公开(公告)号：US20220066894A1

公开(公告)日：2022-03-03

申请号：US17396083

申请日：2021-08-06

Applicant: Micron Technology, Inc.

Inventor： Sri Rama Namala ,  Lu Tong ,  Kristopher Kopel ,  Sheng-Huang Lee ,  Chang H. Siau

IPC: G06F11/20 ,  G11C16/04

Abstract: Disclosed in some examples are methods, systems, devices, memory devices, and machine-readable mediums for using a non-defective portion of a block of memory on which there is a defect on a different portion. Rather than disable the entire block, the system may disable only a portion of the block (e.g., a first deck of the block) and salvage a different portion of the block (e.g., a second deck of the block).

公开(公告)号：US11537484B2

公开(公告)日：2022-12-27

申请号：US17396083

申请日：2021-08-06

Applicant: Micron Technology, Inc.

Inventor： Sri Rama Namala ,  Lu Tong ,  Kristopher Kopel ,  Sheng-Huang Lee ,  Chang H. Siau

IPC: G06F11/20 ,  G11C16/04 ,  G11C16/26

Abstract: Disclosed in some examples are methods, systems, devices, memory devices, and machine-readable mediums for using a non-defective portion of a block of memory on which there is a defect on a different portion. Rather than disable the entire block, the system may disable only a portion of the block (e.g., a first deck of the block) and salvage a different portion of the block (e.g., a second deck of the block).

公开(公告)号：US12007860B2

公开(公告)日：2024-06-11

申请号：US18075958

申请日：2022-12-06

Applicant: Micron Technology, Inc.

Inventor： Sri Rama Namala ,  Lu Tong ,  Kristopher Kopel ,  Sheng-Huang Lee ,  Chang H. Siau

IPC: G06F11/20 ,  G11C16/04 ,  G11C16/26

CPC classification number: G06F11/2094 ,  G11C16/0483 ,  G06F2201/85 ,  G11C16/26

Abstract: Disclosed in some examples are methods, systems, devices, memory devices, and machine-readable mediums for using a non-defective portion of a block of memory on which there is a defect on a different portion. Rather than disable the entire block, the system may disable only a portion of the block (e.g., a first deck of the block) and salvage a different portion of the block (e.g., a second deck of the block).

公开(公告)号：US20230111510A1

公开(公告)日：2023-04-13

申请号：US18075958

申请日：2022-12-06

Applicant: Micron Technology, Inc.

Inventor： Sri Rama Namala ,  Lu Tong ,  Kristopher Kopel ,  Sheng-Huang Lee ,  Chang H. Siau

IPC: G06F11/20 ,  G11C16/04 ,  G11C16/26

Abstract: Disclosed in some examples are methods, systems, devices, memory devices, and machine-readable mediums for using a non-defective portion of a block of memory on which there is a defect on a different portion. Rather than disable the entire block, the system may disable only a portion of the block (e.g., a first deck of the block) and salvage a different portion of the block (e.g., a second deck of the block).