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公开(公告)号:US20180178339A1
公开(公告)日:2018-06-28
申请号:US15388496
申请日:2016-12-22
Inventor: YI-YUH HWANG , WEI-GUO CHANG , LI-CHUNG LIU
IPC: B23Q11/00 , B23Q17/24 , G01B11/00 , G05B19/402
CPC classification number: B23Q11/0007 , B23Q17/2428 , B23Q17/2495 , G01B11/002 , G05B19/402 , G05B2219/37582
Abstract: A measurement, calibration and compensation system for machine tool includes a first positioning base; two first speckle image sensors for sensing speckle positions of an object holding unit at a first XY plane and a first XZ plane of the first positioning base before and after the machine tool is started for machining; a second positioning base; two second speckle image sensors for sensing speckle positions of a cutter holding unit at a second XY plane and a second YZ plane of the second positioning base before and after the machine tool is started for machining. Thus, the thermal expansion at all axes of the machine tool can be measured in a simplified and low-cost way, and the absolute positioning coordinates of all axes of the machine tool can be calibrated in real time to avoid reduced positioning accuracy due to the thermal expansion of the multi-axis machine tool.
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公开(公告)号:US20190193271A1
公开(公告)日:2019-06-27
申请号:US15854896
申请日:2017-12-27
Inventor: YI-YUH HWANG , WEI-GUO CHANG , LI-CHUNG LIU
CPC classification number: B25J9/1697 , G06K9/209 , G06K9/6202 , G06K9/78 , G06T7/001 , G06T7/74 , G06T2207/30164 , H04N7/181 , Y10S901/09 , Y10S901/47
Abstract: An error compensation device comprises at least one photographing module, a comparison module and a compensation module compensation module. The photographing module establish a space coordinate system relative to the object and comprises a first photographer and a second photographer which respectively photograph a first non-deformed laser speckle image on a first surface and a second non-deformed laser speckle image on a second surface, the first surface differs from the second surface by an azimuth. The comparison module respectively compares the first non-deformed laser speckle image before and after the displacement with the second non-deformed laser speckle image to calculate a displacement value between the two surfaces. The compensation module controls the movement of the object according to the displacement value. The error compensation utilizes the displacement of the non-deformed laser speckle image to obtain the absolute error of the object and compensate the error.
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公开(公告)号:US20160178347A1
公开(公告)日:2016-06-23
申请号:US14578597
申请日:2014-12-22
Inventor: YI-YUH HWANG , WEI-GUO CHANG , CHIN-DER HWANG , GUANG-SHEEN LIU , WEN-JEN LIN , PING-YA KO
CPC classification number: G01B11/002 , G01B9/02094
Abstract: A quick subpixel absolute positioning device and method are introduced. The method includes the steps of (A) capturing a real-time speckle pattern of a target surface; (B) providing a coarse-precision speckle coordinate pattern and a plurality of fine-precision speckle coordinate patterns, wherein the coarse-precision speckle coordinate pattern and the fine-precision speckle coordinate patterns include a coordinate value; (C) comparing the real-time speckle coordinate pattern with the coarse-precision speckle coordinate pattern by an algorithm and then comparing the real-time speckle coordinate pattern with the fine-precision speckle coordinate patterns to obtain a coordinate value, wherein each said coarse-precision speckle coordinate pattern corresponds to a set of fine-precision speckle coordinate patterns, and the fine-precision speckle coordinate patterns are obtained when the coarse-precision speckle coordinate pattern is captured again and then captured repeatedly according to a fixed fine-precision displacement distance. Accordingly, the subpixel positioning is attained by quick comparison and manifests high precision.
Abstract translation: 介绍了一种快速子像素绝对定位装置和方法。 该方法包括以下步骤:(A)捕获目标表面的实时散斑图案; (B)提供粗精度散斑坐标图案和多个精细散斑坐标图案,其中粗精度散斑坐标图案和精细散斑坐标图案包括坐标值; (C)通过算法将实时散斑坐标图与粗精度散斑坐标图进行比较,然后将实时散斑坐标图与精细散斑坐标图进行比较,得到坐标值,其中每个所述粗 - 精密斑点坐标图案对应于一组精细散斑坐标图案,并且当再次捕获粗精度散斑坐标图案时,获得精细散斑坐标图,然后根据固定的精密位移重复捕获 距离。 因此,通过快速比较实现子像素定位,显示出高精度。
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