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公开(公告)号：US20220261027A1
公开(公告)日：2022-08-18
申请号：US17666124
申请日：2022-02-07
Applicant: Micron Technology, Inc.
Inventor： Anupriya Chakraborty , John David Porter , Alan John Wilson
IPC: G05F3/20
Abstract: Techniques for providing temperature trim codes to multiple reference circuits of an integrated circuit are provided. In an example, a string of primary latch circuits can provide a set of pre-defined temperature trim codes to a multiplexer in response to a token of a series of tokens. The multiplexer can provide two trim of the trim codes to an interpolator based on a temperature reading of the integrated circuit. The interpolator can provide an interpolated trim code and the trim code can be distributed to a reference circuit based on the token.
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公开(公告)号：US11243554B1
公开(公告)日：2022-02-08
申请号：US16983811
申请日：2020-08-03
Applicant: Micron Technology, Inc.
Inventor： Anupriya Chakraborty , John David Porter , Alan John Wilson
Abstract: Techniques for providing temperature trim codes to multiple reference circuits of an integrated circuit are provided. In an example, a string of primary latch circuits can provide a set of pre-defined temperature trim codes to a multiplexer in response to a token of a series of tokens. The multiplexer can provide two trim of the trim codes to an interpolator based on a temperature reading of the integrated circuit. The interpolator can provide an interpolated trim code and the trim code can be distributed to a reference circuit based on the token.
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Patent Agency Ranking
公开(公告)号：US12062407B2
公开(公告)日：2024-08-13
申请号：US17823740
申请日：2022-08-31
Applicant: Micron Technology, Inc.
Inventor： Alan John Wilson , Donald M. Morgan , John David Porter
CPC classification number: G11C29/76 , G11C29/54 , G11C29/808
Abstract: Apparatus and methods for page-based soft post package repair are disclosed. Based on data stored in a storage element, an address may be decoded to a prime row, a row-based redundant row, or a page-based redundant row. A match logic circuit may determine whether the address corresponds to a defective prime row and generate a match signal. A decoder can select a redundant row to be accessed instead of a prime row in response to the match signal indicating that the address data corresponding to the address to be accessed matches defective address data stored in a volatile memory. A page-based redundant row allows for page-by-page substitution for defective memory, allowing functional portions of memory to continue to be used.
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公开(公告)号：US20220035396A1
公开(公告)日：2022-02-03
申请号：US16983811
申请日：2020-08-03
Applicant: Micron Technology, Inc.
Inventor： Anupriya Chakraborty , John David Porter , Alan John Wilson
IPC: G05F3/20
Abstract: Techniques for providing temperature trim codes to multiple reference circuits of an integrated circuit are provided. In an example, a string of primary latch circuits can provide a set of pre-defined temperature trim codes to a multiplexer in response to a token of a series of tokens. The multiplexer can provide two trim of the trim codes to an interpolator based on a temperature reading of the integrated circuit. The interpolator can provide an interpolated trim code and the trim code can be distributed to a reference circuit based on the token.
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公开(公告)号：US20240363192A1
公开(公告)日：2024-10-31
申请号：US18761619
申请日：2024-07-02
Applicant: Micron Technology, Inc.
Inventor： Alan John Wilson , Donald M. Morgan , John David Porter
CPC classification number: G11C29/76 , G11C29/54 , G11C29/808
Abstract: Apparatus and methods for page-based soft post package repair are disclosed. Based on data stored in a storage element, an address may be decoded to a prime row, a row-based redundant row, or a page-based redundant row. A match logic circuit may determine whether the address corresponds to a defective prime row and generate a match signal. A decoder can select a redundant row to be accessed instead of a prime row in response to the match signal indicating that the address data corresponding to the address to be accessed matches defective address data stored in a volatile memory. A page-based redundant row allows for page-by-page substitution for defective memory, allowing functional portions of memory to continue to be used.
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公开(公告)号：US20240071558A1
公开(公告)日：2024-02-29
申请号：US17823740
申请日：2022-08-31
Applicant: Micron Technology, Inc.
Inventor： Alan John Wilson , Donald M. Morgan , John David Porter
CPC classification number: G11C29/76 , G11C29/54 , G11C29/808
Abstract: Apparatus and methods for page-based soft post package repair are disclosed. Based on data stored in a storage element, an address may be decoded to a prime row, a row-based redundant row, or a page-based redundant row. A match logic circuit may determine whether the address corresponds to a defective prime row and generate a match signal. A decoder can select a redundant row to be accessed instead of a prime row in response to the match signal indicating that the address data corresponding to the address to be accessed matches defective address data stored in a volatile memory. A page-based redundant row allows for page-by-page substitution for defective memory, allowing functional portions of memory to continue to be used.
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公开(公告)号：US11714443B2
公开(公告)日：2023-08-01
申请号：US17666124
申请日：2022-02-07
Applicant: Micron Technology, Inc.
Inventor： Anupriya Chakraborty , John David Porter , Alan John Wilson
Abstract: Techniques for providing temperature trim codes to multiple reference circuits of an integrated circuit are provided. In an example, a string of primary latch circuits can provide a set of pre-defined temperature trim codes to a multiplexer in response to a token of a series of tokens. The multiplexer can provide two trim of the trim codes to an interpolator based on a temperature reading of the integrated circuit. The interpolator can provide an interpolated trim code and the trim code can be distributed to a reference circuit based on the token.
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