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公开(公告)号：US09816801B2
公开(公告)日：2017-11-14
申请号：US15072756
申请日：2016-03-17
Applicant: RAMOT AT TEL-AVIV UNIVERSITY LTD.
Inventor： Pinhas Girshovitz , Natan Tzvi Shaked
IPC: G01B9/02 , G01B9/04 , G02B21/00 , G02B21/14 , G03H1/26 , G01B11/06 , G02B5/12 , G02B17/08 , G02B27/10 , G02B27/28 , G03H1/04
CPC classification number: G01B9/0203 , G01B9/02011 , G01B9/02027 , G01B9/02028 , G01B9/02041 , G01B9/02047 , G01B9/02085 , G01B9/02097 , G01B9/04 , G01B11/06 , G02B5/12 , G02B17/08 , G02B21/0056 , G02B21/14 , G02B27/106 , G02B27/283 , G03H1/0443 , G03H1/265 , G03H2001/0445 , G03H2001/0456 , G03H2001/046
Abstract: The present invention provides a sample inspection and quantitative imaging system and method for performing off-axis interferometric imaging while enabling to record off-axis holograms in an extended field of view (FOV) than possible using a given camera and imaging setup, and thus to enlarge (e.g. double, triple, or even more than this) the interferometric FOV, without changing the imaging parameters, such as the magnification and the resolution.
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公开(公告)号：US09471984B2
公开(公告)日：2016-10-18
申请号：US14132086
申请日：2013-12-18
Applicant: Leica Microsystems (Schweiz) AG
Inventor： Reto Zuest , Meinrad Berchtel
CPC classification number: G06T7/0044 , G01B9/04 , G01B11/02 , G01B11/14 , G02B21/025 , G02B21/365 , G06T7/74
Abstract: A method for calibrating a microscope apparatus (1) having a variable optical magnification system (13) and a detector device (12) is disclosed. First, a calibrating mode is performed, wherein an image (50) of an object (10) is captured at a known reference magnification value, two characteristic reference points (32a, 32b) are determined in the image, a reference distance (34) between the two reference points is determined, and a correlation is determined between the reference distance and the reference magnification value. Later, a measuring mode is implemented, in which a current image (51) of the object (10) is captured at a second magnification value, the two characteristic reference points (52a, 52b) are identified therein, a current distance (54) between the current reference points is determined, and the second magnification value is determined from the current distance (54) based on the correlation between the reference distance (34) and the reference magnification value.
Abstract translation: 公开了一种用于校准具有可变光学放大系统（13）和检测器装置（12）的显微镜装置（1）的方法。 首先，执行校准模式，其中以已知的参考倍率值捕获对象（10）的图像（50），在图像中确定两个特征参考点（32a，32b），参考距离（34） 确定两个参考点之间，并且在参考距离和参考倍率值之间确定相关性。 之后，实现了以第二倍率值捕获对象（10）的当前图像（51）的两个特征参考点（52a，52b）的测量模式，当前距离（54） 确定当前参考点之间，并且基于参考距离（34）和参考倍率值之间的相关性，从当前距离（54）确定第二倍率值。
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公开(公告)号：US09410794B2
公开(公告)日：2016-08-09
申请号：US14499344
申请日：2014-09-29
Applicant: Carl Zeiss Microscopy GmbH
Inventor： Helmut Lippert , Nils Langholz
CPC classification number: G01B11/02 , G01B9/04 , G01B11/0608 , G01B11/24 , G01B2210/52
Abstract: Examination of a microscopic specimen is described. Height information for a respective plurality of lateral regions of the specimen is obtained from each of multiple specimen recordings, in which the height information of each specimen recording is limited to a respective height measurement range and the height measurement ranges of different specimen recordings are different. An overall image is calculated from the specimen recordings, in which overall image height information of the different specimen recordings is combined. Specimen recordings are recorded at such heights that: the height measurement ranges of different specimen recordings overlap each other, common lateral regions are identified in two respective specimen recordings for which lateral regions height information could be obtained in both specimen recordings, and a link of the height information of different specimen recordings is determined on the basis of the height information of different specimen recordings for at least one common lateral region.
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公开(公告)号：US09366567B2
公开(公告)日：2016-06-14
申请号：US14288173
申请日：2014-05-27
Applicant: OLYMPUS CORPORATION
Inventor： Yosuke Tamura , Toshiya Komuro
CPC classification number: G01J1/42 , G01B9/04 , G01J1/4257 , G02B7/28 , G02B21/0092 , G02B21/247
Abstract: A focusing device that includes a differential interference prism used in differential interference observation in a focusing detection optical system includes: a light source that emits light with which a measurement surface of an observation sample is irradiated; a photo detection unit that detects light from the measurement surface; a focusing detection unit that detects an error signal near a focusing point of the measurement surface on the basis of an output signal from the photo detection unit; and a condition changing unit that changes an acquisition condition of the error signal.
