公开(公告)号：US20170241919A1

公开(公告)日：2017-08-24

申请号：US15507999

申请日：2014-09-02

Applicant: NOBUKATSU MACHII ,  FURNINORL HAYANO ,  AKITOSHI KAWAI

Inventor： NOBUKATSU MACHII ,  FURNINORL HAYANO ,  AKITOSHI KAWAI

IPC: G01N23/04 ,  G01B15/04

CPC classification number: G01N23/04 ,  G01B15/04 ,  G01N23/046 ,  G01N2223/304 ,  G01N2223/306 ,  G01N2223/646

Abstract: A measurement processing device used for an x-ray inspection apparatus that detects an x-ray passing through a specimen with a detection unit to sequentially inspect a plurality of specimens on the basis of an acquired transmission image, includes a setting unit that sets a region to be inspected on a portion of the specimen; a determination unit that determines the non-defectiveness of the region to be inspected by using a transmission image of the x-ray that passed through the region to be inspected; a correction unit that performs a correction on the region to be inspected on the basis of a determination result by the determination unit; and a display control unit that displays the corrected region to be inspected corrected by the correction unit.