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公开(公告)号:US20220293184A1
公开(公告)日:2022-09-15
申请号:US17200607
申请日:2021-03-12
Applicant: Micron Technology, Inc.
Inventor: Pitamber SHUKLA , Giuseppina PUZZILLI , Niccolo' RIGHETTI , Scott A. STOLLER , Priya VENKATARAMAN
Abstract: A method and system for temperature-dependent operations in a memory device are described. Temperature measurements of a memory device are recorded. A determination that a temperature measurement of the memory device satisfies a threshold temperature value is performed. In response to the determination, execution of a background operation in the memory device is delayed, and host system operation(s) continue to be executed in the memory device while execution of the background operation is delayed.