ABNORMALITY DETECTION SYSTEM, SUPPORT DEVICE, AND MODEL GENERATION METHOD

    公开(公告)号:US20190286096A1

    公开(公告)日:2019-09-19

    申请号:US16248793

    申请日:2019-01-16

    Abstract: An abnormality detection system, support device, and model generation method for generating a more highly accurate abnormality detection model before an actual operation are provided. A model generation part includes a section for generating feature values from state values provided from a state value storage part; a section for calculating importance levels respectively for the generated feature values based on plural methods, wherein the importance levels indicating a degree that is effective for abnormality detection; and a section for integrating the importance levels calculated based on the plural methods for each of the generated feature values and determining rankings of the importance levels of the generated feature values.

    ABNORMALITY DETECTION SYSTEM, SUPPORT DEVICE, AND MODEL GENERATION METHOD

    公开(公告)号:US20190286085A1

    公开(公告)日:2019-09-19

    申请号:US16248787

    申请日:2019-01-16

    Abstract: An abnormality detection system, support device, and model generation method are provided for generating a more highly accurate abnormality detection model before an actual operation. A model generation part of an abnormality detection system includes a section for generating plural feature values from state values provided from a state value storage part, a section for selecting a combination of one or plural feature values among the plural generated feature values, a section for generating an extra learning data set having at least part of a data series of the feature values of the selected combination and a data series of statistically generated virtual feature values, and a section for evaluating a detection accuracy of a model corresponding to the feature values of the selected combination using the extra learning data set.

    ANALYSIS DEVICE, ANALYSIS METHOD, AND RECORDING MEDIUM

    公开(公告)号:US20210397148A1

    公开(公告)日:2021-12-23

    申请号:US17270449

    申请日:2020-02-20

    Abstract: An analysis device according to one aspect of the present invention supplies a definition for a dependency relation between an input parameter and an output parameter of a standard function, which cannot be derived in a dependency analysis of a control program, the definition being supplied by use of function structure information which is external information. In other words, an analysis device according to this configuration identifies a dependency relation between an input parameter and an output parameter of the standard function on the basis of function structure information that defines a dependency relation between the input parameter and the output parameter of the standard function. Therefore, the dependency relation between the input and the output of a standard function becomes clear, so the dependency relations between a plurality of device variables that mediate the standard function can be identified.

    DISPLAY SYSTEM, DISPLAY METHOD, AND NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM RECORDING DISPLAY PROGRAM

    公开(公告)号:US20210200194A1

    公开(公告)日:2021-07-01

    申请号:US17269535

    申请日:2020-02-03

    Abstract: A display system provided in production equipment having driving means and monitoring means with controllable features includes a control unit, a display unit, and a storage unit. The control unit obtains a feature output over time from at least one among the driving means and the monitoring means, and causes the storage unit to store the feature; constructs, in each prescribed time, a causal relationship model that indicates a causal factor selected from among the driving means and the monitoring means for at least one abnormality that can occur in the production equipment and that also indicates the relationship between causal factors on the basis of the obtained feature; and displays, on the display unit, a plurality of causal relationship models constructed in a plurality of times.

    CONTROL SYSTEM AND CONTROL METHOD
    5.
    发明申请

    公开(公告)号:US20190278247A1

    公开(公告)日:2019-09-12

    申请号:US16219973

    申请日:2018-12-14

    Abstract: A control system and a control method are provided. A control device in the control system includes a computation processing unit related to control of a control target, a collection unit that executes a process of collecting data associated with the control target, and a monitoring processing unit that executes a process of monitoring a state of the control target and includes a feature quantity generation unit that executes a process for generating a feature quantity from the collected data, and a detection unit that executes a for detecting an abnormality occurring in the control target using the generated feature quantity and an abnormality detection parameter suitable for detection of an abnormality occurring in the control target that is set based on a result of machine learning. An information processing device executes emulation of the monitoring process using the data associated with the control target from the control device.

    CONTROL SYSTEM, CONTROL PROGRAM, AND CONTROL METHOD

    公开(公告)号:US20180164768A1

    公开(公告)日:2018-06-14

    申请号:US15784959

    申请日:2017-10-16

    Abstract: A control system includes a controller for controlling a control target and redundant devices accessible from the controller. The control system includes a feature quantity generation unit that generates a feature quantity from data associated with the redundant devices, an abnormality detection unit that determines whether an abnormality has occurred in one of the redundant devices based on the feature quantity generated by the feature quantity generation unit and a predetermined abnormality detection parameter, a switch unit that switches the redundant devices between a working mode and a standby mode when the abnormality detection unit determines that an abnormality has occurred, and a learning unit that performs machine learning using the data associated with the redundant devices to determine the abnormality detection parameter.

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