Photo detecting apparatus for detecting reflected light from an object
and excluding an external light componet from the reflected light
    2.
    发明授权
    Photo detecting apparatus for detecting reflected light from an object and excluding an external light componet from the reflected light 失效
    用于检测来自物体的反射光并从反射光中排除外部光组件的照片检测装置

    公开(公告)号:US5705807A

    公开(公告)日:1998-01-06

    申请号:US547230

    申请日:1995-10-24

    摘要: There is provided a photosensor having a photoelectric converter for converting incident light into a photoelectric current, and a function of removing noise light from imaging light including noise light and reflected from an object to be photographed. A plurality of photosensors each having the arrangement are used as an image sensor. A single photosensor having the arrangement or a plurality of photosensors each having the arrangement are used as a distance sensor. There is provided a photosensor in which a storage unit stores electric quantity corresponding to fixed light, and electric quantity corresponding to reflected light in the state wherein electric quantity stored in the storage unit is reproduced by a reproduction unit is introduced, and the difference therebetween is reproduced as an electric signal. A single photosensor having the arrangement or a plurality of photosensors each having the arrangement are used as a distance sensor. The plurality of photosensors are used as an image or distance image sensor.

    摘要翻译: 提供了一种具有用于将入射光转换成光电流的光电转换器的光传感器,以及从包含噪声光的成像光和从被拍摄对象反射的光中去除噪声光的功能。 将具有这种布置的多个光传感器用作图像传感器。 将具有这种布置的单个光电传感器或具有该布置的多个光电传感器用作距离传感器。 提供了一种光传感器,其中存储单元存储对应于固定光的电量,并且引入与在存储单元中存储的电量由再现单元再现的状态下的反射光相对应的电量,并且它们之间的差异 再现为电信号。 将具有这种布置的单个光电传感器或具有该布置的多个光电传感器用作距离传感器。 多个光传感器被用作图像或距离图像传感器。

    Inspection system and process
    3.
    发明授权
    Inspection system and process 失效
    检验制度和程序

    公开(公告)号:US5734742A

    公开(公告)日:1998-03-31

    申请号:US528868

    申请日:1995-09-15

    IPC分类号: G01N21/88 G06T7/00 G06K9/00

    摘要: In order to reliably detect a defect on an inspected surface, electronic pictures of the inspected surface are formed at different positions by moving an imaging area relative to the inspected surface. Defect candidate regions are extracted from a series of the pictures. The system examines whether a movement from one candidate region to another candidate region is proportional to the movement of the imaging area. If the movement between the candidate regions is in proportion to the movement of the imaging area, the system judges that the candidate regions are imagery of a defect on the inspected surface.

    摘要翻译: 为了可靠地检测被检查表面上的缺陷,通过相对于被检查表面移动成像区域,在不同位置处形成被检查表面的电子图像。 从一系列图像中提取缺陷候选区域。 该系统检查从一个候选区域到另一个候选区域的移动是否与成像区域的移动成比例。 如果候选区域之间的移动与成像区域的移动成比例,则系统判断候选区域是被检查表面上的缺陷的图像。