公开(公告)号：US12174253B2

公开(公告)日：2024-12-24

申请号：US18124406

申请日：2023-03-21

Applicant: NXP B.V.

Inventor： Cristian Pavao Moreira ,  Thierry Mesnard ,  Michiel Alexander Hallie

IPC: G01R31/3183 ,  G01R31/319

Abstract: An electronic device includes a bias generator to generate a plurality of bias currents and a testing module to test the bias generator by successively testing each subset of bias currents of a plurality of subsets of bias currents grouped from the plurality of bias currents as a corresponding single test current. The testing module can include a variable resistor, wherein the testing module is to test the bias generator by, for each subset of bias currents, configuring the variable resistor to have a corresponding resistance based on the number of bias currents represented in the subset, conducting a corresponding test current through the variable resistor configured to the corresponding resistance, the test current representing a combination of all bias currents of the corresponding subset, and determining a test status for the subset of bias currents based on a voltage across the variable resistor resulting from the corresponding test current.

公开(公告)号：US10008985B2

公开(公告)日：2018-06-26

申请号：US15633375

申请日：2017-06-26

Applicant: NXP B.V.

Inventor： Henricus Hubertus van den Berg ,  Michiel Alexander Hallie ,  Joannes Theodorus van der Heiden

IPC: H03F1/02 ,  H03K19/0185 ,  H03F3/50 ,  H02M1/08

CPC classification number: H03F1/0255 ,  G01R31/3004 ,  G01R31/31712 ,  G01R31/31924 ,  H02M1/082 ,  H03F3/50 ,  H03K19/018521

Abstract: An integrated circuit and method are provided. The integrated circuit comprises: a digital core configured to output a first voltage signal; and a first input/output cell; wherein the first input/output cell is configured to convert the first voltage signal to a first current signal and provide the first current signal to circuitry external to the integrated circuit.

公开(公告)号：US20230333161A1

公开(公告)日：2023-10-19

申请号：US18124406

申请日：2023-03-21

Applicant: NXP B.V.

Inventor： Cristian Pavao Moreira ,  Thierry Mesnard ,  Michiel Alexander Hallie

IPC: G01R31/3183 ,  G01R31/319

CPC classification number: G01R31/3183 ,  G01R31/31924

Abstract: An electronic device includes a bias generator to generate a plurality of bias currents and a testing module to test the bias generator by successively testing each subset of bias currents of a plurality of subsets of bias currents grouped from the plurality of bias currents as a corresponding single test current. The testing module can include a variable resistor, wherein the testing module is to test the bias generator by, for each subset of bias currents, configuring the variable resistor to have a corresponding resistance based on the number of bias currents represented in the subset, conducting a corresponding test current through the variable resistor configured to the corresponding resistance, the test current representing a combination of all bias currents of the corresponding subset, and determining a test status for the subset of bias currents based on a voltage across the variable resistor resulting from the corresponding test current.

公开(公告)号：US20180019709A1

公开(公告)日：2018-01-18

申请号：US15633375

申请日：2017-06-26

Applicant: NXP B.V.

Inventor： Henricus Hubertus van den Berg ,  Michiel Alexander Hallie ,  Joannes Theodorus van der Heiden

IPC: H03F1/02 ,  H03F3/50 ,  H02M1/08

CPC classification number: H03F1/0255 ,  G01R31/3004 ,  G01R31/31712 ,  G01R31/31924 ,  H02M1/082 ,  H03F3/50 ,  H03K19/018521

Abstract: An integrated circuit and method are provided. The integrated circuit comprises: a digital core configured to output a first voltage signal: and a first input/output cell: wherein the first input/output cell is configured to convert the first voltage signal to a first current signal and provide the first current signal to circuitry external to the integrated circuit.