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公开(公告)号:US20200147888A1
公开(公告)日:2020-05-14
申请号:US16526068
申请日:2019-07-30
Applicant: Massachusetts Institute of Technology
Inventor: Javier E. Ramos , Pitchaya Sitthi-Amorn , Wojciech Matusik , Yuwang Wang
IPC: B29C64/386 , B29C64/106 , B29C64/393 , B33Y50/02 , B33Y30/00 , B33Y10/00
Abstract: The present application relates generally to systems and methods for using machine vision to provide information on one or more aspects of an additive fabrication device, such as calibration parameters and/or an object formed by the device or in the process of being formed by the device. According to some aspects, a method is provided for calibrating an additive fabrication device. According to some aspects, a method is provided for assessing at least a portion of an object formed using an additive fabrication device. According to some aspects, a method is provided for fabricating a second object in contact with a first object using an additive fabrication device. According to some aspects, an additive fabrication device configured to perform one or more of the above methods may be provided.
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公开(公告)号:US10252466B2
公开(公告)日:2019-04-09
申请号:US14645616
申请日:2015-03-12
Applicant: Massachusetts Institute of Technology
Inventor: Javier E. Ramos , Pitchaya Sitthi-Amorn , Wojciech Matusik , Yuwang Wang
IPC: B33Y10/00 , B33Y50/02 , B29C64/386 , B29C64/393 , B33Y30/00 , B29C64/106 , B29C64/112
Abstract: The present application relates generally to systems and methods for using machine vision to provide information on one or more aspects of an additive fabrication device, such as calibration parameters and/or an object formed by the device or in the process of being formed by the device. According to some aspects, a method is provided for calibrating an additive fabrication device. According to some aspects, a method is provided for assessing at least a portion of an object formed using an additive fabrication device. According to some aspects, a method is provided for fabricating a second object in contact with a first object using an additive fabrication device. According to some aspects, an additive fabrication device configured to perform one or more of the above methods may be provided.
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公开(公告)号:US11155040B2
公开(公告)日:2021-10-26
申请号:US16663786
申请日:2019-10-25
Applicant: Massachusetts Institute of Technology
Inventor: Wojciech Matusik , Allen S. Park , Javier E. Ramos , Kiril Vidimce
IPC: G05B19/4099 , B33Y50/02 , B29C64/393 , B29C64/112 , B29C64/124 , B33Y30/00 , B33Y10/00
Abstract: A closed-loop adaptive material deposition apparatus and method uses a scanning system to monitor an additively manufactured object as it is being fabricated and adapting the geometric shape and material composition of the subsequent layers based on the scan data. The scanning system repeatedly captures geometric and/or material information of a partially manufactured object with optional auxiliary objects inserted during the manufacturing process. Based on this information, the actual surface geometry and/or actual material composition is computed. Surface geometry may be offset and used as a slicing surface for the next portion of the digital model. The shape of the slicing surface may then be recomputed each time the system scans the partially fabricated object.
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公开(公告)号:US11141921B2
公开(公告)日:2021-10-12
申请号:US16868876
申请日:2020-05-07
Applicant: Massachusetts Institute of Technology
Inventor: Javier E. Ramos , Pitchaya Sitthi-Amorn , Wojciech Matusik , Yuwang Wang
IPC: B29C64/386 , B33Y50/02 , B33Y10/00 , B33Y30/00 , B29C64/106 , B29C64/393 , B29C64/112
Abstract: The present application relates generally to systems and methods for using machine vision to provide information on one or more aspects of an additive fabrication device, such as calibration parameters and/or an object formed by the device or in the process of being formed by the device. According to some aspects, a method is provided for calibrating an additive fabrication device. According to some aspects, a method is provided for assessing at least a portion of an object formed using an additive fabrication device. According to some aspects, a method is provided for fabricating a second object in contact with a first object using an additive fabrication device. According to some aspects, an additive fabrication device configured to perform one or more of the above methods may be provided.
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公开(公告)号:US20180169953A1
公开(公告)日:2018-06-21
申请号:US15843543
申请日:2017-12-15
Applicant: Massachusetts Institute of Technology
Inventor: Wojciech Matusik , Allen S. Park , Javier E. Ramos , Kiril Vidimce
IPC: B29C64/393 , B29C64/112 , B29C64/124 , G05B19/4099
Abstract: A closed-loop adaptive material deposition apparatus and method uses a scanning system to monitor an additively manufactured object as it is being fabricated and adapting the geometric shape and material composition of the subsequent layers based on the scan data. The scanning system repeatedly captures geometric and/or material information of a partially manufactured object with optional auxiliary objects inserted during the manufacturing process. Based on this information, the actual surface geometry and/or actual material composition is computed. Surface geometry may be offset and used as a slicing surface for the next portion of the digital model. The shape of the slicing surface may then be recomputed each time the system scans the partially fabricated object.