Abstract translation: 在聚焦检测光学系统中包括用于差分干涉观察的差分干涉棱镜的聚焦装置包括：发射观察样品的测量表面的光的光源; 检测来自测量表面的光的光检测单元; 聚焦检测单元，其基于来自光检测单元的输出信号来检测测量表面的聚焦点附近的误差信号; 以及改变所述误差信号的获取条件的条件改变单元。
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公开(公告)号：US20160097921A1
公开(公告)日：2016-04-07
申请号：US14859208
申请日：2015-09-18
Inventor： HIROTOSHI OIKAZE , YASUHIRO KABETANI , YOHEI TAKECHI , TOMOTAKA FURUTA
CPC classification number: G02B21/002 , G01B9/02002 , G01B9/02007 , G01B9/02009 , G01B9/02048 , G01B9/02057 , G01B9/0209 , G01B9/04 , G02B21/0016 , G02B21/14 , G02B21/26 , G02B26/007
Abstract: In an inner layer measurement method, first irradiation light and second irradiation light having a peak wavelength longer than that of the first irradiation light are formed by changing at least one of a position where light emitted from a lamp is transmitted through a short pass filter and a position where light emitted from a lamp is transmitted through a long pass filter. Then, a first XY sectional surface of a semitransparent body is measured by irradiating the first XY sectional surface with the first irradiation light. A second XY sectional surface positioned on a layer deeper than the first XY sectional surface is measured by irradiating the second XY sectional surface with the second irradiation light. Each of the short pass filter and the long pass filter can transmit the light and has properties of changing a cutoff wavelength according to the position where the light is transmitted.
Abstract translation: 在内层测定方法中，通过改变通过短路滤波器透射从灯发出的光的位置中的至少一个，形成具有比第一照射光长的峰值波长的第一照射光和第二照射光， 从灯发出的光透过长通滤光器的位置。 然后，通过用第一照射光照射第一XY截面来测量半透明体的第一XY截面。 通过用第二照射光照射第二XY截面来测量位于比第一XY截面更深的层的第二XY截面。 短路滤波器和长距离滤波器中的每一个可以透射光，并且具有根据发射光的位置改变截止波长的性质。
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Patent Agency Ranking
公开(公告)号：US20160054112A1
公开(公告)日：2016-02-25
申请号：US14820676
申请日：2015-08-07
Applicant: Howard Hughes Medical Institute
Inventor： Harald F. Hess
CPC classification number: G01B9/02041 , G01B9/02007 , G01B9/02081 , G01B9/02097 , G01B9/04 , G01B2290/45 , G01B2290/55 , G01N21/6456 , G01N21/6458 , G02B21/0056 , G02B21/0076 , G02B21/008 , G02B21/14 , G02B21/367 , H04N13/214
Abstract: A method includes sequentially acquiring phase-shifted images of an optical source in a plurality of predetermined positions in the z plane to form a plurality of image frame sequences; determining from the plurality of image frame sequences at least one phase-related characteristic associated with each predetermined position of the optical source in the z plane; and storing the at least one phase-related characteristic and the predetermined positions of the optical source in the z plane.
Abstract translation: 一种方法包括在z平面中顺序获取多个预定位置中的光源的相移图像以形成多个图像帧序列; 从多个图像帧序列确定与z平面中的光源的每个预定位置相关联的至少一个相位相关特性; 并将光源的至少一个相位特性和预定位置存储在z平面中。
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公开(公告)号：US20150292862A1
公开(公告)日：2015-10-15
申请号：US14751771
申请日：2015-06-26
Applicant: NIKON CORPORATION
Inventor： Ryoichi SATAKA , Hisao OSAWA
CPC classification number: G01B9/04 , G01J3/0208 , G01J3/021 , G01J3/0216 , G01J3/2803 , G01J3/36 , G01J3/4406 , G02B21/0064
Abstract: A spectroscope including: a spectral element that is configured to spectrally separate signal light; a first optical system that is configured to condense spectroscopic light spectrally separated by the spectral element; and an optical receiver that is configured to receive the spectroscopic light; wherein the optical receiver includes a plurality of regions different sensitivities with respect to a wavelength characteristics of the spectroscopic light.
Abstract translation: 一种分光镜，包括：被配置为光谱分离信号光的光谱元件; 第一光学系统，被配置为使由所述光谱元件光谱分离的分光光阑聚集; 以及被配置为接收所述分光光的光接收器; 其中所述光学接收器包括多个区域相对于所述分光光度的波长特性而具有不同的灵敏度。
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8.发明授权公开(公告)号：US09127931B2
公开(公告)日：2015-09-08
申请号：US12970088
申请日：2010-12-16
Applicant: Takashi Yamamoto
Inventor： Takashi Yamamoto
Abstract: A thickness-information acquisition apparatus includes: an image acquisition section configured to acquire a phase-difference image of a sample; a correlation-distribution computation section configured to compute a correlation distribution of an image in the phase-difference image with respect to pixels of another image in the phase-difference image; and a thickness-information acquisition section configured to acquire information on the thickness of the sample in accordance with the correlation distribution.
