公开(公告)号：US08131102B2

公开(公告)日：2012-03-06

申请号：US11808282

申请日：2007-06-08

申请人： Michael Albiez ,  Armin Hayn ,  Owain Evans

发明人： Michael Albiez ,  Armin Hayn ,  Owain Evans

IPC分类号： G06K9/40

CPC分类号： G06T5/002 ,  G06T5/003 ,  G06T5/20 ,  G06T2207/20012 ,  G06T2207/20032

摘要： A method for processing a digital gray value image includes the steps of: generating a binary edge image from the gray value image so that edges present in the gray value image are determined as line areas around the edges; applying a sharpness algorithm in the gray value image within regions which correspond to the line areas; and, carrying out a smoothing process in the gray value image within regions which lie outside of the line areas so that an additional smoothed, sharpened gray value image is generated.

摘要翻译： 一种处理数字灰度值图像的方法包括以下步骤：从灰度图像生成二进制边缘图像，使得存在于灰度图像中的边缘被确定为边缘周围的线区域; 在与行区域对应的区域内的灰度图像中应用锐度算法; 并且在位于行区域之外的区域内的灰度值图像中进行平滑处理，从而生成附加的平滑化，锐化的灰度值图像。

公开(公告)号：US20080013853A1

公开(公告)日：2008-01-17

申请号：US11808282

申请日：2007-06-08

申请人： Michael Albiez ,  Armin Hayn ,  Owain Evans

发明人： Michael Albiez ,  Armin Hayn ,  Owain Evans

IPC分类号： G06K9/40

CPC分类号： G06T5/002 ,  G06T5/003 ,  G06T5/20 ,  G06T2207/20012 ,  G06T2207/20032

摘要： A method for processing a digital gray value image includes the steps of: generating a binary edge image from the gray value image so that edges present in the gray value image are determined as line areas around the edges; applying a sharpness algorithm in the gray value image within regions which correspond to the line areas; and, carrying out a smoothing process in the gray value image within regions which lie outside of the line areas so that an additional smoothed, sharpened gray value image is generated.

摘要翻译： 一种处理数字灰度值图像的方法包括以下步骤：从灰度图像生成二进制边缘图像，使得存在于灰度图像中的边缘被确定为边缘周围的线区域; 在与行区域对应的区域内的灰度图像中应用锐度算法; 并且在位于行区域之外的区域内的灰度值图像中进行平滑处理，从而生成附加的平滑化，锐化的灰度值图像。

公开(公告)号：US20080078934A1

公开(公告)日：2008-04-03

申请号：US11857813

申请日：2007-09-19

申请人： Armin Hayn

发明人： Armin Hayn

IPC分类号： G21K7/00

CPC分类号： H01J37/244 ,  H01J2237/2444 ,  H01J2237/2448 ,  H01J2237/2449

摘要： A charged particle beam instrument (10) is provided, the instrument comprising a charged particle optical column (12), a voltage source, a detector (14) and a sample holder (18), the column (12) being operable to direct a beam of primary charged particles at a sample (20) on the sample holder (18) to cause secondary charged particles to be released from the sample, the voltage source being operable to establish in the vicinity of the sample an electric field that has a component that draws the secondary charged particles towards the detector (14), and the detector being operable to detect secondary charged particles, wherein the instrument further comprises a further voltage source (16) variable between a first voltage that establishes a component of the electric field that draws the secondary charged particles away from the sample, so as to prevent at least some of them from colliding with the sample (20) or sample holder (18), and a second voltage that establishes a component of the electric field that draws the secondary charged particles towards the sample, so as to prevent at least some of them from colliding with the column (12), thereby increasing the number of secondary charged particles detected by the detector (14).

摘要翻译： 提供带电的粒子束仪器（10），该仪器包括带电粒子光学柱（12），电压源，检测器（14）和样本保持器（18），所述柱（12）可操作以引导 在样品保持器（18）上的样品（20）处的初级带电粒子的束，以使次级带电粒子从样品中释放，电压源可操作以在样品附近建立具有成分 其将所述次级带电粒子吸引到所述检测器（14），并且所述检测器可操作以检测次级带电粒子，其中所述器械还包括在建立电场分量的第一电压之间变化的另外的电压源（16） 将次级带电粒子从样品中抽出，以防止其中的至少一些与样品（20）或样本保持器（18）发生碰撞，以及建立第二电压 是将二次带电粒子吸引到样品的电场的分量，以防止其中的至少一些与柱（12）碰撞，从而增加由检测器（14）检测到的次级带电粒子的数量， 。