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1.
公开(公告)号:US4397938A
公开(公告)日:1983-08-09
申请号:US330492
申请日:1981-12-14
申请人: Nitin V. Desai , Emil J. Gavalchin
发明人: Nitin V. Desai , Emil J. Gavalchin
CPC分类号: G03F7/039
摘要: In accordance with this invention, there is provided a positive resist medium for microlithography which is comprised of a film of a copolymer of sulfur dioxide and certain vinyl esters. A method of manufacturing microelectronic circuits and recording information utilizing the resist medium of this invention is also provided.
摘要翻译: 根据本发明,提供了一种用于微光刻的正性抗蚀剂介质,其由二氧化硫和某些乙烯基酯的共聚物的膜组成。 还提供了利用本发明的抗蚀剂介质制造微电子电路和记录信息的方法。
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公开(公告)号:US4262073A
公开(公告)日:1981-04-14
申请号:US96973
申请日:1979-11-23
CPC分类号: G03F7/039 , C08G75/22 , Y10S430/106 , Y10S430/143 , Y10S430/167 , Y10S430/168
摘要: A recording medium is provided which is comprised of a substrate and a film of a polyacetylene sulfone on the surface of the substrate. The recording medium is especially useful in the microlithographic manufacture of electronic circuits using deep ultraviolet exposure.
摘要翻译: 提供了一种记录介质,其由基材和聚乙炔砜的膜构成。 记录介质在使用深紫外线曝光的电子电路的微光刻制造中特别有用。
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