公开(公告)号：US20240364342A1

公开(公告)日：2024-10-31

申请号：US18308328

申请日：2023-04-27

申请人： NXP USA, INC.

发明人： Mohamed Suleman Moosa ,  Gary Edwin Anderson, II ,  Mehul D. Shroff ,  George Walter Lange ,  Antoine Fabien Dubois

IPC分类号： H03K19/08 ,  H03K3/356 ,  H03K19/17784

CPC分类号： H03K19/0813 ,  H03K3/356 ,  H03K19/17784

摘要： A method of detecting and mitigating an SEL is provided. The method includes measuring a current of a first circuit block of a semiconductor device and determining that the measured current exceeds a first threshold. In response to the measured current exceeding the first threshold, a supply voltage of the first circuit block is reduced from a nominal voltage value to a predetermined voltage value. After reducing the supply voltage to the predetermined voltage value, the supply voltage is restored to the nominal voltage value.