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1.发明授权公开(公告)号：US07731927B2
公开(公告)日：2010-06-08
申请号：US11520677
申请日：2006-09-14
IPC分类号： B82B3/00 , C01B21/068
CPC分类号： C04B35/571 , B82Y30/00 , C01B21/068 , C01B32/956 , C01P2004/03 , C01P2004/16 , C04B35/62281 , C04B35/6269 , C04B2235/526 , C04B2235/5264 , C04B2235/5454 , Y10S427/102 , Y10S977/892
摘要： A method by which ceramic nanowires with diameters ranging from several to several tens of nanometers can be synthesized with improvements in the shape retention of the nanowires and the yield of conversion to ceramic, which method comprises the steps of forming a thin film of a silicon-containing polymer usable as a ceramic precursor, irradiating the thin film with ion beams to form cylindrical crosslinked portions, extracting the un-crosslinked portions with a solvent to produce nanowires of the silicon-containing polymer, irradiating the nanowires with an ionizing radiation so that they are crosslinked again, and firing the re-crosslinked nanowires.
摘要翻译： 可以通过改进纳米线的形状保持性和转化成陶瓷的产率来合成直径范围从几到几十纳米的陶瓷纳米线的方法，该方法包括以下步骤：形成硅 - 可用作陶瓷前体的聚合物，用离子束照射薄膜以形成圆柱形交联部分，用溶剂萃取未交联部分以产生含硅聚合物的纳米线，用电离辐射照射纳米线，使得它们 再次交联，烧结再交联的纳米线。
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2.发明申请公开(公告)号：US20100111805A1
公开(公告)日：2010-05-06
申请号：US11520677
申请日：2006-09-14
IPC分类号： C01B31/36 , C01B21/068
CPC分类号： C04B35/571 , B82Y30/00 , C01B21/068 , C01B32/956 , C01P2004/03 , C01P2004/16 , C04B35/62281 , C04B35/6269 , C04B2235/526 , C04B2235/5264 , C04B2235/5454 , Y10S427/102 , Y10S977/892
摘要： A method by which ceramic nanowires with diameters ranging from several to several tens of nanometers can be synthesized with improvements in the shape retention of the nanowires and the yield of conversion to ceramic, which method comprises the steps of forming a thin film of a silicon-containing polymer usable as a ceramic precursor, irradiating the thin film with ion beams to form cylindrical crosslinked portions, extracting the un-crosslinked portions with a solvent to produce nanowires of the silicon-containing polymer, irradiating the nanowires with an ionizing radiation so that they are crosslinked again, and firing the re-crosslinked nanowires.
摘要翻译： 可以通过改进纳米线的形状保持性和转化成陶瓷的产率来合成直径范围从几到几十纳米的陶瓷纳米线的方法，该方法包括以下步骤：形成硅 - 可用作陶瓷前体的聚合物，用离子束照射薄膜以形成圆柱形交联部分，用溶剂萃取未交联部分以产生含硅聚合物的纳米线，用电离辐射照射纳米线，使得它们 再次交联，烧结再交联的纳米线。
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3.发明申请公开(公告)号：US20140210452A1
公开(公告)日：2014-07-31
申请号：US14238529
申请日：2012-03-08
申请人： Akinori Saeki , Shuhei Seki
发明人： Akinori Saeki , Shuhei Seki
IPC分类号： G01N27/00
CPC分类号： G01N27/00 , G01N22/00 , G01R31/26 , H01L31/0256 , H01L51/0031 , H01L51/0064 , H01L51/0092 , H01L51/42 , H02S50/00 , H02S50/10 , Y02E10/542 , Y02E10/549
摘要： An evaluation system 1 according to the present invention includes: a light source 2 for exposing a pulsed white light or a pulsed laser light onto a sample; a microwave exposing and detecting unit 8 for exposing a microwave onto an organic material 12 and for detecting the intensity of the microwave which has passed through the organic material 12; a microwave passing unit 7 for making the microwave pass through the organic material 12 a plurality of times; and an evaluating unit 10 for evaluating the photoelectric conversion characteristics of the sample based on the intensity of the microwave which has passed through the organic material 12 when the pulsed white light or the pulsed laser light is exposed and the intensity of the microwave which has passed through the organic material 12 when the pulsed white light or the pulsed laser light is not exposed.
摘要翻译： 根据本发明的评估系统1包括：用于将脉冲白光或脉冲激光曝光到样品上的光源2; 微波曝光和检测单元8，用于将微波暴露于有机材料12上并用于检测已经通过有机材料12的微波的强度; 用于使微波多次通过有机材料12的微波通过单元7; 以及评估单元10，用于基于当脉冲白光或脉冲激光曝光时通过有机材料12的微波的强度和已经通过的微波的强度来评估样品的光电转换特性 当脉冲白光或脉冲激光不暴露时，通过有机材料12。
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4.发明授权公开(公告)号：US08823408B2
公开(公告)日：2014-09-02
申请号：US14238529
申请日：2012-03-08
申请人： Akinori Saeki , Shuhei Seki
发明人： Akinori Saeki , Shuhei Seki
IPC分类号： G01R31/26 , H01L31/00 , G01N27/00 , H01L51/00 , H01L31/0256
CPC分类号： G01N27/00 , G01N22/00 , G01R31/26 , H01L31/0256 , H01L51/0031 , H01L51/0064 , H01L51/0092 , H01L51/42 , H02S50/00 , H02S50/10 , Y02E10/542 , Y02E10/549
摘要： An evaluation system 1 according to the present invention includes: a light source 2 for exposing a pulsed white light or a pulsed laser light onto a sample; a microwave exposing and detecting unit 8 for exposing a microwave onto an organic material 12 and for detecting the intensity of the microwave which has passed through the organic material 12; a microwave passing unit 7 for making the microwave pass through the organic material 12 a plurality of times; and an evaluating unit 10 for evaluating the photoelectric conversion characteristics of the sample based on the intensity of the microwave which has passed through the organic material 12 when the pulsed white light or the pulsed laser light is exposed and the intensity of the microwave which has passed through the organic material 12 when the pulsed white light or the pulsed laser light is not exposed.
摘要翻译： 根据本发明的评估系统1包括：用于将脉冲白光或脉冲激光曝光到样品上的光源2; 微波曝光和检测单元8，用于将微波暴露于有机材料12上并用于检测已经通过有机材料12的微波的强度; 用于使微波多次通过有机材料12的微波通过单元7; 以及评估单元10，用于基于当脉冲白光或脉冲激光曝光时通过有机材料12的微波的强度和已经通过的微波的强度来评估样品的光电转换特性 当脉冲白光或脉冲激光不暴露时，通过有机材料12。
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