Method and Device for Measuring and Optimizing an Optoelectronic Component
    2.
    发明申请
    Method and Device for Measuring and Optimizing an Optoelectronic Component 审中-公开
    用于测量和优化光电元件的方法和装置

    公开(公告)号:US20160003890A1

    公开(公告)日:2016-01-07

    申请号:US14769788

    申请日:2014-03-06

    CPC classification number: G01R31/2635 G01N2201/061 G01R31/025 H05B37/0227

    Abstract: A method can be used for measuring at least one optoelectronic component arranged on a connection carrier. The method includes exciting an electromagnetic oscillating circuit, which is formed by the optoelectronic component and the connection carrier, thus exciting the optoelectronic component in such a way that the optoelectronic component emits electromagnetic radiation, and measuring at least one electro-optical property of the optoelectronic component.

    Abstract translation: 一种方法可用于测量布置在连接载体上的至少一个光电子部件。 该方法包括激励由光电子部件和连接载体形成的电磁振荡电路,从而以光电子部件发射电磁辐射的方式激发光电子部件,并且测量光电子学的至少一个电光学特性 零件。

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