公开(公告)号：US12131460B2

公开(公告)日：2024-10-29

申请号：US17697972

申请日：2022-03-18

Applicant: NIDEC READ CORPORATION

Inventor： Toshihide Matsukawa ,  Kenichi Akasaka ,  Hironori Nakamura ,  Masayuki Tsujimoto

IPC: G06T7/00 ,  G06T5/70

CPC classification number: G06T7/001 ,  G06T5/70 ,  G06T2207/30108

Abstract: An image processing unit including: a pad region extraction unit that executes pad region extraction processing of extracting a substantially rectangular pad region surrounding a plurality of pads from an image of an inspection target object; an imaginary straight line setting unit that executes imaginary straight line setting processing of setting an imaginary first straight line parallel to a side extending in an X direction of the pad region and setting an imaginary second straight line parallel to a side extending in a Y direction of the pad; and a reference point setting unit that executes reference point setting processing of setting an intersection between the first straight line and the second straight line as the reference point.

公开(公告)号：US20220301137A1

公开(公告)日：2022-09-22

申请号：US17697972

申请日：2022-03-18

Applicant: NIDEC READ CORPORATION

Inventor： Toshihide Matsukawa ,  Kenichi Akasaka ,  Hironori Nakamura ,  Masayuki Tsujimoto

IPC: G06T7/00 ,  G06T5/00

Abstract: An image processing unit including: a pad region extraction unit that executes pad region extraction processing of extracting a substantially rectangular pad region surrounding a plurality of pads from an image of an inspection target object; an imaginary straight line setting unit that executes imaginary straight line setting processing of setting an imaginary first straight line parallel to a side extending in an X direction of the pad region and setting an imaginary second straight line parallel to a side extending in a Y direction of the pad; and a reference point setting unit that executes reference point setting processing of setting an intersection between the first straight line and the second straight line as the reference point.

公开(公告)号：US10678385B2

公开(公告)日：2020-06-09

申请号：US15680272

申请日：2017-08-18

Applicant: NIDEC-READ CORPORATION

Inventor： Koji Sakamoto ,  Toshihide Matsukawa ,  Koji Iwami ,  Shigeki Fujita ,  Osamu Hikita

IPC: G06F3/044 ,  G06F11/22 ,  G06F3/0354 ,  G06F3/041

Abstract: An inspection apparatus is provided with a holder configured to set an inspection target thereon, the inspection target configured to detect a contact position on the inspection target touched by a human finger; pseudo finger(s) configured to be detected as the human finger upon contact with the inspection target; a positioner configured to move the pseudo finger(s) relative to the inspection target and to change the contact position of the pseudo finger(s) relative to the inspection target; a memory configured to store, respectively, a value of a pressing force in a range of pressing forces said range including a zero pressing force for each of the pseudo finger(s) on the inspection target; a controller configured to regulate the pressing force for pseudo finger(s) of the pseudo finger(s) based on the respective value; and a sensor configured to acquire an electric signal output from the inspection target.

公开(公告)号：US12283509B2

公开(公告)日：2025-04-22

申请号：US17912058

申请日：2021-03-11

Applicant: NIDEC READ CORPORATION

Inventor： Toshihide Matsukawa ,  Takashi Isa

IPC: H01L21/677 ,  H01L21/673 ,  H01L21/68

Abstract: A load port adapter is a load port adapter fixable on a mounting table of a load port. The load port adapter includes a holder capable of holding a cassette capable of accommodating a plurality of circuit boards. The holder is fixable on the mounting table of the load port. The holder includes a position adjustment mechanism configured to position the cassette at a reference position. In the cassette clamped on the load port adapter, the reference position is a reference position on a load port adapter side when the circuit board is taken out from the cassette.

