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公开(公告)号：US11585839B2
公开(公告)日：2023-02-21
申请号：US17040555
申请日：2019-03-04
发明人： Tadashi Takahashi
摘要： A resistance measuring device includes: a first jig; a plurality of first contacts; a second jig; a plurality of second contacts; a resistance measuring unit that supplies a current between a first contact and a second contact, which correspond to each other, detects a voltage between a first contact and a second contact, and calculates a resistance value of an object to be measured based on a relationship between a value of the supplied current and a value of the detected voltage; first wirings connecting the resistance measuring unit and each of the first contacts, for the first contacts, respectively; and second wirings connecting the resistance measuring unit and each of the second contacts while passing from the resistance measuring unit through the first jig, for the second contacts, respectively.
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公开(公告)号：US10761654B2
公开(公告)日：2020-09-01
申请号：US15522790
申请日：2015-08-07
摘要： A measuring process unit for executing a measuring process of, in correspondence with a plurality of combinations obtained by respectively combining a plurality of connection terminals Tx and a plurality of connection terminals Ty, and in respect of the connection terminals Tx, Ty corresponding to each of the combinations, supplying an AC voltage SA to the connection terminals Ty by means of an AC current source 2 and detecting electric current flowing in the connection terminals Tx by means of an ammeter 3, to thereby acquire currents corresponding to each of the combinations; and a calculating unit for executing a calculating process of, based on the size of the currents detected by the ammeter 3 in the measuring process and on information indicating the currents' phases, calculating capacitance and resistance values corresponding to each of the combinations.
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公开(公告)号：US09753075B2
公开(公告)日：2017-09-05
申请号：US14782602
申请日：2014-04-08
发明人： Tadashi Takahashi
CPC分类号： G01R31/021 , G06F3/044 , G06F3/047
摘要： An inspection apparatus for inspecting wires of an object in which a plurality of x-axis and y-axis wires are arranged perpendicular to each other, each x-axis and y-axis wire having a display wire and tab wire, respectively. The apparatus includes a power supply device supplying an AC signal to the wire as an inspection object; a connecting device being in conductive contact with the tab wire to transmit the AC signal, a first detecting device disposed in a non-contact manner at one end of the display wire and conductively connected to one end of the power supply device, a second detecting device disposed in the non-contact manner and opposed to the display wire and conductively connected to the one end of the power supply device, and a determining device determining quality of the wire on the basis of results of the first and second detecting devices.
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公开(公告)号：US20160054366A1
公开(公告)日：2016-02-25
申请号：US14782602
申请日：2014-04-08
发明人： Tadashi Takahashi
CPC分类号： G01R31/021 , G06F3/044 , G06F3/047
摘要： An inspection apparatus for inspecting wires of an object in which a plurality of x-axis and y-axis wires are arranged perpendicular to each other, each x-axis and y-axis wire having a display wire and tab wire, respectively. The apparatus includes a power supply device supplying an AC signal to the wire as an inspection object;, a connecting device being in conductive contact with the tab wire to transmit the AC signal, a first detecting device disposed in a non-contact manner at one end of the display wire and conductively connected to one end of the power supply device, a second detecting device disposed in the non-contact manner and opposed to the display wire and conductively connected to the one end of the power supply device, and a determining device determining quality of the wire on the basis of results of the first and second detecting devices.
摘要翻译： 一种用于检查其中多个x轴和y轴线彼此垂直布置的物体的线的检查装置，每个x轴和y轴线分别具有显示线和突出线。 该装置包括向作为检查对象的线提供AC信号的电源装置;与片状导线导电接触以传送AC信号的连接装置，以非接触方式设置在第一检测装置的第一检测装置 并且导电地连接到电源装置的一端，第二检测装置以非接触方式设置并与显示线相对并且导电地连接到电源装置的一端，并且确定 基于第一和第二检测装置的结果来确定线的质量的装置。
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