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公开(公告)号:US11207836B2
公开(公告)日:2021-12-28
申请号:US16526068
申请日:2019-07-30
Applicant: Massachusetts Institute of Technology
Inventor: Javier E. Ramos , Pitchaya Sitthi-Amorn , Wojciech Matusik , Yuwang Wang
IPC: B29C64/386 , B33Y10/00 , B29C64/393 , B33Y30/00 , B33Y50/02 , B29C64/106 , B29C64/112
Abstract: The present application relates generally to systems and methods for using machine vision to provide information on one or more aspects of an additive fabrication device, such as calibration parameters and/or an object formed by the device or in the process of being formed by the device. According to some aspects, a method is provided for calibrating an additive fabrication device. According to some aspects, a method is provided for assessing at least a portion of an object formed using an additive fabrication device. According to some aspects, a method is provided for fabricating a second object in contact with a first object using an additive fabrication device. According to some aspects, an additive fabrication device configured to perform one or more of the above methods may be provided.
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公开(公告)号:US20210146626A1
公开(公告)日:2021-05-20
申请号:US16663786
申请日:2019-10-25
Applicant: Massachusetts Institute of Technology
Inventor: Wojciech Matusik , Allen S. Park , Javier E. Ramos , Kiril Vidimce
IPC: B29C64/393 , B29C64/112 , B29C64/124 , G05B19/4099 , B33Y50/02
Abstract: A closed-loop adaptive material deposition apparatus and method uses a scanning system to monitor an additively manufactured object as it is being fabricated and adapting the geometric shape and material composition of the subsequent layers based on the scan data. The scanning system repeatedly captures geometric and/or material information of a partially manufactured object with optional auxiliary objects inserted during the manufacturing process. Based on this information, the actual surface geometry and/or actual material composition is computed. Surface geometry may be offset and used as a slicing surface for the next portion of the digital model. The shape of the slicing surface may then be recomputed each time the system scans the partially fabricated object.
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公开(公告)号:US20200290283A1
公开(公告)日:2020-09-17
申请号:US16868876
申请日:2020-05-07
Applicant: Massachusetts Institute of Technology
Inventor: Javier E. Ramos , Pitchaya Stithi-Amorn , Wojciech Matusik , Yuwang Wang
IPC: B29C64/386 , B33Y10/00 , B33Y30/00 , B33Y50/02 , B29C64/393 , B29C64/106
Abstract: The present application relates generally to systems and methods for using machine vision to provide information on one or more aspects of an additive fabrication device, such as calibration parameters and/or an object formed by the device or in the process of being formed by the device. According to some aspects, a method is provided for calibrating an additive fabrication device. According to some aspects, a method is provided for assessing at least a portion of an object formed using an additive fabrication device. According to some aspects, a method is provided for fabricating a second object in contact with a first object using an additive fabrication device. According to some aspects, an additive fabrication device configured to perform one or more of the above methods may be provided.
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公开(公告)号:US10456984B2
公开(公告)日:2019-10-29
申请号:US15843543
申请日:2017-12-15
Applicant: Massachusetts Institute of Technology
Inventor: Wojciech Matusik , Allen S. Park , Javier E. Ramos , Kiril Vidimce
IPC: B33Y50/02 , B29C64/393 , B29C64/112 , B29C64/124 , G05B19/4099 , B33Y30/00 , B33Y10/00
Abstract: A closed-loop adaptive material deposition apparatus and method uses a scanning system to monitor an additively manufactured object as it is being fabricated and adapting the geometric shape and material composition of the subsequent layers based on the scan data. The scanning system repeatedly captures geometric and/or material information of a partially manufactured object with optional auxiliary objects inserted during the manufacturing process. Based on this information, the actual surface geometry and/or actual material composition is computed. Surface geometry may be offset and used as a slicing surface for the next portion of the digital model. The shape of the slicing surface may then be recomputed each time the system scans the partially fabricated object.
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公开(公告)号:US20180194066A1
公开(公告)日:2018-07-12
申请号:US15582320
申请日:2017-04-28
Applicant: Massachusetts Institute of Technology
Inventor: Javier E. Ramos , Pitchaya Sitthi-Amorn , Wojciech Matusik , Yuwang Wang
IPC: B29C64/386 , B29C64/106 , B29C64/393 , B33Y10/00 , B33Y30/00 , B33Y50/02
CPC classification number: B29C64/386 , B29C64/106 , B29C64/112 , B29C64/393 , B33Y10/00 , B33Y30/00 , B33Y50/02
Abstract: The present application relates generally to systems and methods for using machine vision to provide information on one or more aspects of an additive fabrication device, such as calibration parameters and/or an object formed by the device or in the process of being formed by the device. According to some aspects, a method is provided for calibrating an additive fabrication device. According to some aspects, a method is provided for assessing at least a portion of an object formed using an additive fabrication device. According to some aspects, a method is provided for fabricating a second object in contact with a first object using an additive fabrication device. According to some aspects, an additive fabrication device configured to perform one or more of the above methods may be provided.
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