公开(公告)号：US09910084B2

公开(公告)日：2018-03-06

申请号：US14662327

申请日：2015-03-19

Applicant: NIDEC-READ CORPORATION

Inventor： Takashi Nakagawa ,  Toshihide Matsukawa ,  Osamu Hikita ,  Michio Kaida

IPC: G01R31/28 ,  G01R31/308 ,  G01R1/067 ,  H05K3/00 ,  G01N21/956

CPC classification number: G01R31/2808 ,  G01N2021/95638 ,  G01R1/06794 ,  G01R31/2805 ,  H05K3/0008 ,  H05K2203/1545 ,  H05K2203/162

Abstract: A flexible circuit board inspecting apparatus for conducting an inspection on a flexible circuit board includes a transport path and an inspection part mechanism. The transport path is configured to successively transport the flexible circuit board having a plurality of unit circuit boards arranged thereon. The inspection part mechanism is configured to bring and distance a jig for inspecting the flexible circuit board transported on the transport path close to and from the flexible circuit board. The transport path includes a longitudinal transport portion for transporting the flexible circuit board in a downward vertical direction. The inspection part mechanism moves the jig in a direction perpendicular to the flexible circuit board transported on the longitudinal transport portion to bring and distance the jig close to and from the flexible circuit board.

公开(公告)号：US12055580B2

公开(公告)日：2024-08-06

申请号：US17913840

申请日：2021-03-25

Applicant: NIDEC READ CORPORATION

Inventor： Toshihide Matsukawa ,  Takashi Isa

IPC: G01R31/28 ,  G01S17/04

CPC classification number: G01R31/2808 ,  G01S17/04

Abstract: A circuit board inspecting apparatus includes a rotary table having a mount surface, a rotary table support section, a suction device, a suction path having a first end connected to the suction device and a second end located at the mount surface, an adsorption mechanism that adsorbs the board onto the mount surface so that the suction device sucks in gas in the suction path, a flow rate detection section that detects a flow rate of gas flowing through a portion of the suction path, the portion located inside the rotary table support section, a flow rate determination section that determines whether the flow rate of the gas detected by the flow rate detection section is equal to or more than a predetermined value, a contactless detection section that detects a placement state of the board on the mount surface in a contactless manner, and an inspection section.

公开(公告)号：US20150212625A1

公开(公告)日：2015-07-30

申请号：US14606043

申请日：2015-01-27

Applicant: NIDEC-READ CORPORATION

Inventor： Koji Sakamoto ,  Toshihide Matsukawa ,  Koji Iwami ,  Shigeki Fujita ,  Osamu Hikita

IPC: G06F3/044 ,  G06F3/0354 ,  G06F3/041

CPC classification number: G06F3/044 ,  G06F3/03545 ,  G06F3/0414 ,  G06F11/2221

Abstract: A touch panel inspecting apparatus includes a workpiece holder, a pseudo finger, an X-Y movement mechanism, a memory part, an electric pneumatic regulator, and a panel signal acquiring part. The workpiece holder allows a touch panel, which is an inspection target, to be set thereon. The pseudo finger is contactable with the touch panel set on the workpiece holder. The X-Y movement mechanism moves the pseudo finger relative to the touch panel. The memory part stores therein a set value of pressing force of the pseudo finger, in a changeable manner. The electric pneumatic regulator regulates the pressing force to bring the pseudo finger into contact with the touch panel, based on the set value stored in the memory part. The panel signal acquiring part acquires an electric signal output from the touch panel.

Abstract translation: 触摸面板检查装置包括工件保持器，伪指针，X-Y移动机构，存储部件，电动气动调节器和面板信号获取部件。 工件保持器允许将作为检查对象的触摸面板设置在其上。 伪指状物可与设置在工件保持器上的触摸面板接触。 X-Y移动机构相对于触摸面板移动伪手指。 存储器部分以可变的方式存储伪手指的按压力的设定值。 电动气动调节器基于存储在存储器部件中的设定值来调节按压力使伪手指与触摸面板接触。 面板信号获取部分获取从触摸面板输出的电信号。

