公开(公告)号：US20180144812A1

公开(公告)日：2018-05-24

申请号：US15795548

申请日：2017-10-27

申请人： MediaTek Singapore Pte. Ltd.

发明人： Chun-Xue YU

IPC分类号： G11C29/38 ,  G01R31/319

CPC分类号： G11C29/38 ,  G01R31/31912 ,  G11C29/022 ,  G11C29/10 ,  G11C29/1201 ,  G11C29/12015 ,  G11C29/36 ,  G11C29/56004 ,  G11C29/56012 ,  G11C2029/3602 ,  G11C2029/5602

摘要： A wire order testing method for testing pin connection relationships between a memory device and an electronic device is provided. The method includes the steps of: testing the memory device with at least one test pattern to obtain at least one first data; predicting at least one second data that is to be obtained from the testing of the memory device with the test pattern according to the mapping relationships between the test pattern and the pins of the memory device; determining the pin connection relationships between the memory device and the electronic device according to the first data and second data.