公开(公告)号：US4508443A

公开(公告)日：1985-04-02

申请号：US524671

申请日：1983-08-19

申请人： Minoru Matsuzaki ,  Akihiko Hachimoto ,  Takashi Inoue ,  Hitoshi Shirai ,  Akira Watanabe ,  Ikuo Tofukuji

发明人： Minoru Matsuzaki ,  Akihiko Hachimoto ,  Takashi Inoue ,  Hitoshi Shirai ,  Akira Watanabe ,  Ikuo Tofukuji

IPC分类号： G03B13/36 ,  G02B7/04 ,  G02B7/08 ,  G02B7/28 ,  G03G21/00 ,  G03B3/00

CPC分类号： G02B7/08

摘要： A lens barrel is capable of selectively establishing a power focus mode in which an internally housed motor moves a taking lens to a position of any desired focal length, a single "auto-focus" mode in which the taking lens is moved to a position which is in focus to a stationary object being photographed, and a sequence "auto-focus" mode in which the taking lens is continuously moved in focus to a moving object being photographed. Any one of these modes is suitably selected by a mode changing switch. A movement of the taking lens in each mode is initiated by an operating member.

摘要翻译： 透镜镜筒能够选择性地建立功率对焦模式，其中内部容纳的马达将拍摄镜头移动到任何所需焦距的位置，单次“自动对焦”模式，其中拍摄镜头移动到 对被拍摄的静止物体进行聚焦，以及将拍摄镜头连续移动到拍摄的移动物体的顺序“自动对焦”模式。 这些模式中的任何一个通过模式切换开关适当选择。 拍摄镜头在每种模式下的移动由操作构件启动。

公开(公告)号：US4971445A

公开(公告)日：1990-11-20

申请号：US191606

申请日：1988-05-09

申请人： Eiichi Sato ,  Kiyozo Koshiishi ,  Sadao Shigetomi ,  Syunpei Tanaka ,  Makoto Yoshinaga ,  Terumasa Morita ,  Chikara Nagano ,  Shohei Kobayashi ,  Chiaki Sato ,  Akitoshi Toda ,  Mitunori Kubo ,  Ikuo Tofukuji

发明人： Eiichi Sato ,  Kiyozo Koshiishi ,  Sadao Shigetomi ,  Syunpei Tanaka ,  Makoto Yoshinaga ,  Terumasa Morita ,  Chikara Nagano ,  Shohei Kobayashi ,  Chiaki Sato ,  Akitoshi Toda ,  Mitunori Kubo ,  Ikuo Tofukuji

IPC分类号： G01B9/04 ,  G01B11/24

CPC分类号： G01B11/24 ,  G01B9/04

摘要： A fine surface profile meter includes an X-Y stage, supported by a leaf spring, for supporting a sample thereon, a piezoelectric actuator for two-dimensionally scanning the X-Y stage, a positioning table, disposed below the X-Y stage, for positioning the X-Y stage at an arbitrary position, an objective lens disposed above the X-Y stage, an observation optical system for allowing an operator to observe an enlarged sample image, a measurement optical system, an optical axis of which is aligned with an optical path of the objective lens through a beam splitter, the measurement optical system for emitting a laser beam onto the sample through the objective lens and to receive the laser beam reflected by the sample, a calculator circuit for calculating height information of the sample using an output from the measurement optical system and for obtaining a two-dimensional distribution of the height information, a cover for shielding the X-Y stage, the positioning means, the objective lens, the beam splitter, the observation optical system, and the measurement optical system from an outer atmosphere, a detachable measurement unit for integrally holding the objective lens, the beam splitter, and the measurement optical system, a supporting plate supported on the X-Y stage through columns, and an arm, mounted on the supporting plate, for supporting the measurement optical system and the observation optical system.