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Patent Agency Ranking
公开(公告)号：US10014148B2
公开(公告)日：2018-07-03
申请号：US14904061
申请日：2015-08-19
Applicant: Nuctech Company Limited
Inventor： Huaping Tang , Zhiqiang Chen , Yuanjing Li , Yonggang Wang , Zhanfeng Qin
CPC classification number: H01J35/065 , H01J3/021 , H01J35/14 , H01J2203/022 , H01J2203/0224 , H01J2203/0236 , H01J2235/062 , H01J2235/068 , H05G1/52
Abstract: The present disclosure is directed to an electron source and an X-ray source using the same. The electron source of the present invention comprises: at least two electron emission zones, each of which comprises a plurality of micro electron emission units, wherein the micro electron emission unit comprises: a base layer, an insulating layer on the base layer, a grid layer on the insulating layer, an opening in the grid layer, and an electron emitter that is fixed at the base layer and corresponds to a position of the opening, wherein the micro electron emission units in the same electron emission zone are electrically connected and simultaneously emit electrons or do not emit electrons at the same time, and wherein different electron emission zones are electrically partitioned.
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公开(公告)号：US20170162359A1
公开(公告)日：2017-06-08
申请号：US14904061
申请日：2015-08-19
Applicant: NUCTECH COMPANY LIMITED
Inventor： Huaping Tang , Zhiqiang Chen , Yuanjing Li , Yonggang Wang , Zhanfeng Qin
CPC classification number: H01J35/065 , H01J3/021 , H01J35/14 , H01J2203/022 , H01J2203/0224 , H01J2203/0236 , H01J2235/062 , H01J2235/068 , H05G1/52
Abstract: The present disclosure is directed to an electron source and an X-ray source using the same. The electron source of the present invention comprises: at least two electron emission zones, each of which comprises a plurality of micro electron emission units, wherein the micro electron emission unit comprises: a base layer, an insulating layer on the base layer, a grid layer on the insulating layer, an opening in the grid layer, and an electron emitter that is fixed at the base layer and corresponds to a position of the opening, wherein the micro electron emission units in the same electron emission zone are electrically connected and simultaneously emit electrons or do not emit electrons at the same time, and wherein different electron emission zones are electrically partitioned.
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公开(公告)号：US10078056B2
公开(公告)日：2018-09-18
申请号：US14901970
申请日：2015-08-27
Applicant: Nuctech Company Limited
Inventor： Huaping Tang , Zhiqiang Chen , Yuanjing Li , Zhuoyan Liu , Yonggang Wang , Zhanfeng Qin
CPC classification number: G01N23/04 , B07C5/3416 , B07C2501/0009
Abstract: An X-ray product quality online inspection device of the present invention comprises: a distributed X-ray source having a plurality of targets and being able to generate X-rays for irradiating an inspected product from the plurality of targets in a predetermined sequence; a detector for receiving the X-rays generated by the distributed X-ray source and outputting a signal representing characteristics of the received X-rays; a transport device which is located between the distributed X-ray source and the detector for carrying the inspected product to pass through an X-ray radiation region, wherein the transport device is arranged as a continuous transport mechanism which matches a production line of the inspected product; and a power supply and control device, which is used to supply power to and control the X-ray product quality online inspection device.
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公开(公告)号：US10969346B2
公开(公告)日：2021-04-06
申请号：US14901989
申请日：2015-08-27
Applicant: Nuctech Company Limited
Inventor： Huaping Tang , Zhiqiang Chen , Yuanjing Li , Zhuoyan Liu , Yonggang Wang , Zhanfeng Qin
IPC: G01N23/04 , G01N23/046 , B07C5/34
Abstract: An X-ray product quality automatic inspection device of the present invention comprises: a distributed X-ray source having a plurality of targets and being able to generate X-rays for irradiating an inspected product from the plurality of targets in a predetermined sequence; a detector for receiving the X-rays generated by the distributed X-ray source and outputting a signal representing characteristics of the received X-rays; a transport device for carrying the inspected product to pass through an X-ray radiation region; and a power supply and control device, which is used to supply power to and control the X-ray product quality automatic inspection device, to form characteristic information of the inspected product according to the signal from the detector and to provides an inspection and analysis result of the inspected product according to the characteristic information.
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公开(公告)号：US10648929B2
公开(公告)日：2020-05-12
申请号：US15300751
申请日：2015-12-14
Applicant: NUCTECH COMPANY LIMITED
Inventor： Huaping Tang , Zhiqiang Chen , Yuanjing Li , Xin Jin , Zhuoyan Liu , Yonggang Wang , Hua Peng , Zhanfeng Qin
Abstract: Embodiments of the present invention provide a trailed multiple-viewing-angle item inspection system and method of operating the same. The inspection system includes: a trailer vehicle, a radiation inspection device, a power supply device and a power grid connection device. The trailer vehicle is mounted with a power supply chamber within which a power supply device and a power grid connection device are mounted and an inspection chamber within which a radiation inspection device is mounted. The radiation inspection device includes: ray radiation source configured to emit X-rays from various positions, detectors, a body frame, a transfer device, a data and image process system and a display and operation device. The trailed multiple-viewing-angle item inspection system of the present invention can obtain a transmission image containing depth information of an item by its one pass through the device, and achieve a high-speed inspection, a good image quality and a high inspection efficiency of hazardous articles, and its flexibility and movability can meet requirements in various working conditions.
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