公开(公告)号：US20220293184A1

公开(公告)日：2022-09-15

申请号：US17200607

申请日：2021-03-12

Applicant: Micron Technology, Inc.

Inventor： Pitamber SHUKLA ,  Giuseppina PUZZILLI ,  Niccolo' RIGHETTI ,  Scott A. STOLLER ,  Priya VENKATARAMAN

IPC: G11C16/10 ,  G11C16/26 ,  G11C16/32 ,  G11C7/04

Abstract: A method and system for temperature-dependent operations in a memory device are described. Temperature measurements of a memory device are recorded. A determination that a temperature measurement of the memory device satisfies a threshold temperature value is performed. In response to the determination, execution of a background operation in the memory device is delayed, and host system operation(s) continue to be executed in the memory device while execution of the background operation is delayed.

公开(公告)号：US20240177760A1

公开(公告)日：2024-05-30

申请号：US18507872

申请日：2023-11-13

Applicant: Micron Technology, Inc.

Inventor： Robert Winston MASON ,  Phani Raghavendra Yasasvi GANGAVARAPU ,  Pitamber SHUKLA ,  Qun SU

IPC: G11C11/406 ,  G11C29/02

CPC classification number: G11C11/40615 ,  G11C11/40622 ,  G11C29/022

Abstract: Methods, systems, and apparatuses include determining a read counter for a portion of memory of a memory device satisfies a read threshold. A weighted subportion identifier for the portion of memory is selected in response to the read counter satisfying the threshold. The weighted subportion identifier is selected probabilistically, a probability of selection based on defectivity information for subportions of memory of the portion of memory. A subportion of memory is determined using the weighted subportion identifier. A data validity scan is performed on the subportion of memory.