公开(公告)号：US10892024B2

公开(公告)日：2021-01-12

申请号：US16232185

申请日：2018-12-26

Applicant: Micron Technology, Inc.

Inventor： Ankit Vashi ,  Harish Reddy Singidi ,  Kishore Kumar Muchherla

IPC: G11C16/34 ,  G11C11/406 ,  G11C16/26 ,  G11C29/10 ,  G06F11/00 ,  G11C16/10

Abstract: A variety of applications can include systems and/or methods of optimizing results from scanning a memory device, where the memory device has stacked multiple reliability specifications. Information about a block of multiple blocks of a memory device can be logged, where the information is associated with a combination of reliability specifications. A refresh of the block can be triggered based on exceeding a threshold condition for the combination of reliability specifications.

公开(公告)号：US20200211664A1

公开(公告)日：2020-07-02

申请号：US16232185

申请日：2018-12-26

Applicant: Micron Technology, Inc.

Inventor： Ankit Vashi ,  Harish Reddy Singidi ,  Kishore Kumar Muchherla

IPC: G11C16/34 ,  G11C11/406 ,  G11C16/10 ,  G11C16/26 ,  G11C29/10 ,  G06F11/00

Abstract: A variety of applications can include systems and/or methods of optimizing results from scanning a memory device, where the memory device has stacked multiple reliability specifications. Information about a block of multiple blocks of a memory device can be logged, where the information is associated with a combination of reliability specifications. A refresh of the block can be triggered based on exceeding a threshold condition for the combination of reliability specifications. Additional apparatus, systems, and methods are disclosed.

公开(公告)号：US10446237B1

公开(公告)日：2019-10-15

申请号：US16024316

申请日：2018-06-29

Applicant: Micron Technology, Inc.

Inventor： Xiangang Luo ,  Jianmin Huang ,  Jung Sheng Hoei ,  Harish Reddy Singidi ,  Ting Luo ,  Ankit Vashi

IPC: G11C16/10 ,  G11C16/34 ,  G11C7/04

Abstract: Devices and techniques temperature sensitive NAND programming are disclosed herein. A device controller can receive a command to write data to a component of the device. A temperature can be obtained in response to the command, and the temperature can be combined with a temperature compensation value to calculate a verification level. The command can then be executed in accordance with the verification level.