摘要:
A radiometric imaging device and a corresponding method for scanning a scene. The device comprises a radiometer configured to detect radiation in a predetermined spectral range emitted from said scene and to generate a radiation signal from said detected radiation, and a processor configured to process said generated radiation signal by de-convoluting said generated radiation signal by use of a distance-dependent de-blur kernel, which is determined depending on the distance between said scene and the radiometer.
摘要:
An optically controlled microwave antenna that reduces optical power consumed by the antenna. The optically controlled microwave antenna includes an antenna array including plural antenna elements and a feed for illuminating the antenna array with and/or receiving microwave radiation of the operating frequency from the antenna array to transmit and/or receive microwave radiation. An antenna element includes a waveguide, an optically controllable semiconductor element arranged within the waveguide in front of a light transmissive portion of a second end portion, the semiconductor element changing its material properties under control of incident light, and a controllable light source arranged at or close to the light transmissive portion of the second end portion for projecting a controlled light beam onto the semiconductor element for controlling its material properties, in particular its reflectivity.
摘要:
The present invention relates to a rotary joint for joining two waveguides for guiding electromagnetic waves, comprising a first portion adapted to receive a first waveguide, a second portion adapted to receive a second waveguide, and a third portion adapted for polarization rotation and arranged between the first portion and the second portion. The rotary joint is configured such that two portions selected from the group comprising the first portion, the second portion and the third portion are rotatable between at least two different angular positions around a central axis. Further, the rotary joint being configured to switch between a jointed state, in which the portions contact each other for electrical connection, and a non-jointed state. The present invention also relates to a method of operating such a rotary joint and a computer program and a computer readable non-transitory medium for implementing such a method.
摘要:
The present invention relates to an antenna measurement system and a corresponding method for measuring parameters of the transfer function of an antenna transmission system comprising a transmit antenna, a receive antenna and a transmission channel between said transmit antenna and said receive antenna, and/or for measuring parameters of an antenna of said antenna transmission system. In order to enable such a measurement for a single discrete frequency at high frequencies as used in mm-wave applications, an antenna measurement system is proposed comprising mixers, for frequency conversion on the transmitter side and detection on the receiver side, which are both driven by an electromagnetic radiation signal. Applying a switched DC signal for biasing the mixer on the transmitter side with an ultra-fast rise-time, the envelope of the time domain signal can directly be measured in the time domain on the receiver side.
摘要:
An optically controlled microwave antenna that reduces optical power consumed by the antenna. The optically controlled microwave antenna includes an antenna array including plural antenna elements and a feed for illuminating the antenna array with and/or receiving microwave radiation of the operating frequency from the antenna array to transmit and/or receive microwave radiation. An antenna element includes a waveguide, an optically controllable semiconductor element arranged within the waveguide in front of a light transmissive portion of a second end portion, the semiconductor element changing its material properties under control of incident light, and a controllable light source arranged at or close to the light transmissive portion of the second end portion for projecting a controlled light beam onto the semiconductor element for controlling its material properties, in particular its reflectivity.