公开(公告)号：US08217674B2

公开(公告)日：2012-07-10

申请号：US12702048

申请日：2010-02-08

申请人： Michael G. Amaro ,  Yuwei Luo ,  John M. Bonfitto ,  Michael J. Kane

发明人： Michael G. Amaro ,  Yuwei Luo ,  John M. Bonfitto ,  Michael J. Kane

IPC分类号： G01R31/00

CPC分类号： G01R31/024 ,  G01R31/2889

摘要： Open and short systems and methods for testing integrated circuits are disclosed. An example implementation includes engaging an integrated circuit testing module with an integrated circuit testing apparatus, the integrated circuit testing module for receiving an integrated circuit, a first set of contact points, and a second set of contact points; engaging a first probe onto at least one of the contact points of the first set of contact points, controllably engaging at least one of a second probe onto at least one contact pair of the integrated circuit testing module, and providing an electrical stimulus to the integrated circuit testing module.

摘要翻译： 公开了用于测试集成电路的开放和短路系统和方法。 示例实现包括使集成电路测试模块与集成电路测试装置接合，用于接收集成电路的集成电路测试模块，第一组接触点和第二组接触点; 将第一探针接合到第一组接触点的至少一个接触点上，可控制地将第二探针中的至少一个接合到集成电路测试模块的至少一个接触对上，并向集成电路 电路测试模块。

公开(公告)号：US20110193581A1

公开(公告)日：2011-08-11

申请号：US12702048

申请日：2010-02-08

申请人： Michael G. Amaro ,  Yuwei Luo ,  John M. Bonfitto ,  Michael J. Kane

发明人： Michael G. Amaro ,  Yuwei Luo ,  John M. Bonfitto ,  Michael J. Kane

IPC分类号： G01R31/26 ,  G01R31/20

CPC分类号： G01R31/024 ,  G01R31/2889

摘要： Open and short systems and methods for testing integrated circuits are disclosed. An example implementation includes engaging an integrated circuit testing module with an integrated circuit testing apparatus, the integrated circuit testing module for receiving an integrated circuit, a first set of contact points, and a second set of contact points; engaging a first probe onto at least one of the contact points of the first set of contact points, controllably engaging at least one of a second probe onto at least one contact pair of the integrated circuit testing module, and providing an electrical stimulus to the integrated circuit testing module.

摘要翻译： 公开了用于测试集成电路的开放和短路系统和方法。 示例实现包括使集成电路测试模块与集成电路测试装置接合，用于接收集成电路的集成电路测试模块，第一组接触点和第二组接触点; 将第一探针接合到第一组接触点的至少一个接触点上，可控制地将第二探针中的至少一个接合到集成电路测试模块的至少一个接触对上，并向集成电路 电路测试模块。