Apparatus for inspecting light emitting diode and inspecting method using said apparatus
    2.
    发明授权
    Apparatus for inspecting light emitting diode and inspecting method using said apparatus 有权
    用于检查发光二极管的装置和使用所述装置的检查方法

    公开(公告)号:US08922643B2

    公开(公告)日:2014-12-30

    申请号:US13412197

    申请日:2012-03-05

    摘要: A light emitting diode (LED) inspection apparatus includes at least one LED including a phosphor applied on an emission surface, a first lighting unit to emit visible light to the LED, a second lighting unit to emit ultraviolet (UV) light to the LED, a photographing unit to generate at least one first image data by photographing the visible light reflected from the LED and to generate at least one second image data by photographing the UV light reflected from the LED, and a determination unit to determine a defect in appearance and emission characteristics of the LED using the at least one first image data and second image data.

    摘要翻译: 发光二极管(LED)检查装置包括至少一个LED,其包括施加在发射表面上的荧光体,向LED发射可见光的第一照明单元,向LED发射紫外线(UV)光的第二照明单元, 拍摄单元,通过拍摄从LED反射的可见光来生成至少一个第一图像数据,并且通过拍摄从LED反射的UV光来生成至少一个第二图像数据;以及确定单元,用于确定外观缺陷,以及 使用所述至少一个第一图像数据和第二图像数据的LED的发射特性。