Electronic component including multilayer substrate
    2.
    发明授权
    Electronic component including multilayer substrate 有权
    电子部件包括多层基板

    公开(公告)号:US08802995B2

    公开(公告)日:2014-08-12

    申请号:US13649558

    申请日:2012-10-11

    Inventor: Koji Tanaka

    Abstract: The multilayer substrate includes: a plurality of dielectric layers stacked on one another; a first conductor pattern 20 which is disposed along a principal surface 12a of a dielectric layer 12 and which is electrically connected to a ground; and second conductor patterns 22 and 24 which are disposed along the principal surface of a dielectric layer and which are opposed to the first conductor pattern 20 only through the dielectric layers therebetween, the second conductor patterns 22 and 24 forming inductor elements. Only the dielectric layers that sandwich the first conductor pattern 20 therebetween are bonded to each other via openings 20a through 20h formed in the first conductor pattern 20. As viewed from the stacking direction, the second conductor patterns substantially entirely overlap a portion other than the openings 20a through 20h in the first conductor pattern 20.

    Abstract translation: 多层基板包括:彼此堆叠的多个电介质层; 第一导体图案20,其沿着电介质层12的主表面12a设置并且电连接到地面; 以及第二导体图案22和24,其沿着电介质层的主表面设置并且仅通过其间的介电层与第一导体图案20相对,形成电感器元件的第二导体图案22和24。 只有夹在其间的第一导体图案20的电介质层通过形成在第一导体图案20中的开口20a至20h彼此接合。从堆叠方向看,第二导体图案基本上完全重叠除了开口 20a至20h在第一导体图案20中。

    Method of measuring characteristics of specimen, and flat-plate periodic structure
    3.
    发明授权
    Method of measuring characteristics of specimen, and flat-plate periodic structure 有权
    测量样品特性和平板周期结构的方法

    公开(公告)号:US08610071B2

    公开(公告)日:2013-12-17

    申请号:US13780108

    申请日:2013-02-28

    CPC classification number: G01N21/47 G01N21/01 G01N21/3581

    Abstract: The present invention provides a measuring method comprising the steps of holding a specimen on a flat-plate periodic structure, applying a linearly-polarized electromagnetic wave to the periodic structure, and measuring characteristics of the specimen based on change of the electromagnetic wave scattered forward or backward by the periodic structure, wherein the periodic structure is structured such that plural unit structures having the same shape are two-dimensionally and periodically interconnected in a direction of one reference plane, the unit structure has at least one aperture penetrating therethrough in a direction perpendicular to the reference plane, the electromagnetic wave is applied from a direction perpendicular to the reference plane, and the unit structure has a shape that is not mirror-symmetric with respect to an imaginary plane orthogonal to a polarizing direction of the electromagnetic wave.

    Abstract translation: 本发明提供了一种测量方法,包括以下步骤:将样品保持在平板周期性结构上,将线性极化电磁波施加到周期性结构,并且基于散射的电磁波的变化或样品的特性, 以周期性结构向后延伸,其中周期性结构被构造成使得具有相同形状的多个单元结构在一个参考平面的方向上二维和周期地互连,该单元结构具有至少一个沿垂直方向贯穿其中的孔 电磁波从垂直于参考平面的方向施加,并且单元结构具有相对于与电磁波的偏振方向垂直的虚拟平面不是镜像对称的形状。

    ELECTRONIC COMPONENT INCLUDING MULTILAYER SUBSTRATE
    4.
    发明申请
    ELECTRONIC COMPONENT INCLUDING MULTILAYER SUBSTRATE 有权
    包含多层基板的电子元件

    公开(公告)号:US20130092419A1

    公开(公告)日:2013-04-18

    申请号:US13649558

    申请日:2012-10-11

    Inventor: Koji Tanaka

    Abstract: The multilayer substrate includes: a plurality of dielectric layers stacked on one another; a first conductor pattern 20 which is disposed along a principal surface 12a of a dielectric layer 12 and which is electrically connected to a ground; and second conductor patterns 22 and 24 which are disposed along the principal surface of a dielectric layer and which are opposed to the first conductor pattern 20 only through the dielectric layers therebetween, the second conductor patterns 22 and 24 forming inductor elements. Only the dielectric layers that sandwich the first conductor pattern 20 therebetween are bonded to each other via openings 20a through 20h formed in the first conductor pattern 20. As viewed from the stacking direction, the second conductor patterns substantially entirely overlap a portion other than the openings 20a through 20h in the first conductor pattern 20.

