methods of the present invention can be used to determine one or more coordinates of one or more measurement locations of a workpiece within a predetermined coordinate system. Such coordinates can be used to define points, lines, and/or surfaces of the workpiece within the coordinate system. In one exemplary application, apparatuses and methods of the present invention can be used to determine spatial information of surfaces of head suspensions or head suspension assemblies such as those that are generally utilized in dynamic storage devices such as magnetic disk drives. Such spatial information can be used to determine z-height and/or static attitude, for example.
摘要翻译： 本发明提供了一种用于确定位于预定坐标系中的工件表面的空间信息的装置和方法。 本发明的装置和方法可用于确定在预定坐标系内的工件的一个或多个测量位置的一个或多个坐标。 这样的坐标可用于在坐标系内定义工件的点，线和/或表面。 在一个示例性应用中，本发明的装置和方法可用于确定头部悬架或头部悬挂组件的表面的空间信息，例如通常用于诸如磁盘驱动器的动态存储装置中的那些。 例如，这样的空间信息可用于确定z高度和/或静态。
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