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公开(公告)号：US11809721B2
公开(公告)日：2023-11-07
申请号：US17345785
申请日：2021-06-11
Applicant: Micron Technology, Inc.
Inventor： Jacob Sloat
CPC classification number: G06F3/0634 , G06F1/206 , G06F3/0617 , G06F3/0679
Abstract: A method includes determining, by a first component of a memory sub-system controller, a first temperature value of the memory subsystem controller. The method can further include determining, by a second component of a non-volatile memory device, a second temperature value of the non-volatile memory device coupled to the memory sub-system controller. The method can further include modifying a data parameter in response to at least one of the first temperature value or the second temperature value exceeding a threshold temperature value.
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公开(公告)号：US20210397531A1
公开(公告)日：2021-12-23
申请号：US17464483
申请日：2021-09-01
Applicant: Micron Technology, Inc.
Inventor： Cyrus Elmtalab , Jacob Sloat
Abstract: Methods, apparatuses, and systems related to a memory device are described. A controller may be configured to predict a temperature of a memory based on a real-time temperature of the controller. Based on the predicted temperature of the memory, the controller may execute a remedial action to reduce an actual temperature of the memory for executing an upcoming operation.
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公开(公告)号：US11586518B2
公开(公告)日：2023-02-21
申请号：US17005302
申请日：2020-08-27
Applicant: Micron Technology, Inc.
Inventor： Jacob Sloat
Abstract: A controller of a non-volatile, dual, in-line memory modules (NVDIMM). A NVDIMM is configured to predict thermal events associated with save and restore operations prior to starting the save or restore operation. The controller of the NVDIMM includes a thermal event prediction circuit to predict whether a thermal event will occur in response to a request to perform a save or restore operation, and to cause the controller to perform an action in response to a determination that a thermal event is likely to occur. To predict the thermal event, the controller may be configured to predict a peak temperature of the save or restore operation based on a predicted temperature increase from an initial or starting temperature. The predicted temperature increase may be based on a rate of temperature change during the save or restore operation and a duration of the save or restore operation.
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公开(公告)号：US20220066899A1
公开(公告)日：2022-03-03
申请号：US17005302
申请日：2020-08-27
Applicant: Micron Technology, Inc.
Inventor： Jacob Sloat
Abstract: A controller of a non-volatile, dual, in-line memory modules (NVDIMM). A NVDIMM is configured to predict thermal events associated with save and restore operations prior to starting the save or restore operation. The controller of the NVDIMM includes a thermal event prediction circuit to predict whether a thermal event will occur in response to a request to perform a save or restore operation, and to cause the controller to perform an action in response to a determination that a thermal event is likely to occur. To predict the thermal event, the controller may be configured to predict a peak temperature of the save or restore operation based on a predicted temperature increase from an initial or starting temperature. The predicted temperature increase may be based on a rate of temperature change during the save or restore operation and a duration of the save or restore operation.
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公开(公告)号：US20210318822A1
公开(公告)日：2021-10-14
申请号：US17345785
申请日：2021-06-11
Applicant: Micron Technology, Inc.
Inventor： Jacob Sloat
Abstract: A method includes determining, by a first component of a memory sub-system controller, a first temperature value of the memory subsystem controller. The method can further include determining, by a second component of a non-volatile memory device, a second temperature value of the non-volatile memory device coupled to the memory sub-system controller. The method can further include modifying a data parameter in response to at least one of the first temperature value or the second temperature value exceeding a threshold temperature value.
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Patent Agency Ranking
公开(公告)号：US20210200654A1
公开(公告)日：2021-07-01
申请号：US16919081
申请日：2020-07-01
Applicant: Micron Technology, Inc.
Inventor： Cyrus Elmtalab , Jacob Sloat
Abstract: Methods, apparatuses, and systems related to a memory device are described. The memory device may include a non-volatile (NV) memory and a controller. The controller may be configured to predict a temperature of the NV memory based on a real-time temperature of the controller. Based on the predicted temperature of the NV memory, the controller may execute a remedial action to reduce an actual temperature of the NV memory for executing an upcoming operation.
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公开(公告)号：US20210181961A1
公开(公告)日：2021-06-17
申请号：US16717460
申请日：2019-12-17
Applicant: Micron Technology, Inc.
Inventor： Jacob Sloat
Abstract: A method includes determining, by a first component of a memory sub-system controller, a first temperature value of the memory subsystem controller. The method can further include determining, by a second component of a non-volatile memory device, a second temperature value of the non-volatile memory device coupled to the memory sub-system controller. The method can further include modifying a data parameter in response to at least one of the first temperature value or the second temperature value exceeding a threshold temperature value.
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公开(公告)号：US11036413B1
公开(公告)日：2021-06-15
申请号：US16717460
申请日：2019-12-17
Applicant: Micron Technology, Inc.
Inventor： Jacob Sloat
Abstract: A method includes determining, by a first component of a memory sub-system controller, a first temperature value of the memory subsystem controller. The method can further include determining, by a second component of a non-volatile memory device, a second temperature value of the non-volatile memory device coupled to the memory sub-system controller. The method can further include modifying a data parameter in response to at least one of the first temperature value or the second temperature value exceeding a threshold temperature value.
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公开(公告)号：US11513933B2
公开(公告)日：2022-11-29
申请号：US17464483
申请日：2021-09-01
Applicant: Micron Technology, Inc.
Inventor： Cyrus Elmtalab , Jacob Sloat
Abstract: Methods, apparatuses, and systems related to a memory device are described. A controller may be configured to predict a temperature of a memory based on a real-time temperature of the controller. Based on the predicted temperature of the memory, the controller may execute a remedial action to reduce an actual temperature of the memory for executing an upcoming operation.
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公开(公告)号：US11144421B2
公开(公告)日：2021-10-12
申请号：US16919081
申请日：2020-07-01
Applicant: Micron Technology, Inc.
Inventor： Cyrus Elmtalab , Jacob Sloat
Abstract: Methods, apparatuses, and systems related to a memory device are described. The memory device may include a non-volatile (NV) memory and a controller. The controller may be configured to predict a temperature of the NV memory based on a real-time temperature of the controller. Based on the predicted temperature of the NV memory, the controller may execute a remedial action to reduce an actual temperature of the NV memory for executing an upcoming operation.
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