公开(公告)号：US20130340533A1

公开(公告)日：2013-12-26

申请号：US13680188

申请日：2012-11-19

Applicant: Massachusetts Institute of Technology

Inventor： Mario Hofmann ,  Jing Kong

IPC: G01L1/22

CPC classification number: G01L1/22 ,  G01B1/00 ,  G01B7/18

Abstract: Strain gauge. The gauge includes a substrate and a thin film of overlapping, two-dimensional flakes deposited on the substrate. Structure responsive to conductance across the film is provided whereby a strain induced change in overlap area between neighboring flakes results in a change in conductance across the film. In a preferred embodiment, the two-dimensional flakes are graphene.

Abstract translation: 应变计 该计量器包括沉积在基底上的基底和重叠的二维薄片的薄膜。 提供响应穿过膜的电导的结构，由此在相邻薄片之间的重叠面积的应变引起的变化导致跨越薄膜的电导的变化。 在优选实施例中，二维薄片是石墨烯。