公开(公告)号：US11670397B2

公开(公告)日：2023-06-06

申请号：US17238561

申请日：2021-04-23

Applicant: Micron Technology, Inc.

Inventor： Hyunui Lee ,  Masayoshi Yamazaki

IPC: G11C29/50 ,  G11C7/10 ,  H03K19/00

CPC classification number: G11C29/50008 ,  G11C7/109 ,  G11C7/1057 ,  G11C7/1063 ,  G11C7/1069 ,  G11C7/1084 ,  G11C7/1096 ,  H03K19/0005 ,  G11C2207/2254

Abstract: A device may include a ZQ calibration circuit. The ZQ calibration circuit may include a first register configured to store a first impedance code generated responsive to a ZQ calibration command. The ZQ calibration circuit may also include a second register configured to store a shift value. Further, the ZQ calibration circuit may include a compute block configured to generate a second impedance code based on the first impedance code and the shift value. Systems and related methods of operation are also described.

公开(公告)号：US20220343996A1

公开(公告)日：2022-10-27

申请号：US17238561

申请日：2021-04-23

Applicant: Micron Technology, Inc.

Inventor： Hyunui Lee ,  Masayoshi Yamazaki

IPC: G11C29/50 ,  G11C7/10 ,  H03K19/00

Abstract: A device may include a ZQ calibration circuit. The ZQ calibration circuit may include a first register configured to store a first impedance code generated responsive to a ZQ calibration command. The ZQ calibration circuit may also include a second register configured to store a shift value. Further, the ZQ calibration code may include a compute block configured to generate a second impedance code based on the first impedance code and the shift value. Systems and related methods of operation are also described.