    Abstract translation: 多层基板包括:彼此堆叠的多个电介质层; 第一导体图案20,其沿着电介质层12的主表面12a设置并且电连接到地面; 以及第二导体图案22和24,其沿着电介质层的主表面设置并且仅通过其间的介电层与第一导体图案20相对,形成电感器元件的第二导体图案22和24。 只有夹在其间的第一导体图案20的电介质层通过形成在第一导体图案20中的开口20a至20h彼此接合。从堆叠方向看,第二导体图案基本上完全重叠除了开口 20a至20h在第一导体图案20中。

    PERIODIC STRUCTURE AND MEASUREMENT METHOD USING THE SAME
    5.
    发明申请
    PERIODIC STRUCTURE AND MEASUREMENT METHOD USING THE SAME 审中-公开
    周期性结构和使用该方法的测量方法

    公开(公告)号:US20140247452A1

    公开(公告)日:2014-09-04

    申请号:US14278593

    申请日:2014-05-15

    CPC classification number: G01N21/01 G01N21/3586 G01N21/774

    Abstract: A plate-shaped periodic structure is provided that includes at least two aperture portions extending through the periodic structure in a direction perpendicular to a main surface of the periodic structure and periodically arranged in at least one direction along the main surface. Each of the aperture portions has a shape that is not mirror-symmetric with respect to an imaginary plane that is a plane perpendicular to the main surface. Each of the aperture portions includes a constricted portion at which a gap distance of the aperture portion is partially small, the gap distance being a width in a direction parallel to a line of intersection of the main surface and the imaginary plane.

    Abstract translation: 提供了一种板状周期性结构,其包括至少两个在垂直于周期性结构的主表面的方向上延伸穿过周期性结构并且沿着主表面沿至少一个方向周期性布置的孔径部分。 每个开口部分具有相对于与主表面垂直的平面的假想平面不是镜像对称的形状。 每个开口部分包括狭缝部分,在该缩小部分处,开口部分的间隙距离部分地小,间隙距离是在平行于主表面和假想平面的交点的方向上的宽度。

    METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN, AND FLAT-PLATE PERIODIC STRUCTURE
    6.
    发明申请
    METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN, AND FLAT-PLATE PERIODIC STRUCTURE 有权
    测量样本特征的方法和平板周期结构

    公开(公告)号:US20130221209A1

    公开(公告)日:2013-08-29

    申请号:US13780108

    申请日:2013-02-28

    CPC classification number: G01N21/47 G01N21/01 G01N21/3581

    Abstract: The present invention provides a measuring method comprising the steps of holding a specimen on a flat-plate periodic structure, applying a linearly-polarized electromagnetic wave to the periodic structure, and measuring characteristics of the specimen based on change of the electromagnetic wave scattered forward or backward by the periodic structure, wherein the periodic structure is structured such that plural unit structures having the same shape are two-dimensionally and periodically interconnected in a direction of one reference plane, the unit structure has at least one aperture penetrating therethrough in a direction perpendicular to the reference plane, the electromagnetic wave is applied from a direction perpendicular to the reference plane, and the unit structure has a shape that is not mirror-symmetric with respect to an imaginary plane orthogonal to a polarizing direction of the electromagnetic wave.

    Abstract translation: 本发明提供了一种测量方法,包括以下步骤:将样品保持在平板周期性结构上,将线性极化电磁波施加到周期性结构,并且基于散射的电磁波的变化或样品的特性, 以周期性结构向后延伸,其中周期性结构被构造成使得具有相同形状的多个单元结构在一个参考平面的方向上二维和周期地互连,该单元结构具有至少一个沿垂直方向贯穿其中的孔 电磁波从垂直于参考平面的方向施加,并且单元结构具有相对于与电磁波的偏振方向垂直的虚拟平面不是镜像对称的形状。

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