Abstract translation: 厚度信息获取装置包括：图像获取部，被配置为获取样本的相位差图像; 相关分布计算部，被配置为计算所述相位差图像中的图像相对于所述相位差图像中的另一图像的像素的相关分布; 以及厚度信息获取部，被配置为根据所述相关分布获取所述样本的厚度的信息。
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9.发明授权公开(公告)号：US09025150B2
公开(公告)日：2015-05-05
申请号：US13698738
申请日：2011-05-17
CPC classification number: G01B9/02 , G01B9/02068 , G01B9/02082 , G01B9/02091 , G01B9/04 , G02B21/0056 , G02B26/06
Abstract: The invention relates to an incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample (106). The device comprises an interference device (100) between a reference wave (401), produced by reflection of an incident wave by a reflective surface (105) of a reference arm of the interference device, and an object wave (402) produced by backscattering of the incident wave by a slice of the sample, an acquisition device (108) for at least a first interference signal and at least a second interference signal resulting from the interference of the reference and object waves, the at least two interference signals having a phase difference, an processing unit (403) for calculating an image of the slice of the sample, based on said interference signals. The interference device also comprises an optical element (404) for modifying the phase of the wavefront, and the microscopy device comprises a control unit (405) for the optical element, linked to the processing unit (403), the optical phase modification element being controlled by optimizing a statistical parameter of at least a part of the image calculated by the processing unit.
Abstract translation: 本发明涉及一种用于体积散射样品（106）成像的非相干光全场干涉显微镜装置。 该装置包括通过由干涉装置的参考臂的反射表面（105）反射入射波而产生的参考波（401）和由后向散射产生的物体波（402）之间的干涉装置（100） 通过一个采样片的入射波的采样装置（108），用于至少第一干扰信号的采集装置（108）和由参考和对象波的干扰产生的至少第二干扰信号，所述至少两个干扰信号具有 相位差，用于基于所述干扰信号计算样本片的图像的处理单元（403）。 所述干涉装置还包括用于修改所述波前相位的光学元件（404），并且所述显微镜装置包括与所述处理单元（403）连接的所述光学元件的控制单元（405），所述光学相位修改元件 通过优化由处理单元计算的图像的至少一部分的统计参数来控制。
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10.发明申请Method for the 3-Dimensional Measurement of a Sample With a Measuring System Comprising a Laser Scanning Microscope and Such Measuring System 有权用于具有包括激光扫描显微镜和这种测量系统的测量系统的样品的三维测量的方法公开(公告)号：US20150032414A1
公开(公告)日：2015-01-29
申请号：US14368936
申请日：2012-01-05
Applicant: Balázs Rozsa , Gergely Katona , Ferenc Csikor , Pál Maak
Inventor： Balázs Rozsa , Gergely Katona , Ferenc Csikor , Pál Maak
CPC classification number: G01B11/24 , G01B9/04 , G06F3/01 , G06F3/011 , G06F3/0346
Abstract: The invention relates to a method for the 3-dimensional measurement of a sample with a measuring system having a 3-dimensional measuring space and comprising a laser scanning microscope, characterised by—providing the measuring system with a 3-dimensional virtual reality device,—creating the 3-dimensional virtual space of the measuring space using the 3-dimensional virtual reality device,—allowing for selecting an operation in the virtual space,—providing real-time unidirectional or bidirectional convection between the measuring space and the virtual space such that an operation selected in the virtual space is performed in the measuring space and data measured in the measuring space is displayed in the virtual space. The invention further relates to a measuring system for the 3-dimensional measurement of a sample, the measuring system having a 3-dimensional measuring space and comprising a laser scanning microscope, characterised by further comprising a 3-dimensional virtual reality device for displaying a 3-dimensional virtual space of the measuring space, and a real-time unidirectional or bidirectional connection is provided between the laser scanning microscope and the 3-dimensional virtual reality device.
Abstract translation: 本发明涉及一种用具有三维测量空间的测量系统对样品进行三维测量的方法，该方法包括一个激光扫描显微镜，其特征在于：向所述测量系统提供三维虚拟现实设备， 使用三维虚拟现实设备创建测量空间的三维虚拟空间，允许在虚拟空间中选择操作， - 提供测量空间和虚拟空间之间的实时单向或双向对流，使得 在测量空间中执行在虚拟空间中选择的操作，并且在虚拟空间中显示在测量空间中测量的数据。 本发明还涉及一种用于样品的三维测量的测量系统，所述测量系统具有三维测量空间并且包括激光扫描显微镜，其特征在于还包括一个三维虚拟现实设备，用于显示3 测量空间的三维虚拟空间，以及在激光扫描显微镜和三维虚拟现实设备之间提供实时单向或双向连接。
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