公开(公告)号：US20160178347A1

公开(公告)日：2016-06-23

申请号：US14578597

申请日：2014-12-22

Applicant: National Chung Shan Institute of Science and Technology

Inventor： YI-YUH HWANG ,  WEI-GUO CHANG ,  CHIN-DER HWANG ,  GUANG-SHEEN LIU ,  WEN-JEN LIN ,  PING-YA KO

IPC: G01B9/02 ,  G01B11/14

CPC classification number: G01B11/002 ,  G01B9/02094

Abstract: A quick subpixel absolute positioning device and method are introduced. The method includes the steps of (A) capturing a real-time speckle pattern of a target surface; (B) providing a coarse-precision speckle coordinate pattern and a plurality of fine-precision speckle coordinate patterns, wherein the coarse-precision speckle coordinate pattern and the fine-precision speckle coordinate patterns include a coordinate value; (C) comparing the real-time speckle coordinate pattern with the coarse-precision speckle coordinate pattern by an algorithm and then comparing the real-time speckle coordinate pattern with the fine-precision speckle coordinate patterns to obtain a coordinate value, wherein each said coarse-precision speckle coordinate pattern corresponds to a set of fine-precision speckle coordinate patterns, and the fine-precision speckle coordinate patterns are obtained when the coarse-precision speckle coordinate pattern is captured again and then captured repeatedly according to a fixed fine-precision displacement distance. Accordingly, the subpixel positioning is attained by quick comparison and manifests high precision.

Abstract translation: 介绍了一种快速子像素绝对定位装置和方法。 该方法包括以下步骤：（A）捕获目标表面的实时散斑图案; （B）提供粗精度散斑坐标图案和多个精细散斑坐标图案，其中粗精度散斑坐标图案和精细散斑坐标图案包括坐标值; （C）通过算法将实时散斑坐标图与粗精度散斑坐标图进行比较，然后将实时散斑坐标图与精细散斑坐标图进行比较，得到坐标值，其中每个所述粗 - 精密斑点坐标图案对应于一组精细散斑坐标图案，并且当再次捕获粗精度散斑坐标图案时，获得精细散斑坐标图，然后根据固定的精密位移重复捕获 距离。 因此，通过快速比较实现子像素定位，显示出高精度。

公开(公告)号：US20210190596A1

公开(公告)日：2021-06-24

申请号：US17124523

申请日：2020-12-17

Applicant: NATIONAL CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： SHIANG-FENG TANG ,  SHUN-LUNG YEN ,  KUN-CHI LO ,  WEN-JEN LIN

IPC: G01J5/02

Abstract: A high-precision non-contact temperature measurement device includes: a thermal insulation box made of a thermal insulation material and having therein a receiving space; a dynamic constant-temperature feedback control module for controlling temperature of the receiving space; and a non-temperature-sensing thermal imager disposed in the receiving space. The device achieves system thermal insulation within a non-contact temperature measurement gauge, maintains the overall closed system dynamically at constant temperature, compensates for effects of internal chip self-heating effect and visual field background temperature variation, and finally calculates average temperature of surfaces of a target precisely with an imaging, non-contact temperature measurement gauge and a temperature calibration algorithm widely used in thermal-imaging non-contact temperature measurement.