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公开(公告)号：US11243554B1
公开(公告)日：2022-02-08
申请号：US16983811
申请日：2020-08-03
Applicant: Micron Technology, Inc.
Inventor： Anupriya Chakraborty , John David Porter , Alan John Wilson
Abstract: Techniques for providing temperature trim codes to multiple reference circuits of an integrated circuit are provided. In an example, a string of primary latch circuits can provide a set of pre-defined temperature trim codes to a multiplexer in response to a token of a series of tokens. The multiplexer can provide two trim of the trim codes to an interpolator based on a temperature reading of the integrated circuit. The interpolator can provide an interpolated trim code and the trim code can be distributed to a reference circuit based on the token.
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公开(公告)号：US20220035396A1
公开(公告)日：2022-02-03
申请号：US16983811
申请日：2020-08-03
Applicant: Micron Technology, Inc.
Inventor： Anupriya Chakraborty , John David Porter , Alan John Wilson
IPC: G05F3/20
Abstract: Techniques for providing temperature trim codes to multiple reference circuits of an integrated circuit are provided. In an example, a string of primary latch circuits can provide a set of pre-defined temperature trim codes to a multiplexer in response to a token of a series of tokens. The multiplexer can provide two trim of the trim codes to an interpolator based on a temperature reading of the integrated circuit. The interpolator can provide an interpolated trim code and the trim code can be distributed to a reference circuit based on the token.
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公开(公告)号：US20220261027A1
公开(公告)日：2022-08-18
申请号：US17666124
申请日：2022-02-07
Applicant: Micron Technology, Inc.
Inventor： Anupriya Chakraborty , John David Porter , Alan John Wilson
IPC: G05F3/20
Abstract: Techniques for providing temperature trim codes to multiple reference circuits of an integrated circuit are provided. In an example, a string of primary latch circuits can provide a set of pre-defined temperature trim codes to a multiplexer in response to a token of a series of tokens. The multiplexer can provide two trim of the trim codes to an interpolator based on a temperature reading of the integrated circuit. The interpolator can provide an interpolated trim code and the trim code can be distributed to a reference circuit based on the token.
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公开(公告)号：US11714443B2
公开(公告)日：2023-08-01
申请号：US17666124
申请日：2022-02-07
Applicant: Micron Technology, Inc.
Inventor： Anupriya Chakraborty , John David Porter , Alan John Wilson
Abstract: Techniques for providing temperature trim codes to multiple reference circuits of an integrated circuit are provided. In an example, a string of primary latch circuits can provide a set of pre-defined temperature trim codes to a multiplexer in response to a token of a series of tokens. The multiplexer can provide two trim of the trim codes to an interpolator based on a temperature reading of the integrated circuit. The interpolator can provide an interpolated trim code and the trim code can be distributed to a reference circuit based on the token.
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