公开(公告)号：US20150083449A1

公开(公告)日：2015-03-26

申请号：US14488378

申请日：2014-09-17

Applicant: NIDEC-READ CORPORATION

Inventor： Takashi Nakagawa ,  Toshihide Matsukawa

IPC: B25B28/00

CPC classification number: B25B28/00 ,  B25B5/061 ,  H01L21/67132 ,  H01L21/67138 ,  H01L21/67144 ,  H01L24/01

Abstract: A contact head unit provided in a contact apparatus may be provided with a contact rod, a housing, a thrust air passage, and a cancel air passage. The housing supports the contact rod linearly movably by a static pressure air bearing, which allows the contact rod to be brought into contact with an object. If a compressed air is supplied to the thrust air passage, a force in a direction of approaching the object acts on the contact rod. If the compressed air is supplied to the cancel air passage, a force in an opposite direction acts on the contact rod. A control unit sets applied pressure on the object by controlling the pressure of the compressed air of the thrust air passage and the pressure of the compressed air of the cancel air passage while the contact rod is in contact with the object.

Abstract translation: 设置在接触装置中的接触头单元可以设置有接触杆，壳体，推力空气通道和取消空气通道。 壳体通过静压空气轴承线性地可移动地支撑接触杆，这允许接触杆与物体接触。 如果向推力空气通道供应压缩空气，则接近对象的方向上的力作用在接触杆上。 如果压缩空气被供应到取消空气通道，则相反方向的力作用在接触杆上。 控制单元通过控制推力空气通道的压缩空气的压力和抵消空气通道的压缩空气的压力，同时在接触杆与物体接触的同时，对物体施加压力。

公开(公告)号：US20170344159A1

公开(公告)日：2017-11-30

申请号：US15680272

申请日：2017-08-18

Applicant: NIDEC-READ CORPORATION

Inventor： Koji Sakamoto ,  Toshihide Matsukawa ,  Koji Iwami ,  Shigeki Fujita ,  Osamu Hikita

IPC: G06F3/044 ,  G06F3/0354 ,  G06F3/041 ,  G06F11/22

Abstract: An inspection apparatus is provided with a holder configured to set an inspection target thereon, the inspection target configured to detect a contact position on the inspection target touched by a human finger; pseudo finger(s) configured to be detected as the human finger upon contact with the inspection target; a positioner configured to move the pseudo finger(s) relative to the inspection target and to change the contact position of the pseudo finger(s) relative to the inspection target; a memory configured to store, respectively, a value of a pressing force in a range of pressing forces said range including a zero pressing force for each of the pseudo finger(s) on the inspection target; a controller configured to regulate the pressing force for pseudo finger(s) of the pseudo finger(s) based on the respective value; and a sensor configured to acquire an electric signal output from the inspection target.

公开(公告)号：US20160163576A1

公开(公告)日：2016-06-09

申请号：US15041118

申请日：2016-02-11

Applicant: NIDEC-READ CORPORATION

Inventor： Takashi Nakagawa ,  Toshihide Matsukawa ,  Osamu Hikita ,  Akira Ogata ,  Michio Kaida

IPC: H01L21/677 ,  H01L21/67

CPC classification number: H01L21/67721 ,  H01L21/67173 ,  H01L21/67242 ,  H01L21/67253 ,  H01L21/67703 ,  H01L21/67748 ,  H01L21/6776

Abstract: A substrate inspection system includes a plurality of processing units, and each processing unit is provided with a transport mechanism configured to transport an substrate to be inspected along a transport passage which extends substantially horizontally, a lift mechanism configured to lift the substrate to be inspected to a height position, at a set position on the transport passage, and processors each configured to perform a predetermined process on the substrate to be inspected positioned at the height position. The processing units are arranged such that transport passages thereof are aligned and such that the transport directions thereof are the same direction. Between two adjacent transport passages, the substrate to be inspected is delivered from the transport passage on an upstream side to the transport passage on a downstream side.